{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,23]],"date-time":"2026-07-23T06:11:40Z","timestamp":1784787100216,"version":"3.55.0"},"reference-count":13,"publisher":"MDPI AG","issue":"1","license":[{"start":{"date-parts":[[2013,2,8]],"date-time":"2013-02-08T00:00:00Z","timestamp":1360281600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["JSAN"],"abstract":"<jats:p>The present paper focuses on various aspects regarding Hall Effect sensors\u2019 design, integration, and behavior analysis. In order to assess their performance, different Hall Effect geometries were tested for Hall voltage, sensitivity, offset, and temperature drift. The residual offset was measured both with an automated measurement setup and by manual switching of the individual phases. To predict Hall sensors performance prior to integration, three-dimensional physical simulations were performed.<\/jats:p>","DOI":"10.3390\/jsan2010085","type":"journal-article","created":{"date-parts":[[2013,2,8]],"date-time":"2013-02-08T11:00:45Z","timestamp":1360321245000},"page":"85-97","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":79,"title":["Hall Effect Sensors Design, Integration and Behavior Analysis"],"prefix":"10.3390","volume":"2","author":[{"given":"Maria-Alexandra","family":"Paun","sequence":"first","affiliation":[{"name":"STI-IEL-Electronics Laboratory, Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jean-Michel","family":"Sallese","sequence":"additional","affiliation":[{"name":"STI-IEL-Electronics Laboratory, Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Maher","family":"Kayal","sequence":"additional","affiliation":[{"name":"STI-IEL-Electronics Laboratory, Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2013,2,8]]},"reference":[{"key":"ref_1","unstructured":"Ramsden, E. (2006). Hall Effect Sensors\u2014Theory and Applications, Elsevier. [2nd ed.]."},{"key":"ref_2","doi-asserted-by":"crossref","unstructured":"Paun, M.A., Sallese, J.M., and Kayal, M. (2012, January 9\u201312). Temperature Considerations on Hall Effect Sensors Current-Related Sensitivity Behaviour. Proceedings of the 19th IEEE International Conference on Electronics, Circuits, and Systems(ICECS), Seville, Spain.","DOI":"10.1109\/ICECS.2012.6463766"},{"key":"ref_3","doi-asserted-by":"crossref","unstructured":"Paun, M.A., Sallese, J.M., and Kayal, M. (2012, January 28\u201331). Temperature Influence Investigation on Hall Effect Sensors Performance Using a Lumped Circuit Model. Proceedings of the 11th IEEE Sensors Conference, Taipei, Taiwan.","DOI":"10.1109\/ICSENS.2012.6411328"},{"key":"ref_4","unstructured":"Paun, M.A., Sallese, J.M., and Kayal, M. (2012, January 23\u201326). A Specific Parameters Analysis of CMOS Hall Effect Sensors with Various Geometries. Proceedings of the 19th International Conference on Mixed Design of Integrated Circuits and Systems (MIXDES), Warsaw, Poland."},{"key":"ref_5","first-page":"257","article-title":"Geometry influence on the Hall Effect devices performance","volume":"72","author":"Paun","year":"2010","journal-title":"UPB Sci. Bull. Ser. A"},{"key":"ref_6","doi-asserted-by":"crossref","unstructured":"Paun, M.A., Sallese, J.M., and Kayal, M. (2011, January 3\u20137). Geometrical Parameters Influence on the Hall Effect Sensors Offset and Drift. Proceedings of the 7th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME), Madonna di Campiglio, Trento, Italy.","DOI":"10.1109\/PRIME.2011.5966238"},{"key":"ref_7","doi-asserted-by":"crossref","unstructured":"Popovic, R.S. (2004). Hall Effect Devices, Institute of Physics Publishing. [2nd ed.].","DOI":"10.1887\/0750308559"},{"key":"ref_8","doi-asserted-by":"crossref","first-page":"4659","DOI":"10.1063\/1.329347","article-title":"Analysis of symmetrical Hall plate with finite contacts","volume":"52","author":"Versnel","year":"1981","journal-title":"J. Appl. Phys."},{"key":"ref_9","first-page":"883","article-title":"Offset and drift analysis of the Hall Effect sensors. The geometrical parameters influence","volume":"7","author":"Paun","year":"2012","journal-title":"Dig. J. Nanomater. Bios."},{"key":"ref_10","doi-asserted-by":"crossref","first-page":"860","DOI":"10.1109\/JSEN.2007.894902","article-title":"A Hall sensor analog front end for current measurement with continuous gain calibration","volume":"7","author":"Pastre","year":"2007","journal-title":"IEEE Sens. J."},{"key":"ref_11","doi-asserted-by":"crossref","first-page":"719","DOI":"10.1007\/s10470-012-9872-1","article-title":"An improved compact model for CMOS cross-shaped Hall-effect sensor including offset and temperature effect","volume":"73","author":"Madec","year":"2012","journal-title":"Analog. Integr. Circuit. Signal."},{"key":"ref_12","unstructured":"Paun, M.A., Sallese, J.M., and Kayal, M. (2011, January 16\u201318). Hall Effect Sensors Performance Investigation Using Three-Dimensional Simulations. Proceedings of the 18th International Conference on Mixed Design of Integrated Circuits and Systems (MIXDES), Gliwice, Poland."},{"key":"ref_13","unstructured":"Synopsys TCAD tools. Available online:http:\/\/www.synopsys.com\/Tools\/TCAD."}],"container-title":["Journal of Sensor and Actuator Networks"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/2224-2708\/2\/1\/85\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T21:44:54Z","timestamp":1760219094000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/2224-2708\/2\/1\/85"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,2,8]]},"references-count":13,"journal-issue":{"issue":"1","published-online":{"date-parts":[[2013,3]]}},"alternative-id":["jsan2010085"],"URL":"https:\/\/doi.org\/10.3390\/jsan2010085","relation":{},"ISSN":["2224-2708"],"issn-type":[{"value":"2224-2708","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,2,8]]}}}