{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T07:01:17Z","timestamp":1764831677934,"version":"3.46.0"},"reference-count":26,"publisher":"Tech Science Press","issue":"2","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["CMC"],"published-print":{"date-parts":[[2025]]},"DOI":"10.32604\/cmc.2025.066525","type":"journal-article","created":{"date-parts":[[2025,7,23]],"date-time":"2025-07-23T11:14:57Z","timestamp":1753269297000},"page":"3067-3094","source":"Crossref","is-referenced-by-count":0,"title":["Research on Fault Probability Based on Hamming Weight in Fault Injection Attack"],"prefix":"10.32604","volume":"85","author":[{"given":"Tong","family":"Wu","sequence":"first","affiliation":[]},{"given":"Dawei","family":"Zhou","sequence":"additional","affiliation":[]}],"member":"17807","published-online":{"date-parts":[[2025]]},"reference":[{"key":"ref1","doi-asserted-by":"crossref","first-page":"325","DOI":"10.1007\/s13389-024-00352-6","article-title":"Cross-layer analysis of clock glitch fault injection while fetching variable-length instructions","volume":"14","author":"Alshaer","year":"2024","journal-title":"J Cryptogr Eng"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"39","DOI":"10.1109\/TCAD.2024.3426364","article-title":"A deep Investigation on stealthy DVFS fault injection attacks at DNN hardware accelerators","volume":"44","author":"Xu","year":"2025","journal-title":"IEEE Trans Comput-Aided Des Integr Circuits Syst"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"12","DOI":"10.1007\/s13389-025-00378-4","article-title":"Design methodology of digital sensors for detecting laser fault injection attacks in FPGAs","volume":"15","author":"Hayashi","year":"2025","journal-title":"J Cryptogr Eng"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"110057","DOI":"10.1016\/j.compeleceng.2024.110057","article-title":"Recovery for secret key in CTIDH-512 through fault injection attack","volume":"123","author":"Hyunju","year":"2025","journal-title":"Comput Electr Eng"},{"key":"ref5","series-title":"Proceedings of the 2024 39th Conference on Design of Circuits and Integrated Systems (DCIS); 2024 Nov 13\u201315","first-page":"1","article-title":"Electromagnetic fault injection attack methodology against AES hardware implementation","volume":"6225","author":"Casado-Gal\u00e1n","year":"2024"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"104991","DOI":"10.1016\/j.micpro.2023.104991","article-title":"Experimental evaluation of RISC-V micro-architecture against fault injection attack","volume":"104","author":"Esmaeilian","year":"2024","journal-title":"Microprocess Microsyst"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"320","DOI":"10.1007\/978-3-642-15031-9_22","author":"Li","year":"2010","journal-title":"Cryptographic hardware and embedded systems-CHES 2010. Lecture notes in computer science"},{"key":"ref8","series-title":"Proceedings of the: 2014 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2014; 2014 Sep 23","first-page":"49","article-title":"Differential fault intensity analysis","author":"Ghalaty"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"547","DOI":"10.46586\/tches.v2018.i3.547-572","article-title":"Sifa: exploiting ineffective fault inductions on symmetric cryptography","volume":"2018","author":"Dobraunig","year":"2018","journal-title":"IACR Trans Cryptogr Hardw Embed Syst"},{"key":"ref10","first-page":"612","volume":"12105","author":"Saha","year":"2020","journal-title":"Advances in cryptology\u2014eurocrypt 2020, PTI. Lecture notes in computer science"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"192","DOI":"10.46586\/tches.v2021.i1.192-216","article-title":"Fault injection as an oscilloscope: fault correlation analysis","volume":"2020","author":"Spruyt","year":"2020","journal-title":"IACR Trans Cryptogr Hardw Embed Syst"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"2055","DOI":"10.1007\/s10623-025-01572-5","article-title":"New models for the cryptanalysis of ASCON","volume":"93","author":"Degr\u00e9","year":"2025","journal-title":"Des Codes Cryptogr"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"707","DOI":"10.1007\/s10836-024-06149-z","article-title":"A novel two-stage model based SCA against secAES","volume":"40","author":"Wu","year":"2024","journal-title":"J Electron Test"},{"key":"ref14","doi-asserted-by":"crossref","first-page":"1178","DOI":"10.1080\/01621459.2024.2402568","article-title":"Model-based clustering of categorical data based on the hamming distance","volume":"120","author":"Argiento","year":"2025","journal-title":"J Am Stat Assoc"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"519","DOI":"10.1049\/2024\/7457517","article-title":"Differential fault attacks on privacy protocols friendly symmetric-key primitives: rain and hera","volume":"2024","author":"Jiao","year":"2024","journal-title":"IET Inf Secur"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"107000","DOI":"10.1016\/j.jfranklin.2024.107000","article-title":"Anomaly detection using isomorphic analysis for false data injection attacks in industrial control systems","volume":"361","author":"Zhang","year":"2024","journal-title":"J Frankl Inst"},{"key":"ref17","doi-asserted-by":"crossref","first-page":"61","DOI":"10.3390\/e27010061","article-title":"Transient voltage information entropy difference unit protection based on fault condition attribute fusion","volume":"27","author":"Guo","year":"2025","journal-title":"Entropy"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"3443","DOI":"10.1109\/TCAD.2024.3443769","article-title":"Meta-scanner: detecting fault attacks via scanning FPGA designs metadata","volume":"43","author":"Nassar","year":"2024","journal-title":"IEEE Trans Comput-Aided Des Integr Circuits Syst"},{"key":"ref19","volume":"31","author":"Mangard","year":"2008","journal-title":"Power analysis attacks: revealing the secrets of smart cards"},{"key":"ref20","doi-asserted-by":"crossref","first-page":"92","DOI":"10.1007\/s10994-024-06726-5","article-title":"Kernel density estimation for multiclass quantification","volume":"114","author":"Moreo","year":"2025","journal-title":"Mach Learn"},{"key":"ref21","doi-asserted-by":"crossref","first-page":"121860","DOI":"10.1016\/j.eswa.2023.121860","article-title":"Density peak clustering algorithms: a review on the decade 2014\u20132023","volume":"238","author":"Wang","year":"2024","journal-title":"Expert Syst Appl"},{"key":"ref22","doi-asserted-by":"crossref","first-page":"3505","DOI":"10.1007\/s00521-024-10721-1","article-title":"Quantification using permutation-invariant networks based on histograms","volume":"37","author":"P\u00e9rez-Mon","year":"2025","journal-title":"Neural Comput Appl"},{"key":"ref23","first-page":"1263","article-title":"Undersampling based on generalized learning vector quantization and natural nearest neighbors for imbalanced data","volume":"21","author":"Wang","year":"2024","journal-title":"Int J Mach Learn Cybern"},{"key":"ref24","doi-asserted-by":"crossref","first-page":"112302","DOI":"10.1007\/s11432-021-3451-1","article-title":"A nonprofiled side-channel analysis based on variational lower bound related to mutual information","volume":"66","author":"Zhang","year":"2023","journal-title":"Sci China Inf Sci"},{"key":"ref25","doi-asserted-by":"crossref","first-page":"103255","DOI":"10.1016\/j.cose.2023.103255","article-title":"Extending the classical side-channel analysis framework to access-driven cache attacks","volume":"129","author":"Guo","year":"2023","journal-title":"Comput Secur"},{"key":"ref26","series-title":"Proceedings of the International Workshop on Cryptographic Hardware and Embedded Systems","first-page":"426","article-title":"Mutual information analysis: a generic side-channel distinguisher","author":"Gierlichs","year":"2008 Aug 10\u201313"}],"container-title":["Computers, Materials & Continua"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/cdn.techscience.cn\/files\/cmc\/2025\/TSP_CMC-85-2\/TSP_CMC_66525\/TSP_CMC_66525.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T05:35:41Z","timestamp":1764826541000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.techscience.com\/cmc\/v85n2\/63794"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":26,"journal-issue":{"issue":"2","published-online":{"date-parts":[[2025]]},"published-print":{"date-parts":[[2025]]}},"URL":"https:\/\/doi.org\/10.32604\/cmc.2025.066525","relation":{},"ISSN":["1546-2226"],"issn-type":[{"type":"electronic","value":"1546-2226"}],"subject":[],"published":{"date-parts":[[2025]]}}}