{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,19]],"date-time":"2026-03-19T07:50:53Z","timestamp":1773906653264,"version":"3.50.1"},"reference-count":42,"publisher":"MDPI AG","issue":"16","license":[{"start":{"date-parts":[[2022,8,11]],"date-time":"2022-08-11T00:00:00Z","timestamp":1660176000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Equipment Advance Research Fund","award":["305090306"],"award-info":[{"award-number":["305090306"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Remote Sensing"],"abstract":"<jats:p>The ultraviolet\u2013visible imaging spectropolarimeter (UVISP), developed by the Anhui Institute of Optics and Fine Mechanics (AIOFM), Chinese Academy of Science (CAS), is a dual-beam snapshot instrument for measuring the spectral, radiometric, and linear polarization information of absorbing aerosol in a wavelength range from 340 to 520 nm. In this paper, we propose a complete set of calibration methods for UVISP to ensure the accuracy of the measured radiation polarization data, thus guaranteeing the reliability of inversion results. In geometric calibration, we complete the assignment of the field of view (FOV) angle to each pixel of the detector using a high precision turntable and parallel light source. In addition, the geometric calibration accuracy of the S beam and P beam is also analyzed. The results show that the residuals of all row pixels are less than 0.12\u00b0. Based on geometric calibration, a spectral calibration is conducted at each spectrum of the S beam and P beam for the given FOV, and the relation between the wavelength and pixel is obtained by a linear fitting procedure. For radiometric calibration, the uniformity of spectral responsivity is corrected, and the function between spectral radiance and output digital data is established. To improve the accuracy of the polarimetric measurement, a polarimetric calibration is proposed, and validated experimental results show that the root mean square (RMS) errors for the demodulated value are all within 0.011 for the input linear polarized light with different angles of linear polarization (AoLPs). Finally, field measurements are conducted, and the absolute deviations are all within 0.01 when the UVISP and CE-318 sun\u2013sky polarimetric radiometer (CE318N) simultaneously measure the degree of linear polarization (DoLP) of the sky at different zenith angles. These experimental results demonstrate the efficiency and accuracy of the proposed calibration methods.<\/jats:p>","DOI":"10.3390\/rs14163898","type":"journal-article","created":{"date-parts":[[2022,8,11]],"date-time":"2022-08-11T21:15:05Z","timestamp":1660252505000},"page":"3898","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":7,"title":["Laboratory Calibration of an Ultraviolet\u2013Visible Imaging Spectropolarimeter"],"prefix":"10.3390","volume":"14","author":[{"given":"Jingjing","family":"Shi","sequence":"first","affiliation":[{"name":"School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China"},{"name":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mengfan","family":"Li","sequence":"additional","affiliation":[{"name":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8964-9222","authenticated-orcid":false,"given":"Yadong","family":"Hu","sequence":"additional","affiliation":[{"name":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiangjing","family":"Wang","sequence":"additional","affiliation":[{"name":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hua","family":"Xu","sequence":"additional","affiliation":[{"name":"State Environment Protection Key Laboratory of Satellite Remote Sensing, Aerospace Information Research Institute, Chinese Academy of Sciences, Beijing 100101, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gaojun","family":"Chi","sequence":"additional","affiliation":[{"name":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jin","family":"Hong","sequence":"additional","affiliation":[{"name":"School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China"},{"name":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2022,8,11]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"5453","DOI":"10.1364\/AO.45.005453","article-title":"Review of passive imaging polarimetry for remote sensing applications","volume":"45","author":"Tyo","year":"2006","journal-title":"Appl. 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