{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,15]],"date-time":"2026-05-15T15:58:06Z","timestamp":1778860686204,"version":"3.51.4"},"reference-count":37,"publisher":"MDPI AG","issue":"1","license":[{"start":{"date-parts":[[2021,2,26]],"date-time":"2021-02-26T00:00:00Z","timestamp":1614297600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["BDCC"],"abstract":"<jats:p>In quality evaluation (QE) of the industrial production field, infrared thermography (IRT) is one of the most crucial techniques used for evaluating composite materials due to the properties of low cost, fast inspection of large surfaces, and safety. The application of deep neural networks tends to be a prominent direction in IRT Non-Destructive Testing (NDT). During the training of the neural network, the Achilles heel is the necessity of a large database. The collection of huge amounts of training data is the high expense task. In NDT with deep learning, synthetic data contributing to training in infrared thermography remains relatively unexplored. In this paper, synthetic data from the standard Finite Element Models are combined with experimental data to build repositories with Mask Region based Convolutional Neural Networks (Mask-RCNN) to strengthen the neural network, learning the essential features of objects of interest and achieving defect segmentation automatically. These results indicate the possibility of adapting inexpensive synthetic data merging with a certain amount of the experimental database for training the neural networks in order to achieve the compelling performance from a limited collection of the annotated experimental data of a real-world practical thermography experiment.<\/jats:p>","DOI":"10.3390\/bdcc5010009","type":"journal-article","created":{"date-parts":[[2021,2,26]],"date-time":"2021-02-26T06:47:20Z","timestamp":1614322040000},"page":"9","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":48,"title":["Automatic Defects Segmentation and Identification by Deep Learning Algorithm with Pulsed Thermography: Synthetic and Experimental Data"],"prefix":"10.3390","volume":"5","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4569-9893","authenticated-orcid":false,"given":"Qiang","family":"Fang","sequence":"first","affiliation":[{"name":"Computer Vision and Systems Laboratory, Department of Electrical and Computer Engineering, Universit\u00e9 Laval, 1065, av. de la M\u00e9decine, Qu\u00e9bec, QC G1V 0A6, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0198-7439","authenticated-orcid":false,"given":"Clemente","family":"Ibarra-Castanedo","sequence":"additional","affiliation":[{"name":"Computer Vision and Systems Laboratory, Department of Electrical and Computer Engineering, Universit\u00e9 Laval, 1065, av. de la M\u00e9decine, Qu\u00e9bec, QC G1V 0A6, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8777-2008","authenticated-orcid":false,"given":"Xavier","family":"Maldague","sequence":"additional","affiliation":[{"name":"Computer Vision and Systems Laboratory, Department of Electrical and Computer Engineering, Universit\u00e9 Laval, 1065, av. de la M\u00e9decine, Qu\u00e9bec, QC G1V 0A6, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2021,2,26]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Ferguson, M.K., Ronay, A., Lee, Y.T.T., and Law, K.H. 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