{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T01:40:33Z","timestamp":1760146833542,"version":"build-2065373602"},"reference-count":51,"publisher":"MDPI AG","issue":"24","license":[{"start":{"date-parts":[[2024,12,11]],"date-time":"2024-12-11T00:00:00Z","timestamp":1733875200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Remote Sensing"],"abstract":"<jats:p>The spectral reflectance measured in situ is often regarded as the \u201ctruth\u201d. However, its limited coverage and large spatial heterogeneity often make the ground-based reflectance unable to represent the remote sensing images. Since the spatial scale mismatch between ground-based, airborne, and spaceborne measurements, the applications of geological exploration, metallogenic prognosis and mine monitoring are facing severe challenges. In order to explore the influence of spatial scale effect on rock spectra, spectral reflectance with uncertainty caused by differences in illumination view geometry and spatial heterogeneity is introduced into the Bayesian Maximum Entropy (BME) method. Then, the rock spectra are upscaled from the point-scale to meter-scale and to 10 m-scale, respectively. Finally, the influence of spatial scale effect is evaluated based on the reflectance value, spectral shape, and spectral characteristic parameters. The results indicate that the BME model shows better upscaling accuracy and stability than Ordinary Kriging and Ordinary Least Squares model. The maximum Euclidean Distance of rock spectra caused by spatial resolution change is 6.271, and the Spectral Angle Mapper can reach 0.370. The spectral absorption position, absorption depth, and spectral absorption index are less affected by scale effect. For the area with similar spatial heterogeneity to the Huangshan Copper\u2013Nickel Ore District, when the spatial resolution of the image is greater than 10 m, the rock\u2019s spectrum is less influenced by the change in spatial resolution. Otherwise, the influence of spatial scale effect should be considered in applications. In addition, this work puts forward a set of processes to evaluate the influence of spatial scale effect in the study area and carry out the upscaling.<\/jats:p>","DOI":"10.3390\/rs16244643","type":"journal-article","created":{"date-parts":[[2024,12,11]],"date-time":"2024-12-11T12:58:49Z","timestamp":1733921929000},"page":"4643","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["The Influence of Spatial Scale Effect on Rock Spectral Reflectance: A Case Study of Huangshan Copper\u2013Nickel Ore District"],"prefix":"10.3390","volume":"16","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-6684-7024","authenticated-orcid":false,"given":"Ziwei","family":"Wang","sequence":"first","affiliation":[{"name":"Ministry of Education Key Laboratory of Precision Opto-Mechatronics Technology, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing 100191, China"}]},{"given":"Huijie","family":"Zhao","sequence":"additional","affiliation":[{"name":"Ministry of Education Key Laboratory of Precision Opto-Mechatronics Technology, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing 100191, China"},{"name":"Key Laboratory of Ministry of Industry and Information Technology, Institute of Artificial Intelligence, Aerospace Optical-Microwave Integrated Precision Intelligent Sensing, Beihang University, Beijing 100191, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2368-0163","authenticated-orcid":false,"given":"Guorui","family":"Jia","sequence":"additional","affiliation":[{"name":"Ministry of Education Key Laboratory of Precision Opto-Mechatronics Technology, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing 100191, China"}]},{"given":"Feixiang","family":"Wang","sequence":"additional","affiliation":[{"name":"Ministry of Education Key Laboratory of Precision Opto-Mechatronics Technology, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing 100191, China"}]}],"member":"1968","published-online":{"date-parts":[[2024,12,11]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Brown, L.A., Camacho, F., Garc\u00eda-Santos, V., Origo, N., Fuster, B., Morris, H., Pastor-Guzman, J., S\u00e1nchez-Zapero, J., Morrone, R., and Ryder, J. 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