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It enables a ground coverage of 400 \u00d7 400 km by internal scanning and achieves a high spatial resolution of 25 m. The full spectrum is divided into five sub-bands, and each band adopts four spectrometers to splice in the field of view to achieve the ultra-long slit required by the wide swath. The total length of the slit is up to 241.3 mm. This paper focuses on compact spectrometers with long slits that can meet the splicing requirements and points out that low spectral distortions, low stray light, high signal-to-noise ratio, and uniform spectral response are necessary for high-fidelity performance. The Offner and Wynne\u2013Offner high-fidelity spectrometers based on convex blazed gratings are designed, and prototypes of each band are developed as well. The properties of long slits and convex blazed gratings are presented. The maximum length of a single slit is 61.44 mm. The groove density of gratings for five bands ranges from 8.8 lp\/mm to 312.1 lp\/mm, and the peak efficiency is up to 86.4%. The alignment and test of the spectrometers are introduced. Results show that the developed spectrometers have high fidelity and fulfill all requirements.<\/jats:p>","DOI":"10.3390\/rs15020396","type":"journal-article","created":{"date-parts":[[2023,1,9]],"date-time":"2023-01-09T04:47:08Z","timestamp":1673239628000},"page":"396","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":9,"title":["Geostationary Full-Spectrum Wide-Swath High-Fidelity Imaging Spectrometer: Optical Design and Prototype Development"],"prefix":"10.3390","volume":"15","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4162-1447","authenticated-orcid":false,"given":"Jiacheng","family":"Zhu","sequence":"first","affiliation":[{"name":"College of Optoelectronic Science and Engineering, Soochow University, Suzhou 215006, China"},{"name":"Key Lab of Advanced Optical Manufacturing Technologies of Jiangsu Province & Key Lab of Modern Optical Technologies of Education Ministry of China, Suzhou 215006, China"}]},{"given":"Zhicheng","family":"Zhao","sequence":"additional","affiliation":[{"name":"College of Optoelectronic Science and Engineering, Soochow University, Suzhou 215006, China"},{"name":"Key Lab of Advanced Optical Manufacturing Technologies of Jiangsu Province & Key Lab of Modern Optical Technologies of Education Ministry of China, Suzhou 215006, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0606-3040","authenticated-orcid":false,"given":"Quan","family":"Liu","sequence":"additional","affiliation":[{"name":"College of Optoelectronic Science and Engineering, Soochow University, Suzhou 215006, China"},{"name":"Key Lab of Advanced Optical Manufacturing Technologies of Jiangsu Province & Key Lab of Modern Optical Technologies of Education Ministry of China, Suzhou 215006, China"}]},{"given":"Xinhua","family":"Chen","sequence":"additional","affiliation":[{"name":"College of Optoelectronic Science and Engineering, Soochow University, Suzhou 215006, China"},{"name":"Key Lab of Advanced Optical Manufacturing Technologies of Jiangsu Province & Key Lab of Modern Optical Technologies of Education Ministry of China, Suzhou 215006, China"}]},{"given":"Huan","family":"Li","sequence":"additional","affiliation":[{"name":"Beijing Institute of Space Mechanics and Electricity, Beijing 100094, China"}]},{"given":"Shaofan","family":"Tang","sequence":"additional","affiliation":[{"name":"Beijing Institute of Space Mechanics and Electricity, Beijing 100094, China"}]},{"given":"Weimin","family":"Shen","sequence":"additional","affiliation":[{"name":"College of Optoelectronic Science and Engineering, Soochow University, Suzhou 215006, China"},{"name":"Key Lab of Advanced Optical Manufacturing Technologies of Jiangsu Province & Key Lab of Modern Optical Technologies of Education Ministry of China, Suzhou 215006, China"}]}],"member":"1968","published-online":{"date-parts":[[2023,1,9]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"546","DOI":"10.1109\/TGRS.1984.6499168","article-title":"Airborne Imaging Spectrometer: A New Tool for Remote Sensing","volume":"GE-22","author":"Vane","year":"1984","journal-title":"IEEE Trans. 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