{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,12]],"date-time":"2025-10-12T03:56:00Z","timestamp":1760241360604,"version":"build-2065373602"},"reference-count":16,"publisher":"MDPI AG","issue":"1","license":[{"start":{"date-parts":[[2018,1,9]],"date-time":"2018-01-09T00:00:00Z","timestamp":1515456000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"The National Key R&amp;D Program of China","award":["2016YFB0500400"],"award-info":[{"award-number":["2016YFB0500400"]}]},{"name":"The National High Technology Research and Development Program of China","award":["2014AA123202"],"award-info":[{"award-number":["2014AA123202"]}]},{"name":"Major Project of National High Resolution Earth Observation System of China","award":["A0106\/1112"],"award-info":[{"award-number":["A0106\/1112"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Remote Sensing"],"abstract":"<jats:p>Dispersive hyperspectral VNIR (visible and near-infrared) imagers using back-illuminated CCDs will suffer from interference fringes in near-infrared bands, which can cause a sensitivity modulation as high as 40% or more when the spectral resolution gets higher than 5 nm. In addition to the interference fringes that will change with time, there is fixed-pattern non-uniformity between pixels in the spatial dimension due to the small-scale roughness of the imager\u2019s entrance slit, creating a much more complicated problem. A two-step method to remove fringes for dispersive hyperspectral VNIR imagers is proposed and evaluated. It first uses a ridge regression model to suppress the spectral fringes, and then computes spatial correction coefficients from the object data to correct the spatial fringes. In order to evaluate its effectiveness, the method was used to remove fringes for both the calibration data and object data collected from two VNIR grating-based hyperspectral imagers. Results show that the proposed method can preserve the original spectral shape, improve the image quality, and reduce the fringe amplitude in the 700\u20131000 nm region from about \u00b123% (10.7% RMSE) to about \u00b14% (1.9% RMSE). This method is particularly useful for spectra taken through a slit with a grating and shows flexible adaptability to object data, which suffer from time-varying interference fringes.<\/jats:p>","DOI":"10.3390\/rs10010079","type":"journal-article","created":{"date-parts":[[2018,1,9]],"date-time":"2018-01-09T14:00:08Z","timestamp":1515506408000},"page":"79","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":4,"title":["A Novel Method to Remove Fringes for Dispersive Hyperspectral VNIR Imagers Using Back-Illuminated CCDs"],"prefix":"10.3390","volume":"10","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6963-2338","authenticated-orcid":false,"given":"Binlin","family":"Hu","sequence":"first","affiliation":[{"name":"Key Laboratory of Infrared System Detection and Imaging Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China"},{"name":"University of Chinese Academy of Sciences, Beijing 100049, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dexin","family":"Sun","sequence":"additional","affiliation":[{"name":"Key Laboratory of Infrared System Detection and Imaging Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China"},{"name":"University of Chinese Academy of Sciences, Beijing 100049, China"},{"name":"Qidong Optoelectronic Remote Sensing Center, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Qidong 226200, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yinnian","family":"Liu","sequence":"additional","affiliation":[{"name":"Key Laboratory of Infrared System Detection and Imaging Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China"},{"name":"University of Chinese Academy of Sciences, Beijing 100049, China"},{"name":"Qidong Optoelectronic Remote Sensing Center, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Qidong 226200, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2018,1,9]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"1491","DOI":"10.1088\/0957-0233\/5\/12\/010","article-title":"Performance of a thinned BI CCD as detector for normal incidence EUV spectrograph","volume":"5","author":"Naletto","year":"1994","journal-title":"Meas. Sci. Technol."},{"key":"ref_2","doi-asserted-by":"crossref","first-page":"216","DOI":"10.1016\/S0168-9002(99)01224-3","article-title":"Back-illuminated, Fully-Depleted CCD image Sensors for use in Optical and near-IR Astronomy","volume":"442","author":"Groom","year":"2000","journal-title":"Nucl. Instrum. Methods Phys. Res."},{"key":"ref_3","doi-asserted-by":"crossref","unstructured":"Bebek, C.J., Coles, R.A., Denes, P., Dion, F., Emes, J.H., Frost, R., Groom, D.E., Groulx, R., Haque, S., and Holland, S.E. (2012, January 1\u20136). CCD Research and Development at Lawrence Berkeley National Laboratory. Proceedings of the SPIE Astronomical Telescopes + Instrumentation, Amsterdam, The Netherlands.","DOI":"10.1117\/12.926606"},{"key":"ref_4","unstructured":"(2017, November 27). Optical Etaloning in Charge Coupled Devices. Available online: http:\/\/www.andor.com\/learning-academy\/optical-etaloning-in-charge-coupled-devices-technical-article."},{"key":"ref_5","doi-asserted-by":"crossref","first-page":"3758","DOI":"10.1063\/1.357378","article-title":"Optical functions of silicon at elevated temperatures","volume":"76","author":"Jellison","year":"1994","journal-title":"J. Appl. Phys."},{"key":"ref_6","doi-asserted-by":"crossref","first-page":"634","DOI":"10.1117\/12.395522","article-title":"Recent progress on CCDs for astronomical imaging","volume":"4008","author":"Groom","year":"2000","journal-title":"Proc. SPIE"},{"key":"ref_7","doi-asserted-by":"crossref","unstructured":"Amico, P., and Beletic, J.W. (2000). Optimising CCDs for Spectrographs. Optical Detectors for Astronomy II, Kluwer Academic Publishers.","DOI":"10.1007\/978-94-011-4361-5"},{"key":"ref_8","doi-asserted-by":"crossref","unstructured":"Kelt, A., Harris, A., Jorden, P., and Tulloch, S. (2005). Optimised CCD Antireflection Coating: Gradded Thickness AR Coating (for Fixed-Format Spectroscopy). Sci. Detect. Astron., 369\u2013374.","DOI":"10.1007\/1-4020-4330-9_41"},{"key":"ref_9","doi-asserted-by":"crossref","first-page":"218","DOI":"10.1086\/345913","article-title":"Removing the Fringes from Space Telescope Imaging Spectrograph Slitless Spectra","volume":"115","author":"Malumuth","year":"2003","journal-title":"Publ. Astron. Soc. Pac."},{"key":"ref_10","first-page":"1995","article-title":"Research on and Correction of Interference Fringes Phenomenon in Dispersive Hyperspectral Imaging Spectrometer Using BI CCDs in Near-Infrared Band","volume":"34","author":"Ma","year":"2014","journal-title":"Spectrosc. Spectr. Anal."},{"key":"ref_11","unstructured":"Walsh, J.R., Baum, S.A., Malumuth, E.M., and Goudfrooij, P. (2018, January 08). Available online: https:\/\/www.researchgate.net\/publication\/251303703_STIS_Near-IR_Fringing_Basics_and_Use_of_Contemporaneous_Flats_for_Extended_Sources."},{"key":"ref_12","doi-asserted-by":"crossref","first-page":"263","DOI":"10.1086\/664741","article-title":"Fringe Science: Defringing CCD Images with Neon Lamp Flat Fields","volume":"124","author":"Howell","year":"2012","journal-title":"Publ. Astron. Soc. Pac."},{"key":"ref_13","doi-asserted-by":"crossref","first-page":"553","DOI":"10.1086\/506136","article-title":"A Method to Remove Fringes from Images Using Wavelets","volume":"649","author":"Rojo","year":"2006","journal-title":"Astrophys. J."},{"key":"ref_14","doi-asserted-by":"crossref","first-page":"828","DOI":"10.1088\/0004-637X\/756\/2\/194","article-title":"Removal of Spectro-Polarimetric Fringes by Two-Dimensional Pattern Recognition","volume":"756","author":"Casini","year":"2012","journal-title":"Astrophys. J."},{"key":"ref_15","doi-asserted-by":"crossref","first-page":"80","DOI":"10.1080\/00401706.2000.10485983","article-title":"Ridge Regression: Biased Estimation for Nonorthogonal Problems","volume":"42","author":"Hoerl","year":"2000","journal-title":"Technometrics"},{"key":"ref_16","doi-asserted-by":"crossref","unstructured":"Fischer, A.D., Thomas, T.J., Leathers, R.A., and Downes, T.V. (2007, January 3\u201310). Stable Scene-Based Non-Uniformity Correction Coefficients for Hyperspectral SWIR Sensors. Proceedings of the IEEE Aerospace Conference, Big Sky, MT, USA.","DOI":"10.1109\/AERO.2007.353057"}],"container-title":["Remote Sensing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/2072-4292\/10\/1\/79\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T14:50:35Z","timestamp":1760194235000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/2072-4292\/10\/1\/79"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,1,9]]},"references-count":16,"journal-issue":{"issue":"1","published-online":{"date-parts":[[2018,1]]}},"alternative-id":["rs10010079"],"URL":"https:\/\/doi.org\/10.3390\/rs10010079","relation":{},"ISSN":["2072-4292"],"issn-type":[{"type":"electronic","value":"2072-4292"}],"subject":[],"published":{"date-parts":[[2018,1,9]]}}}