{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,5]],"date-time":"2026-07-05T10:37:06Z","timestamp":1783247826530,"version":"3.54.6"},"reference-count":40,"publisher":"MDPI AG","issue":"1","license":[{"start":{"date-parts":[[2024,12,30]],"date-time":"2024-12-30T00:00:00Z","timestamp":1735516800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Natural Science Foundation of the Jiangsu Higher Education Institutions of China","award":["22KJB110012"],"award-info":[{"award-number":["22KJB110012"]}]},{"name":"Natural Science Foundation of the Jiangsu Higher Education Institutions of China","award":["23KJD120002"],"award-info":[{"award-number":["23KJD120002"]}]},{"name":"Natural Science Foundation of the Jiangsu Higher Education Institutions of China","award":["24KJB520005"],"award-info":[{"award-number":["24KJB520005"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Algorithms"],"abstract":"<jats:p>High-quality processes, characterized by low defect rates, typically exhibit an exponential distribution for time-between-events (TBE) data. To effectively monitor TBE data, one-sided exponential Adaptive Exponentially Weighted Moving Average (AEWMA) schemes are introduced. However, the run length (RL) distribution varies with the magnitude of the process mean shift, rendering the median run length (MRL) a more pertinent performance metric. This paper investigates the RL properties of one-sided exponential AEWMA schemes using a Markov chain method. An optimal design procedure based on MRL is developed to enhance the one-sided exponential AEWMA scheme. Comparative analyses reveal that the one-sided exponential AEWMA scheme provides better balanced protection against both minor and major shifts in the process mean compared to EWMA-type and Shewhart schemes. Finally, two practical case studies illustrate the application of AEWMA schemes in manufacturing.<\/jats:p>","DOI":"10.3390\/a18010005","type":"journal-article","created":{"date-parts":[[2024,12,31]],"date-time":"2024-12-31T14:21:12Z","timestamp":1735654872000},"page":"5","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["Optimal Design of One-Sided Exponential Adaptive EWMA Scheme Based on Median Run Length"],"prefix":"10.3390","volume":"18","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0977-6679","authenticated-orcid":false,"given":"Yulong","family":"Qiao","sequence":"first","affiliation":[{"name":"School of Information Technology, Jiangsu Open University, Nanjing 210036, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zixing","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Information Technology, Jiangsu Open University, Nanjing 210036, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1749-8653","authenticated-orcid":false,"given":"Qian","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Information Technology, Jiangsu Open University, Nanjing 210036, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Qin","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Network Security, Jinling Institute of Technology, Nanjing 211169, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ge","family":"Jin","sequence":"additional","affiliation":[{"name":"School of Information Technology, Jiangsu Open University, Nanjing 210036, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2024,12,30]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"71","DOI":"10.1080\/00401706.2018.1562988","article-title":"A new process control chart for monitoring short-range serially correlated data","volume":"62","author":"Qiu","year":"2020","journal-title":"Technometrics"},{"key":"ref_2","doi-asserted-by":"crossref","first-page":"507","DOI":"10.1080\/00401706.2024.2327341","article-title":"Statistical Process Monitoring from Industry 2.0 to Industry 4.0: Insights into Research and Practice","volume":"66","author":"Colosimo","year":"2024","journal-title":"Technometrics"},{"key":"ref_3","doi-asserted-by":"crossref","first-page":"97","DOI":"10.1080\/00401706.2000.10485986","article-title":"Control chart tests based on geometric moving averages","volume":"42","author":"Roberts","year":"1959","journal-title":"Technometrics"},{"key":"ref_4","doi-asserted-by":"crossref","first-page":"100","DOI":"10.1093\/biomet\/41.1-2.100","article-title":"Continuous inspection schemes","volume":"41","author":"Page","year":"1954","journal-title":"Biometrika"},{"key":"ref_5","doi-asserted-by":"crossref","first-page":"821","DOI":"10.1002\/qre.1175","article-title":"Enhancing the performance of EWMA charts","volume":"27","author":"Abbas","year":"2011","journal-title":"Qual. 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