{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,23]],"date-time":"2026-04-23T06:39:01Z","timestamp":1776926341360,"version":"3.51.2"},"reference-count":31,"publisher":"Tech Science Press","issue":"3","license":[{"start":{"date-parts":[[2025,8,3]],"date-time":"2025-08-03T00:00:00Z","timestamp":1754179200000},"content-version":"vor","delay-in-days":214,"URL":"https:\/\/doi.org\/10.32604\/TSP-CROSSMARKPOLICY"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["CMC"],"published-print":{"date-parts":[[2025]]},"DOI":"10.32604\/cmc.2025.065726","type":"journal-article","created":{"date-parts":[[2025,7,4]],"date-time":"2025-07-04T03:54:28Z","timestamp":1751601268000},"page":"5201-5221","update-policy":"https:\/\/doi.org\/10.32604\/tsp-crossmarkpolicy","source":"Crossref","is-referenced-by-count":0,"title":["Software Defect Prediction Based on Semantic Views of Metrics: Clustering Analysis and Model Performance Analysis"],"prefix":"10.32604","volume":"84","author":[{"given":"Baishun","family":"Zhou","sequence":"first","affiliation":[]},{"given":"Haijiao","family":"Zhao","sequence":"additional","affiliation":[]},{"given":"Yuxin","family":"Wen","sequence":"additional","affiliation":[]},{"given":"Gangyi","family":"Ding","sequence":"additional","affiliation":[]},{"given":"Ying","family":"Xing","sequence":"additional","affiliation":[]},{"given":"Xinyang","family":"Lin","sequence":"additional","affiliation":[]},{"given":"Lei","family":"Xiao","sequence":"additional","affiliation":[]}],"member":"17807","published-online":{"date-parts":[[2025]]},"reference":[{"key":"ref1","doi-asserted-by":"crossref","first-page":"161","DOI":"10.1049\/iet-sen.2017.0148","article-title":"Progress on approaches to software defect prediction","volume":"12","author":"Li","year":"2018","journal-title":"IET Softw"},{"key":"ref2","series-title":"International Conference on Computational Intelligence and Multimedia Applications (ICCIMA 2007); 2007 Dec 13\u201315; Sivakasi, India","first-page":"13","article-title":"Clustering categorical data using silhouette coefficient as a relocating measure","author":"Aranganayagi"},{"key":"ref3","first-page":"29","article-title":"Early prediction of software defect using ensemble learning: a comparative study","volume":"179","author":"Abdou","year":"2018","journal-title":"Int J Comput Appl"},{"key":"ref4","series-title":"2020 International Conference on Data Analytics for Business and Industry: Way Towards a Sustainable Economy (ICDABI); 2020 Oct 26\u201327; Sakheer, Bahrain","first-page":"1","article-title":"Software defects prediction using machine learning algorithms","author":"Assim"},{"key":"ref5","series-title":"2021 International Bhurban Conference on Applied Sciences and Technologies (IBCAST); 2021 Jan 12\u201316; Islamabad, Pakistan","first-page":"293","article-title":"Software defect prediction with na\u00efve Bayes classifier","author":"Rahim"},{"key":"ref6","series-title":"2024 Systems and Information Engineering Design Symposium (SIEDS); 2024 May 3; Charlottesville, VA, USA","first-page":"511","article-title":"Enhancing malware classification: a comparative study of feature selection models with parameter optimization","author":"Curebal"},{"key":"ref7","series-title":"4th International Conference on Trends in Electronics and Informatics (ICOEI); 2020 Apr 16\u201318; Tirunelveli, India","first-page":"728","article-title":"Software defect prediction using machine learning techniques","author":"Prabha"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"98754","DOI":"10.1109\/ACCESS.2021.3095559","article-title":"Software defect prediction using ensemble learning: a systematic literature review","volume":"9","author":"Matloob","year":"2021","journal-title":"IEEE Access"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"47","DOI":"10.1007\/s10515-024-00454-9","article-title":"Exploring the impact of data preprocessing techniques on composite classifier algorithms in cross-project defect prediction","volume":"31","author":"Vescan","year":"2024","journal-title":"Autom Softw Eng"},{"key":"ref10","series-title":"2023 International Conference on Artificial Intelligence and Smart Communication (AISC); 2023 Jan 27\u201329; Greater Noida, India","first-page":"119","article-title":"Design an improved model of software defect prediction model for web applications","author":"Arya"},{"key":"ref11","series-title":"2016 IEEE\/ACM 38th International Conference on Software Engineering (ICSE); 2016 May 14\u201322; Austin, TX, USA","first-page":"309","article-title":"Cross-project defect prediction using a connectivity-based unsupervised classifier","author":"Zhang"},{"key":"ref12","first-page":"30","article-title":"Performance analysis of selected clustering techniques for software defects prediction","volume":"12","author":"Balogun","year":"2019","journal-title":"Afr J Comput ICT"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"1966","DOI":"10.1587\/transinf.2019EDP7033","article-title":"A hybrid feature selection method for software fault prediction","volume":"102","author":"Jian","year":"2019","journal-title":"IEICE Trans Inf Syst"},{"key":"ref14","doi-asserted-by":"crossref","first-page":"32","DOI":"10.1007\/s00530-023-01225-4","article-title":"One-step graph-based incomplete multi-view clustering","volume":"30","author":"Zhou","year":"2024","journal-title":"Multimed Syst"},{"key":"ref15","first-page":"163","article-title":"Multi-view learning for software defect prediction","volume":"15","author":"Kiyak","year":"2021","journal-title":"e-Inform Softw Eng J"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"8901","DOI":"10.1109\/ACCESS.2018.2890733","article-title":"Multiview transfer learning for software defect prediction","volume":"7","author":"Chen","year":"2019","journal-title":"IEEE Access"},{"key":"ref17","doi-asserted-by":"crossref","first-page":"1267","DOI":"10.1109\/TSE.2018.2877612","article-title":"Deep semantic feature learning for software defect prediction","volume":"46","author":"Wang","year":"2020","journal-title":"IEEE Trans Softw Eng"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"820","DOI":"10.1109\/TR.2024.3354965","article-title":"Software defect prediction based on deep representation learning of source code from contextual syntax and semantic graph","volume":"73","author":"Abdu","year":"2024","journal-title":"IEEE Trans Reliab"},{"key":"ref19","doi-asserted-by":"crossref","first-page":"14771","DOI":"10.1038\/s41598-024-65639-4","article-title":"Semantic and traditional feature fusion for software defect prediction using hybrid deep learning model","volume":"14","author":"Abdu","year":"2024","journal-title":"Sci Rep"},{"key":"ref20","series-title":"Proceedings of the 6th International Conference on Predictive Models in Software Engineering; 2010 Sep 12\u201313; Timisoara. Romania","first-page":"1","article-title":"Towards identifying software project clusters with regard to defect prediction","author":"Jureczko"},{"key":"ref21","first-page":"90","article-title":"Review on determining number of cluster in K-means clustering","volume":"1","author":"Kodinariya","year":"2013","journal-title":"Int J"},{"key":"ref22","article-title":"On spectral clustering: analysis and an algorithm","volume":"14","author":"Ng","year":"2001","journal-title":"Adv Neural Inf Process Syst"},{"key":"ref23","doi-asserted-by":"crossref","first-page":"177","DOI":"10.1023\/A:1007617005950","article-title":"Unsupervised learning by probabilistic latent semantic analysis","volume":"42","author":"Hofmann","year":"2001","journal-title":"Mach Learn"},{"key":"ref24","doi-asserted-by":"crossref","first-page":"555","DOI":"10.1016\/j.jcss.2004.10.006","article-title":"Performance guarantees for hierarchical clustering","volume":"70","author":"Dasgupta","year":"2005","journal-title":"J Comput Syst Sci"},{"key":"ref25","doi-asserted-by":"crossref","first-page":"111","DOI":"10.1002\/asmb.537","volume":"21","author":"Chen","year":"2005","journal-title":"Appl Stochastic Models Bus Ind"},{"key":"ref26","doi-asserted-by":"crossref","first-page":"5","DOI":"10.1023\/A:1010933404324","article-title":"Random forests","volume":"45","author":"Breiman","year":"2001","journal-title":"Mach Learn"},{"key":"ref27","series-title":"Proceedings of the 22nd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining; 2016 Aug 13\u201317; San Francisco, CA, USA","first-page":"785","article-title":"Xgboost: a scalable tree boosting system","author":"Chen"},{"key":"ref28","series-title":"2019 International Conference on Intelligent Computing and Control Systems (ICCS); 2019 May 15\u201317; Madurai, India","first-page":"1255","article-title":"A brief review of nearest neighbor algorithm for learning and classification","author":"Taunk"},{"key":"ref29","author":"Menard","year":"2001","journal-title":"Applied logistic regression analysis"},{"key":"ref30","doi-asserted-by":"crossref","first-page":"321","DOI":"10.1613\/jair.953","article-title":"SMOTE: synthetic minority over-sampling technique","volume":"16","author":"Nitesh","year":"2002","journal-title":"J Artif Intell Res"},{"key":"ref31","doi-asserted-by":"crossref","first-page":"111245","DOI":"10.1016\/j.jss.2022.111245","article-title":"Interpretability application of the Just-in-Time software defect prediction model","volume":"188","author":"Zheng","year":"2022","journal-title":"J Syst Softw"}],"container-title":["Computers, Materials & Continua"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/cdn.techscience.cn\/files\/cmc\/2025\/TSP_CMC-84-3\/TSP_CMC_65726\/TSP_CMC_65726.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,4,23]],"date-time":"2026-04-23T05:45:28Z","timestamp":1776923128000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.techscience.com\/cmc\/v84n3\/63168"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":31,"journal-issue":{"issue":"3","published-online":{"date-parts":[[2025]]},"published-print":{"date-parts":[[2025]]}},"URL":"https:\/\/doi.org\/10.32604\/cmc.2025.065726","relation":{},"ISSN":["1546-2226"],"issn-type":[{"value":"1546-2226","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]},"assertion":[{"value":"2025-03-20","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2025-06-11","order":1,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2025-07-30","order":2,"name":"published","label":"Published Online","group":{"name":"publication_history","label":"Publication History"}}]}}