{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,8]],"date-time":"2026-02-08T00:02:25Z","timestamp":1770508945173,"version":"3.49.0"},"reference-count":12,"publisher":"SAGE Publications","issue":"2","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IFS"],"published-print":{"date-parts":[[2018,2,27]]},"DOI":"10.3233\/jifs-169409","type":"journal-article","created":{"date-parts":[[2018,2,27]],"date-time":"2018-02-27T12:36:52Z","timestamp":1519735012000},"page":"1153-1159","source":"Crossref","is-referenced-by-count":1,"title":["Measuring film thickness with Dual-laser imaging method"],"prefix":"10.1177","volume":"34","author":[{"given":"Guolu","family":"Ma","sequence":"first","affiliation":[{"name":"Ministry of Education Key Laboratory of Testing Technology for Manufacturing Process, Southwest University of Science and Technology (SWUST), Mianyang, China"}]},{"given":"Lixian","family":"Liu","sequence":"additional","affiliation":[{"name":"Ministry of Education Key Laboratory of Testing Technology for Manufacturing Process, Southwest University of Science and Technology (SWUST), Mianyang, China"}]},{"given":"Guiyang","family":"Yang","sequence":"additional","affiliation":[{"name":"Ministry of Education Key Laboratory of Testing Technology for Manufacturing Process, Southwest University of Science and Technology (SWUST), Mianyang, China"}]},{"given":"Chen","family":"Wang","sequence":"additional","affiliation":[{"name":"Department of Instrumentation, School of Mechanical Engineering, Huazhong University of Science and Technology (HUST), Wuhan, China"}]},{"given":"Bin","family":"Zhao","sequence":"additional","affiliation":[{"name":"Department of Instrumentation, School of Mechanical Engineering, Huazhong University of Science and Technology (HUST), Wuhan, China"}]}],"member":"179","reference":[{"key":"10.3233\/JIFS-169409_ref1","unstructured":"Wu Y.P. , Zhang H.P. and Wu F. , Polymer Lithium Ion Batteries, Beijing: Chemical Industry Press, 2007, pp. 1\u201316."},{"key":"10.3233\/JIFS-169409_ref2","doi-asserted-by":"crossref","first-page":"1444","DOI":"10.1016\/j.ijleo.2011.07.065","article-title":"Highly accurate film thickness measurement based on automatic fringe analysis","volume":"123","author":"Abdelsalam","year":"2012","journal-title":"Optik"},{"issue":"S0003-6935","key":"10.3233\/JIFS-169409_ref3","first-page":"985","article-title":"Simple method for determination of the thickness of a nonabsorbing thin film using spectral reflectance measurement","volume":"48","author":"Ji\u010di","year":"2009","journal-title":"Appl Opt"},{"key":"10.3233\/JIFS-169409_ref4","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1016\/S0030-4018(02)01203-8","article-title":"Thickness measurement of dielectric films by wavelength scanning method","volume":"205","author":"K\u00f6ysal","year":"2002","journal-title":"Opt Commun"},{"key":"10.3233\/JIFS-169409_ref5","doi-asserted-by":"crossref","first-page":"184","DOI":"10.1117\/12.405819","article-title":"Ellipsometry: A sophisticated tool for optical metrology","author":"Azzam","year":"2000","journal-title":"Proceedings of SPIE, Optical"},{"key":"10.3233\/JIFS-169409_ref6","doi-asserted-by":"crossref","first-page":"4916","DOI":"10.1364\/AO.45.004916","article-title":"Laser triangulation for liquid film thickness measurements through multiple interfaces","volume":"45","author":"Peterson","year":"2006","journal-title":"Appl Opt"},{"key":"10.3233\/JIFS-169409_ref7","doi-asserted-by":"crossref","first-page":"10","DOI":"10.1117\/1.1330700","article-title":"Laser ranging: A critical review of usual techniques for distance measurement","volume":"40","author":"Amann","year":"2001","journal-title":"Opt Eng"},{"key":"10.3233\/JIFS-169409_ref8","doi-asserted-by":"crossref","first-page":"1306","DOI":"10.1364\/AO.33.001306","article-title":"Laser triangulation: Fundamental uncertainty in distance measurement","volume":"33","author":"Dorsch","year":"1994","journal-title":"Appl Opt"},{"key":"10.3233\/JIFS-169409_ref9","first-page":"1","article-title":"Thickness measurement of thin wood material by differential laser triangulation method","volume":"7022:70220R","author":"Hattuniemi","year":"2008","journal-title":"Advan Laser Technol"},{"key":"10.3233\/JIFS-169409_ref10","doi-asserted-by":"crossref","first-page":"265","DOI":"10.1007\/s00170-009-2493-x","article-title":"The influence of incident, object color and distance on CNC laser scanning","volume":"50","author":"Vuka\u0161inovi\u0107","year":"2010","journal-title":"Int J Adv Manuf Technol"},{"key":"10.3233\/JIFS-169409_ref11","first-page":"23","article-title":"The influence of surface topology on the accuracy of laser triangulation scanning results","volume":"56","author":"Vuka\u0161inovi\u0107","year":"2010","journal-title":"Journal of Mechanical Engineering"},{"key":"10.3233\/JIFS-169409_ref12","unstructured":"Yu D.Y. and Tan H.Y. , Engineering Optics, 2rd ed., Beijing, 2009, pp. 15\u201333."}],"container-title":["Journal of Intelligent & Fuzzy Systems"],"original-title":[],"link":[{"URL":"https:\/\/content.iospress.com\/download?id=10.3233\/JIFS-169409","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,6]],"date-time":"2026-02-06T22:28:06Z","timestamp":1770416886000},"score":1,"resource":{"primary":{"URL":"https:\/\/journals.sagepub.com\/doi\/full\/10.3233\/JIFS-169409"}},"subtitle":[],"editor":[{"given":"Mahalingam","family":"Sundhararajan","sequence":"additional","affiliation":[]},{"given":"Xiao-Zhi","family":"Gao","sequence":"additional","affiliation":[]},{"given":"Hamed","family":"Vahdat Nejad","sequence":"additional","affiliation":[]}],"short-title":[],"issued":{"date-parts":[[2018,2,27]]},"references-count":12,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.3233\/jifs-169409","relation":{},"ISSN":["1064-1246","1875-8967"],"issn-type":[{"value":"1064-1246","type":"print"},{"value":"1875-8967","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,2,27]]}}}