{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,9]],"date-time":"2026-07-09T16:17:50Z","timestamp":1783613870857,"version":"3.55.0"},"reference-count":19,"publisher":"MDPI AG","issue":"15","license":[{"start":{"date-parts":[[2022,8,6]],"date-time":"2022-08-06T00:00:00Z","timestamp":1659744000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Remote Sensing"],"abstract":"<jats:p>Vicarious calibration is a well-developed method for electro-optical (EO) sensor calibration that has been used since the early 1980s. The radiometric calibration of reflectance solar band is mainly applied to reflection inversion. In this paper, a radiometric calibration-reflectance inversion (RCRII) model is proposed as an improved vicarious calibration method. Taking the reflectance of grayscale targets with constant spectrum, suitable uniformity, and near-Lambertian characteristics as the known information, the grayscale target calibration is realized, and the initial value of calibration coefficient and offset are calculated. Then, the adjacency effect is evaluated and corrected by reflectance inversion, and the results are fed back to the calibration process to realize the iterative process of calibration inversion rescaling. The results indicate that the absolute difference between the reflectance calculated with the RCRII model and measured reflectance is less than 0.01. By comparing with Sentinel-2A images, it is cross-verified that the difference of radiance between them is within 4%, and the absolute reflectance difference is less than 0.01, in the range of 0.1~0.3 reflectance.<\/jats:p>","DOI":"10.3390\/rs14153779","type":"journal-article","created":{"date-parts":[[2022,8,9]],"date-time":"2022-08-09T04:16:55Z","timestamp":1660018615000},"page":"3779","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["An Improved Vicarious Calibration Method Based on Multi-Grayscale Targets"],"prefix":"10.3390","volume":"14","author":[{"given":"Shiwei","family":"Bao","sequence":"first","affiliation":[{"name":"Key Laboratory of Optical Calibration and Characterization, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"},{"name":"Science Island Branch of Graduate School, University of Science and Technology of China, Hefei 230026, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hongyao","family":"Chen","sequence":"additional","affiliation":[{"name":"Key Laboratory of Optical Calibration and Characterization, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yan","family":"Li","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Space-Ground Integrated Information Technology Space Star Technology Company Ltd., Beijing 100095, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Liming","family":"Zhang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Optical Calibration and Characterization, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wenxin","family":"Huang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Optical Calibration and Characterization, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7976-8121","authenticated-orcid":false,"given":"Xiaolong","family":"Si","sequence":"additional","affiliation":[{"name":"Key Laboratory of Optical Calibration and Characterization, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xianhua","family":"Wang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Optical Calibration and Characterization, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhou","family":"Fang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Space-Ground Integrated Information Technology Space Star Technology Company Ltd., Beijing 100095, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yuanwei","family":"Chen","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Space-Ground Integrated Information Technology Space Star Technology Company Ltd., Beijing 100095, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xinrong","family":"Wang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Space-Ground Integrated Information Technology Space Star Technology Company Ltd., Beijing 100095, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiaowen","family":"Zhao","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Space-Ground Integrated Information Technology Space Star Technology Company Ltd., Beijing 100095, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2022,8,6]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Yoon, H., and Kacker, R. 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