{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,12]],"date-time":"2025-10-12T02:18:57Z","timestamp":1760235537764,"version":"build-2065373602"},"reference-count":46,"publisher":"MDPI AG","issue":"9","license":[{"start":{"date-parts":[[2021,9,5]],"date-time":"2021-09-05T00:00:00Z","timestamp":1630800000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J. Imaging"],"abstract":"<jats:p>X-ray backlighters allow the capture of sharp images of fast dynamic processes due to extremely short exposure times. Moir\u00e9 imaging enables simultaneously measuring the absorption and differential phase-contrast (DPC) of these processes. Acquiring images with one single shot limits the X-ray photon flux, which can result in noisy images. Increasing the photon statistics by repeating the experiment to gain the same image is not possible if the investigated processes are dynamic and chaotic. Furthermore, to reconstruct the DPC and transmission image, an additional measurement captured in absence of the object is required. For these reference measurements, shot-to-shot fluctuations in X-ray spectra and a source position complicate the averaging of several reference images for noise reduction. Here, two approaches of processing multiple reference images in combination with one single object image are evaluated regarding the image quality. We found that with only five reference images, the contrast-to-noise ratio can be improved by approximately 13% in the DPC image. This promises improvements for short-exposure single-shot acquisitions of rapid processes, such as laser-produced plasma shock-waves in high-energy density experiments at backlighter X-ray sources such as the PHELIX high-power laser facility.<\/jats:p>","DOI":"10.3390\/jimaging7090178","type":"journal-article","created":{"date-parts":[[2021,9,6]],"date-time":"2021-09-06T13:15:56Z","timestamp":1630934156000},"page":"178","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":6,"title":["Noise Reduction for Single-Shot Grating-Based Phase-Contrast Imaging at an X-ray Backlighter"],"prefix":"10.3390","volume":"7","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9627-4115","authenticated-orcid":false,"given":"Stephan","family":"Schreiner","sequence":"first","affiliation":[{"name":"Erlangen Centre for Astroparticle Physics (ECAP), Friedrich-Alexander Universit\u00e4t Erlangen-N\u00fcrnberg, Erwin-Rommel-Stra\u00dfe 1, 91058 Erlangen, Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8343-8854","authenticated-orcid":false,"given":"Bernhard","family":"Akstaller","sequence":"additional","affiliation":[{"name":"Erlangen Centre for Astroparticle Physics (ECAP), Friedrich-Alexander Universit\u00e4t Erlangen-N\u00fcrnberg, Erwin-Rommel-Stra\u00dfe 1, 91058 Erlangen, Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2280-2330","authenticated-orcid":false,"given":"Lisa","family":"Dietrich","sequence":"additional","affiliation":[{"name":"Erlangen Centre for Astroparticle Physics (ECAP), Friedrich-Alexander Universit\u00e4t Erlangen-N\u00fcrnberg, Erwin-Rommel-Stra\u00dfe 1, 91058 Erlangen, Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5454-7739","authenticated-orcid":false,"given":"Pascal","family":"Meyer","sequence":"additional","affiliation":[{"name":"Karlsruhe Institute of Technology, Institute of Microstructure Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany"}]},{"given":"Paul","family":"Neumayer","sequence":"additional","affiliation":[{"name":"GSI Helmholtzzentrum f\u00fcr Schwerionenforschung GmbH, Planckstra\u00dfe 1, 64291 Darmstadt, Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2223-0133","authenticated-orcid":false,"given":"Max","family":"Schuster","sequence":"additional","affiliation":[{"name":"Erlangen Centre for Astroparticle Physics (ECAP), Friedrich-Alexander Universit\u00e4t Erlangen-N\u00fcrnberg, Erwin-Rommel-Stra\u00dfe 1, 91058 Erlangen, Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6847-7540","authenticated-orcid":false,"given":"Andreas","family":"Wolf","sequence":"additional","affiliation":[{"name":"Erlangen Centre for Astroparticle Physics (ECAP), Friedrich-Alexander Universit\u00e4t Erlangen-N\u00fcrnberg, Erwin-Rommel-Stra\u00dfe 1, 91058 Erlangen, Germany"}]},{"given":"Bernhard","family":"Zielbauer","sequence":"additional","affiliation":[{"name":"GSI Helmholtzzentrum f\u00fcr Schwerionenforschung GmbH, Planckstra\u00dfe 1, 64291 Darmstadt, Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3711-6958","authenticated-orcid":false,"given":"Veronika","family":"Ludwig","sequence":"additional","affiliation":[{"name":"Erlangen Centre for Astroparticle Physics (ECAP), Friedrich-Alexander Universit\u00e4t Erlangen-N\u00fcrnberg, Erwin-Rommel-Stra\u00dfe 1, 91058 Erlangen, Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2960-0611","authenticated-orcid":false,"given":"Thilo","family":"Michel","sequence":"additional","affiliation":[{"name":"Erlangen Centre for Astroparticle Physics (ECAP), Friedrich-Alexander Universit\u00e4t Erlangen-N\u00fcrnberg, Erwin-Rommel-Stra\u00dfe 1, 91058 Erlangen, Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2039-4724","authenticated-orcid":false,"given":"Gisela","family":"Anton","sequence":"additional","affiliation":[{"name":"Erlangen Centre for Astroparticle Physics (ECAP), Friedrich-Alexander Universit\u00e4t Erlangen-N\u00fcrnberg, Erwin-Rommel-Stra\u00dfe 1, 91058 Erlangen, Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2012-0080","authenticated-orcid":false,"given":"Stefan","family":"Funk","sequence":"additional","affiliation":[{"name":"Erlangen Centre for Astroparticle Physics (ECAP), Friedrich-Alexander Universit\u00e4t Erlangen-N\u00fcrnberg, Erwin-Rommel-Stra\u00dfe 1, 91058 Erlangen, Germany"}]}],"member":"1968","published-online":{"date-parts":[[2021,9,5]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"155","DOI":"10.1063\/1.1754212","article-title":"AN X-ray interferometer","volume":"6","author":"Bonse","year":"1965","journal-title":"Appl. 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