{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,28]],"date-time":"2026-02-28T04:28:17Z","timestamp":1772252897441,"version":"3.50.1"},"reference-count":44,"publisher":"MDPI AG","issue":"12","license":[{"start":{"date-parts":[[2024,6,15]],"date-time":"2024-06-15T00:00:00Z","timestamp":1718409600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"next-generation carbon satellite data receiving, processing and cloud service technology","award":["2023YFB3907500"],"award-info":[{"award-number":["2023YFB3907500"]}]},{"name":"next-generation carbon satellite data receiving, processing and cloud service technology","award":["2023YFB390751"],"award-info":[{"award-number":["2023YFB390751"]}]},{"name":"construction of satellite-ground link indicator system and carbon monitoring planning guidance technology","award":["2023YFB3907500"],"award-info":[{"award-number":["2023YFB3907500"]}]},{"name":"construction of satellite-ground link indicator system and carbon monitoring planning guidance technology","award":["2023YFB390751"],"award-info":[{"award-number":["2023YFB390751"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Remote Sensing"],"abstract":"<jats:p>The Greenhouse Gases Monitoring Instrument is based on the spectroscopic principle of spatial heterodyne spectroscopy technology and has the characteristics of no moving parts, a hyperspectral resolution, and a large luminous flux. The instrumental line shape function is one of the most important parameters characterizing the features of the instrument, and it plays a vital role in the system error analysis of the instrument\u2019s measurements. To accurately obtain the instrumental line shape function of a spatial heterodyne spectrometer during the on-orbit period and improve the accuracy of gas concentration retrieval, this study develops a method to model and characterize the characteristics of the instrumental line shape function, including modulation loss and phase error. This study employs the solar calibration spectrum in the 1.568\u20131.583 \u03bcm bands to conduct iterative calculations of the instrumental line shape function error model. After the instrumental line function is updated, the average relative deviation is reduced from 1.83% to 0.756% between the theoretical and measured solar spectra. Additionally, the average relative deviation is reduced from 7.049% to 2.106% between the GMI nadir and theoretical nadir spectra. The findings demonstrate that updating the instrumental line shape function mitigates the impact of variations in the spectrometer\u2019s instrumental line shape due to alterations in the orbital environment. This study offers a dependable reference for both the enhancement and oversight of a spectrometer\u2019s instrumental line shape function, along with an investigation of shifts in instrument parameters.<\/jats:p>","DOI":"10.3390\/rs16122171","type":"journal-article","created":{"date-parts":[[2024,6,17]],"date-time":"2024-06-17T04:48:12Z","timestamp":1718599692000},"page":"2171","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Research on Calculation Method of On-Orbit Instrumental Line Shape Function for the Greenhouse Gases Monitoring Instrument on the GaoFen-5B Satellite"],"prefix":"10.3390","volume":"16","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-7047-4224","authenticated-orcid":false,"given":"Yunfei","family":"Han","sequence":"first","affiliation":[{"name":"School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China"},{"name":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"},{"name":"Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5235-2698","authenticated-orcid":false,"given":"Hailiang","family":"Shi","sequence":"additional","affiliation":[{"name":"School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China"},{"name":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"},{"name":"Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China"}]},{"given":"Haiyan","family":"Luo","sequence":"additional","affiliation":[{"name":"School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China"},{"name":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"},{"name":"Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China"}]},{"given":"Zhiwei","family":"Li","sequence":"additional","affiliation":[{"name":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"},{"name":"Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China"}]},{"given":"Hanhan","family":"Ye","sequence":"additional","affiliation":[{"name":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"},{"name":"Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8852-8448","authenticated-orcid":false,"given":"Chao","family":"Li","sequence":"additional","affiliation":[{"name":"School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China"},{"name":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"},{"name":"Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China"}]},{"given":"Yi","family":"Ding","sequence":"additional","affiliation":[{"name":"School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China"},{"name":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"},{"name":"Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China"}]},{"given":"Shichao","family":"Wu","sequence":"additional","affiliation":[{"name":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"},{"name":"Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China"}]},{"given":"Xianhua","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China"},{"name":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"},{"name":"Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China"}]},{"given":"Wei","family":"Xiong","sequence":"additional","affiliation":[{"name":"School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China"},{"name":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"},{"name":"Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China"}]},{"given":"Chenhui","family":"Hou","sequence":"additional","affiliation":[{"name":"China Siwei Surveying and Mapping Technology Co., Ltd., Beijing 100086, China"}]}],"member":"1968","published-online":{"date-parts":[[2024,6,15]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"9","DOI":"10.3390\/aerospace10010009","article-title":"Overview and Application of GaoFen 5-02 Satellite","volume":"12","author":"Zhang","year":"2022","journal-title":"Aerosp. 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