{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T02:39:36Z","timestamp":1760150376840,"version":"build-2065373602"},"reference-count":28,"publisher":"MDPI AG","issue":"22","license":[{"start":{"date-parts":[[2023,11,12]],"date-time":"2023-11-12T00:00:00Z","timestamp":1699747200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61675012"],"award-info":[{"award-number":["61675012"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Remote Sensing"],"abstract":"<jats:p>The spectral reflectance measured in situ is often regarded as the \u201ctruth\u201d of objects, which plays an important role in Earth observation applications. However, in situ measurements are influenced by several factors such as atmospheric conditions, illumination and view geometry (I&amp;VG), cloud coverage, and adjacency effects. In order to avoid the influence of these factors, in situ measurements are usually carried out under sunny days and close to noon. However, the impact of I&amp;VG is still present in most cases. At present, people still know little about the influence mechanism of I&amp;VG. Moreover, correcting the impact of I&amp;VG is also a problem that needs to be urgently solved in reflectance spectroscopy. In this work, experiments are carried out using the multi-directional hyperspectral remote sensing simulation facility (MHSRS2F), which allows adjustment and control of the I&amp;VG parameters. This paper proposes an uncertainty evaluation model for I&amp;VG and quantifies the uncertainty caused by different I&amp;VG parameters. Then, the sensitivity of reflectance to I&amp;VG at different wavelengths is explored based on uncertainty models. Finally, a correction model for reflectance under different I&amp;VG conditions is proposed. The results reveal that the uncertainty and sensitivity caused by observation height are relatively high, regardless of the surface heterogeneity. It directly affects the size of the field of view and the physicochemical characteristics of the object. For objects that approximate the Lambertian surface, more attention should be paid to the selection and variation of solar and view zenith angles and view azimuth angles. For objects with surface heterogeneity, the selection and variation of solar azimuth angle, view azimuth angle, and solar zenith angle are more crucial. The correction model proposed in this paper has a 41.25% correction effect on different view zenith angles, but the correction effect on other environmental factors is not significant.<\/jats:p>","DOI":"10.3390\/rs15225332","type":"journal-article","created":{"date-parts":[[2023,11,13]],"date-time":"2023-11-13T02:46:47Z","timestamp":1699843607000},"page":"5332","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":5,"title":["The Impact and Correction of Sensitive Environmental Factors on Spectral Reflectance Measured In Situ"],"prefix":"10.3390","volume":"15","author":[{"given":"Huijie","family":"Zhao","sequence":"first","affiliation":[{"name":"Key Laboratory of Precision Opto-Mechatronics Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing 100191, China"},{"name":"Key Laboratory of Ministry of Industry and Information Technology, Institute of Artificial Intelligence, Aerospace Optical-Microwave Integrated Precision Intelligent Sensing, Beihang University, Beijing 100191, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-6684-7024","authenticated-orcid":false,"given":"Ziwei","family":"Wang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Precision Opto-Mechatronics Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing 100191, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2368-0163","authenticated-orcid":false,"given":"Guorui","family":"Jia","sequence":"additional","affiliation":[{"name":"Key Laboratory of Precision Opto-Mechatronics Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing 100191, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8766-8465","authenticated-orcid":false,"given":"Jia","family":"Tian","sequence":"additional","affiliation":[{"name":"Key Laboratory of Precision Opto-Mechatronics Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing 100191, China"}]},{"given":"Shuliang","family":"Jin","sequence":"additional","affiliation":[{"name":"Key Laboratory of Precision Opto-Mechatronics Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing 100191, China"}]},{"given":"Shuneng","family":"Liang","sequence":"additional","affiliation":[{"name":"Land Satellite Remote Sensing Application Center, Ministry of Natural Resources of China, Beijing 100048, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0927-9039","authenticated-orcid":false,"given":"Yumeng","family":"Liu","sequence":"additional","affiliation":[{"name":"Science & Technology on Integrated Information System Laboratory, Institute of Software, Chinese Academy of Sciences, Beijing 100190, China"}]}],"member":"1968","published-online":{"date-parts":[[2023,11,12]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"S92","DOI":"10.1016\/j.rse.2007.08.001","article-title":"Progress in field spectroscopy","volume":"113","author":"Milton","year":"2009","journal-title":"Remote Sens. 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