{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T15:50:29Z","timestamp":1762271429459,"version":"build-2065373602"},"reference-count":16,"publisher":"MDPI AG","issue":"4","license":[{"start":{"date-parts":[[2010,4,20]],"date-time":"2010-04-20T00:00:00Z","timestamp":1271721600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Areal roughness parameters always need to be under control in the thin film solar cell industry because of their close relationship with the electrical efficiency of the cells. In this work, these parameters are evaluated for measurements carried out in a typical fabrication area for this industry. Measurements are made using a portable atomic force microscope on the CNC diamond cutting machine where an initial sample of transparent conductive oxide is cut into four pieces. The method is validated by making a comparison between the parameters obtained in this process and in the laboratory under optimal conditions. Areal roughness parameters and Fourier Spectral Analysis of the data show good compatibility and open the possibility to use this type of measurement instrument to perform in situ quality control. This procedure gives a sample for evaluation without destroying any of the transparent conductive oxide; in this way 100% of the production can be tested, so improving the measurement time and rate of production.<\/jats:p>","DOI":"10.3390\/s100404002","type":"journal-article","created":{"date-parts":[[2010,4,20]],"date-time":"2010-04-20T10:11:27Z","timestamp":1271758287000},"page":"4002-4009","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":9,"title":["In Situ Roughness Measurements for the Solar Cell Industry Using an Atomic Force Microscope"],"prefix":"10.3390","volume":"10","author":[{"given":"Higinio","family":"Gonz\u00e1lez-Jorge","sequence":"first","affiliation":[{"name":"Departamento de Ingenier\u00eda de los Recursos Naturales y del Medioambiente, ETS Ingenier\u00eda de Minas, Universidad de Vigo, 36310 Vigo, Spain"}]},{"given":"Victor","family":"Alvarez-Valado","sequence":"additional","affiliation":[{"name":"Departamento de I+D, Laboratorio Oficial de Metrolox\u00eda de Galicia, Parque Tecnol\u00f3xico de Galicia, San Cibrao das Vi\u00f1as, 32901 Ourense, Spain"}]},{"given":"Jose Luis","family":"Valencia","sequence":"additional","affiliation":[{"name":"Departamento de I+D, Laboratorio Oficial de Metrolox\u00eda de Galicia, Parque Tecnol\u00f3xico de Galicia, San Cibrao das Vi\u00f1as, 32901 Ourense, Spain"}]},{"given":"Soledad","family":"Torres","sequence":"additional","affiliation":[{"name":"Departamento de I+D, Laboratorio Oficial de Metrolox\u00eda de Galicia, Parque Tecnol\u00f3xico de Galicia, San Cibrao das Vi\u00f1as, 32901 Ourense, Spain"}]}],"member":"1968","published-online":{"date-parts":[[2010,4,20]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Smith, G.T. (2002). Industrial Metrology: Surfaces and Roundness, Springer-Verlag.","DOI":"10.1007\/978-1-4471-3814-3"},{"key":"ref_2","unstructured":"Dagnall, M.A. (1986). Exploring Surface Texture, Rank Taylor Hobson Limited."},{"key":"ref_3","doi-asserted-by":"crossref","unstructured":"Whitehouse, D.J. (2003). Handbook of Surface and Nanometrology, Institute of Physics Publishing.","DOI":"10.1887\/0750305835"},{"key":"ref_4","doi-asserted-by":"crossref","first-page":"69","DOI":"10.1016\/S0257-8972(00)00525-9","article-title":"Improving tribological properties of sputtered boron carbide coatings by process modifications","volume":"126","author":"Eckardt","year":"2000","journal-title":"Surf. Coat. Tech"},{"key":"ref_5","first-page":"157","article-title":"Surface properties after ageing of dispersion ceramic and its influence on strength","volume":"396\u2013398","author":"Begand","year":"2009","journal-title":"Key Eng. Mat"},{"key":"ref_6","unstructured":"Gubbels, G., van Venrooy, B., Bosch, A.J., and Senden, R. Rapidly solidified aluminium for optical applications. Marseille, France."},{"key":"ref_7","doi-asserted-by":"crossref","first-page":"86","DOI":"10.1504\/IJSURFSE.2009.024363","article-title":"Microstructural and topographical changes of Ni-P plated moulds in glass lens pressing","volume":"3","author":"Masuda","year":"2009","journal-title":"Int. J. Surf. Sci. Eng"},{"key":"ref_8","doi-asserted-by":"crossref","first-page":"180","DOI":"10.1179\/026708408X336364","article-title":"Influence of laser surface texturing on surface microstructure and mechanical properties of adhesive joined steel sheets","volume":"25","author":"Sakata","year":"2009","journal-title":"Surf. Eng"},{"key":"ref_9","unstructured":"Brown, L., and Blunt, L. Surface metrology for the automotive industry. Huddersfield, UK."},{"key":"ref_10","doi-asserted-by":"crossref","first-page":"841","DOI":"10.1016\/j.cirp.2006.10.010","article-title":"Advances in scanning force microscopy for dimensional metrology","volume":"55","author":"Danzebrink","year":"2006","journal-title":"CIRP Ann.-Manuf. Technol"},{"key":"ref_11","unstructured":"Nanosurf. Available online: http:\/\/www.nanosurf.com\/default.cfm?curr_navi=11&curr_content=11&spr=en (Access on 22 Decemeber 2009)."},{"key":"ref_12","unstructured":"DME Scanning Probe Microscopes. Available online: http:\/\/www.dme-spm.com\/ds95.html (Access on 26 December 2009)."},{"key":"ref_13","doi-asserted-by":"crossref","first-page":"296","DOI":"10.1016\/S0040-6090(03)00006-3","article-title":"Effect of surface roughness of ZnO: Al films on light scattering in hydrogenated amorphous silicon solar cells","volume":"426","author":"Krc","year":"2003","journal-title":"Thin solid films"},{"key":"ref_14","doi-asserted-by":"crossref","first-page":"333","DOI":"10.1016\/j.solmat.2004.07.031","article-title":"Optical analysis of textured plastic substrates to be used in thin silicon solar cells","volume":"87","author":"Villar","year":"2005","journal-title":"Solar Energ. Mater. Solar Cells"},{"key":"ref_15","unstructured":"Nanosensors. Available online: http:\/\/www.nanosensors.com\/PPP-NCLR.htm (Access on 11 December 2009)."},{"key":"ref_16","unstructured":"Image Metrology. http:\/\/www.imagemet.com\/WebHelp\/spip.htm#roughness_parameters.htm (Access on 22 December 2009)."}],"container-title":["Sensors"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/1424-8220\/10\/4\/4002\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T22:02:12Z","timestamp":1760220132000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/1424-8220\/10\/4\/4002"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,4,20]]},"references-count":16,"journal-issue":{"issue":"4","published-online":{"date-parts":[[2010,4]]}},"alternative-id":["s100404002"],"URL":"https:\/\/doi.org\/10.3390\/s100404002","relation":{},"ISSN":["1424-8220"],"issn-type":[{"type":"electronic","value":"1424-8220"}],"subject":[],"published":{"date-parts":[[2010,4,20]]}}}