{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,5]],"date-time":"2026-03-05T05:56:50Z","timestamp":1772690210664,"version":"3.50.1"},"reference-count":86,"publisher":"MDPI AG","issue":"19","license":[{"start":{"date-parts":[[2022,9,23]],"date-time":"2022-09-23T00:00:00Z","timestamp":1663891200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001809","name":"the National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["81671787"],"award-info":[{"award-number":["81671787"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Remote Sensing"],"abstract":"<jats:p>Although the performance of unmanned aerial vehicle (UAV) tracking has benefited from the successful application of discriminative correlation filters (DCF) and convolutional neural networks (CNNs), UAV tracking under occlusion and deformation remains a challenge. The main dilemma is that challenging scenes, such as occlusion or deformation, are very complex and changeable, making it difficult to obtain training data covering all situations, resulting in trained networks that may be confused by new contexts that differ from historical information. Data-driven strategies are the main direction of current solutions, but gathering large-scale datasets with object instances under various occlusion and deformation conditions is difficult and lacks diversity. This paper proposes an attention-based mask generation network (AMGN) for UAV-specific tracking, which combines the attention mechanism and adversarial learning to improve the tracker\u2019s ability to handle occlusion and deformation. After the base CNN extracts the deep features of the candidate region, a series of masks are determined by the spatial attention module and sent to the generator, and the generator discards some features according to these masks to simulate the occlusion and deformation of the object, producing more hard positive samples. The discriminator seeks to distinguish these hard positive samples while guiding mask generation. Such adversarial learning can effectively complement occluded and deformable positive samples in the feature space, allowing to capture more robust features to distinguish objects from backgrounds. Comparative experiments show that our AMGN-based tracker achieves the highest area under curve (AUC) of 0.490 and 0.349, and the highest precision scores of 0.742 and 0.662, on the UAV123 tracking benchmark with partial and full occlusion attributes, respectively. It also achieves the highest AUC of 0.555 and the highest precision score of 0.797 on the DTB70 tracking benchmark with the deformation attribute. On the UAVDT tracking benchmark with the large occlusion attribute, it achieves the highest AUC of 0.407 and the highest precision score of 0.582.<\/jats:p>","DOI":"10.3390\/rs14194756","type":"journal-article","created":{"date-parts":[[2022,9,26]],"date-time":"2022-09-26T03:34:17Z","timestamp":1664163257000},"page":"4756","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":12,"title":["Occlusion and Deformation Handling Visual Tracking for UAV via Attention-Based Mask Generative Network"],"prefix":"10.3390","volume":"14","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4953-5474","authenticated-orcid":false,"given":"Yashuo","family":"Bai","sequence":"first","affiliation":[{"name":"School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China"},{"name":"Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, Beijing Institute of Technology, Beijing 100081, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3108-2307","authenticated-orcid":false,"given":"Yong","family":"Song","sequence":"additional","affiliation":[{"name":"School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China"},{"name":"Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, Beijing Institute of Technology, Beijing 100081, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5919-7595","authenticated-orcid":false,"given":"Yufei","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China"},{"name":"Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, Beijing Institute of Technology, Beijing 100081, China"}]},{"given":"Ya","family":"Zhou","sequence":"additional","affiliation":[{"name":"School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China"},{"name":"Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, Beijing Institute of Technology, Beijing 100081, China"}]},{"given":"Xiyan","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China"},{"name":"Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, Beijing Institute of Technology, Beijing 100081, China"}]},{"given":"Yuxin","family":"He","sequence":"additional","affiliation":[{"name":"School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China"},{"name":"Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, Beijing Institute of Technology, Beijing 100081, China"}]},{"given":"Zishuo","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China"},{"name":"Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, Beijing Institute of Technology, Beijing 100081, China"}]},{"given":"Xin","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China"},{"name":"Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, Beijing Institute of Technology, Beijing 100081, China"}]},{"given":"Qun","family":"Hao","sequence":"additional","affiliation":[{"name":"School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China"},{"name":"Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, Beijing Institute of Technology, Beijing 100081, China"}]}],"member":"1968","published-online":{"date-parts":[[2022,9,23]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"1429","DOI":"10.1109\/TMM.2015.2455418","article-title":"On-Road Pedestrian Tracking Across Multiple Driving Recorders","volume":"17","author":"Lee","year":"2015","journal-title":"IEEE Trans. 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