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The fault diagnosis process is presented and reformulated as a typical Markov Decision Process model, with the uncertainty of the tests is descripted by false alarm and detection probabilities which are to be the transition probabilities of the model. Moreover, the repeated test is adopted to improve the reliability of fault diagnosis. The cost and information gain are both considered in test chosen to achieve fast diagnosis with minimum cost. An application on the launcher device of a missile is studied in detail, as well as the comparisons in diagnostic performance among the proposed solution and the ones of traditional methods. Both the simulation and results illustrate the validity and feasibility of the proposed method.<\/jats:p>","DOI":"10.3233\/jifs-18169","type":"journal-article","created":{"date-parts":[[2018,8,10]],"date-time":"2018-08-10T10:48:18Z","timestamp":1533898098000},"page":"3605-3613","update-policy":"https:\/\/doi.org\/10.1177\/sage-journals-update-policy","source":"Crossref","is-referenced-by-count":5,"title":["A novel method for optimal test sequencing under unreliable test based on Markov Decision Process"],"prefix":"10.1177","volume":"35","author":[{"given":"Yajun","family":"Liang","sequence":"first","affiliation":[{"name":"Aeronautics Engineering College, Air Force Engineering University, Xi\u2019an, China"}]},{"given":"Mingqing","family":"Xiao","sequence":"additional","affiliation":[{"name":"Aeronautics Engineering College, Air Force Engineering University, Xi\u2019an, China"}]},{"given":"Xilang","family":"Tang","sequence":"additional","affiliation":[{"name":"Aeronautics Engineering College, Air Force Engineering University, Xi\u2019an, China"}]},{"given":"Yawei","family":"Ge","sequence":"additional","affiliation":[{"name":"Aeronautics Engineering College, Air Force Engineering University, Xi\u2019an, China"}]},{"given":"Xiaofei","family":"Wang","sequence":"additional","affiliation":[{"name":"Aeronautics Engineering College, Air Force Engineering University, Xi\u2019an, China"}]}],"member":"179","published-online":{"date-parts":[[2018,8,10]]},"reference":[{"key":"e_1_3_1_2_2","first-page":"102","article-title":"An information theory approach to diagnosis","author":"John R.A.","year":"1960","unstructured":"JohnR.A., An information theory approach to diagnosis, Proceedings of the 6th Annual Conference on reliability and quality control, 1960, pp. 102\u2013109.","journal-title":"Proceedings of the 6th Annual Conference on reliability and quality control"},{"key":"e_1_3_1_3_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2012.07.060"},{"key":"e_1_3_1_4_2","doi-asserted-by":"publisher","DOI":"10.1109\/21.105086"},{"key":"e_1_3_1_5_2","first-page":"395","article-title":"System testability analysis and research tool","author":"Pattipati K.R.","year":"1990","unstructured":"PattipatiK.R. and DebS., System testability analysis and research tool, Proceedings of the IEEE Autotestcon Conference, 1990, pp. 395\u2013402.","journal-title":"Proceedings of the IEEE Autotestcon Conference"},{"key":"e_1_3_1_6_2","first-page":"1662","article-title":"Sequential diagnostic strategy for the diagnosis of complex systems, in:","author":"Qi Y.","year":"2002","unstructured":"QiY., ShenS.-T., LiY.-H. and BaiL., Sequential diagnostic strategy for the diagnosis of complex systems, in: Conference on Computers, Communications, Control and Power Engineering, 2002, pp. 1662\u20131666.","journal-title":"Conference on Computers, Communications, Control and Power Engineering"},{"key":"e_1_3_1_7_2","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCA.2009.2014550"},{"issue":"2","key":"e_1_3_1_8_2","first-page":"204","article-title":"Research on test sequencing problem based on generalized AO* algorithm","volume":"31","author":"Wang H.-X.","year":"2010","unstructured":"WangH.-X., YeX.-H. and TianS.-X., Research on test sequencing problem based on generalized AO* algorithm, Acta Armamentarii, 31(2) (2010), 204\u2013208. 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