{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,13]],"date-time":"2026-01-13T07:38:16Z","timestamp":1768289896467,"version":"3.49.0"},"reference-count":40,"publisher":"MDPI AG","issue":"1","license":[{"start":{"date-parts":[[2011,1,12]],"date-time":"2011-01-12T00:00:00Z","timestamp":1294790400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>In this paper we review recent design methodologies for fully dielectric electro-optic sensors that have applications in non-destructive evaluation (NDE) of devices and materials that radiate, guide, or otherwise may be impacted by microwave fields. In many practical NDE situations, fiber-coupled-sensor configurations are preferred due to their advantages over free-space bulk sensors in terms of optical alignment, spatial resolution, and especially, a low degree of field invasiveness. We propose and review five distinct types of fiber-coupled electro-optic sensor probes. The design guidelines for each probe type and their performances in absolute electric-field measurements are compared and summarized.<\/jats:p>","DOI":"10.3390\/s110100806","type":"journal-article","created":{"date-parts":[[2011,1,12]],"date-time":"2011-01-12T11:22:00Z","timestamp":1294831320000},"page":"806-824","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":49,"title":["Recent Advances in the Design of Electro-Optic Sensors for Minimally Destructive Microwave Field Probing"],"prefix":"10.3390","volume":"11","author":[{"given":"Dong-Joon","family":"Lee","sequence":"first","affiliation":[{"name":"Division of Physical Metrology, Korea Research Institute of Standards and Science, Yuseong-gu, Daejeon 305-340, Korea"}]},{"given":"No-Weon","family":"Kang","sequence":"additional","affiliation":[{"name":"Division of Physical Metrology, Korea Research Institute of Standards and Science, Yuseong-gu, Daejeon 305-340, Korea"}]},{"given":"Jun-Ho","family":"Choi","sequence":"additional","affiliation":[{"name":"The 4th R&D Institute, Agency for Defense Development, Yuseong-gu, Daejeon 305-600, Korea"}]},{"given":"Junyeon","family":"Kim","sequence":"additional","affiliation":[{"name":"The 4th R&D Institute, Agency for Defense Development, Yuseong-gu, Daejeon 305-600, Korea"}]},{"given":"John F.","family":"Whitaker","sequence":"additional","affiliation":[{"name":"Center for Ultrafast Optical Science, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109-2099, USA"}]}],"member":"1968","published-online":{"date-parts":[[2011,1,12]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"69","DOI":"10.1109\/JQE.1986.1072867","article-title":"Subpicosecond electro-optic sampling: Principles and applications","volume":"22","author":"Valdmanis","year":"1986","journal-title":"IEEE J. Quantum Electron"},{"key":"ref_2","doi-asserted-by":"crossref","first-page":"1308","DOI":"10.1049\/el:19870905","article-title":"1 THz-bandwidth prober for high speed devices and integrated circuits","volume":"23","author":"Valdmanis","year":"1987","journal-title":"Electron. Lett"},{"key":"ref_3","doi-asserted-by":"crossref","first-page":"843","DOI":"10.1109\/19.368087","article-title":"An automated electro-optic probing system for ultra-high-speed IC\u2019s","volume":"43","author":"Shinagawa","year":"1994","journal-title":"IEEE Trans. Instrum. Meas"},{"key":"ref_4","doi-asserted-by":"crossref","first-page":"2338","DOI":"10.1109\/22.739221","article-title":"Electro-optic mapping of near-field distributions in integrated microwave circuits","volume":"46","author":"Yang","year":"1998","journal-title":"IEEE Trans. Microwave Theory Tech"},{"key":"ref_5","doi-asserted-by":"crossref","first-page":"288","DOI":"10.1109\/22.821779","article-title":"Electrooptic mapping and finite-element modeling of the near-field pattern of a microstrip patch antenna","volume":"48","author":"Yang","year":"2000","journal-title":"IEEE Trans. Microwave Theory Tech"},{"key":"ref_6","doi-asserted-by":"crossref","first-page":"1655","DOI":"10.1088\/0957-0233\/13\/11\/301","article-title":"Photonic measurement technologies for high-speed electronics","volume":"13","author":"Nagatsuma","year":"2002","journal-title":"Meas. Sci. Technol"},{"key":"ref_7","doi-asserted-by":"crossref","first-page":"2611","DOI":"10.1109\/22.899020","article-title":"Fiber-edge electrooptic\/magnetooptic probe for spectral-domain analysis of electromagnetic field","volume":"48","author":"Wakana","year":"2000","journal-title":"IEEE Trans. Microwave Theory Tech"},{"key":"ref_8","doi-asserted-by":"crossref","first-page":"164","DOI":"10.1109\/7260.916331","article-title":"Electric field mapping system using an optical-fiber-based electro optic probe","volume":"11","author":"Yang","year":"2001","journal-title":"IEEE Microw. Wireless Compon. Lett"},{"key":"ref_9","doi-asserted-by":"crossref","first-page":"436","DOI":"10.1093\/ietele\/e90-c.2.436","article-title":"Near-field mapping system using fiber-based electro-optic probe for specific absorption rate measurement","volume":"E90\u2013C","author":"Togo","year":"2007","journal-title":"IEICE Trans. Electron"},{"key":"ref_10","doi-asserted-by":"crossref","first-page":"115301","DOI":"10.1088\/0957-0233\/19\/11\/115301","article-title":"Electro-optic probing of microwave fields using a wavelength-tunable modulation depth","volume":"19","author":"Lee","year":"2008","journal-title":"IOP Meas. Sci. Tech"},{"key":"ref_11","doi-asserted-by":"crossref","first-page":"486","DOI":"10.1063\/1.127019","article-title":"Electro-optic field mapping system utilizing external gallium arsenide probes","volume":"77","author":"Yang","year":"2000","journal-title":"Appl. Phys. Lett"},{"key":"ref_12","doi-asserted-by":"crossref","first-page":"849","DOI":"10.1109\/22.920140","article-title":"Active-amplifier-array diagnostics using high-resolution electrooptic field mapping","volume":"49","author":"Yang","year":"2001","journal-title":"IEEE Trans. Microwave Theory Tech"},{"key":"ref_13","doi-asserted-by":"crossref","first-page":"111","DOI":"10.1016\/j.optlastec.2004.10.009","article-title":"Electro-optic mapping systems of electric-field using CW laser diodes","volume":"38","author":"Kuo","year":"2006","journal-title":"Opt. Laser Technol"},{"key":"ref_14","doi-asserted-by":"crossref","first-page":"2782","DOI":"10.1109\/TMTT.2007.909889","article-title":"Live electrooptic imaging system based on ultraparallel photonic heterodyne for microwave near-fields","volume":"55","author":"Sasagawa","year":"2007","journal-title":"IEEE Trans. Microwave Theory Tech"},{"key":"ref_15","doi-asserted-by":"crossref","first-page":"12239","DOI":"10.1364\/OE.18.012239","article-title":"An optically-interrogated microwave-poynting-vector sensor using cadmium manganese telluride","volume":"18","author":"Chen","year":"2010","journal-title":"Opt. Express"},{"key":"ref_16","doi-asserted-by":"crossref","first-page":"1290","DOI":"10.1109\/LPT.2006.876755","article-title":"Fiber-based probe for electrooptic sampling","volume":"18","author":"Chandani","year":"2006","journal-title":"IEEE Photon. Technol. Lett"},{"key":"ref_17","doi-asserted-by":"crossref","first-page":"318","DOI":"10.1364\/JOSAB.27.000318","article-title":"Field-calibrated electro-optic probe using interferometric modulations","volume":"27","author":"Lee","year":"2010","journal-title":"J. Opt. Soc. Am. B"},{"key":"ref_18","doi-asserted-by":"crossref","first-page":"24735","DOI":"10.1364\/OE.18.024735","article-title":"A multi-layer electro-optic field probe","volume":"18","author":"Lee","year":"2010","journal-title":"Opt. Express"},{"key":"ref_19","unstructured":"Yariv, A., and Yeh, P (1984). Optical Waves in Crystals, Wiley. Chapter 8."},{"key":"ref_20","doi-asserted-by":"crossref","first-page":"866","DOI":"10.1109\/LPT.2008.921127","article-title":"A simplified Fabry\u2014P\u00e9rot electrooptic-modulation sensor","volume":"20","author":"Lee","year":"2008","journal-title":"IEEE Phot. Tech. Lett"},{"key":"ref_21","doi-asserted-by":"crossref","first-page":"1948","DOI":"10.1364\/JOSAB.21.001948","article-title":"Electro-optic coefficients of lithium tantalate at near-infrared wavelengths","volume":"21","author":"Casson","year":"2004","journal-title":"J. Opt. Soc. Am. B"},{"key":"ref_22","doi-asserted-by":"crossref","first-page":"498","DOI":"10.1049\/el:19930333","article-title":"Fabry-Perot enhanced real-time electro-optic probing of MMICs","volume":"29","author":"Quang","year":"1993","journal-title":"Electron. Lett"},{"key":"ref_23","doi-asserted-by":"crossref","first-page":"661","DOI":"10.1023\/A:1018540524875","article-title":"Fabry-Perot enhancement electro-optic sampling","volume":"29","author":"Vickers","year":"1997","journal-title":"Opt. Quantum Electron"},{"key":"ref_24","doi-asserted-by":"crossref","first-page":"7","DOI":"10.1109\/3.737612","article-title":"An external electrooptic sampling technique based on the Fabry-Perot effect","volume":"35","author":"Mueller","year":"1999","journal-title":"IEEE J. Quantum Electron"},{"key":"ref_25","doi-asserted-by":"crossref","first-page":"202103:1","DOI":"10.1063\/1.1926424","article-title":"Electro-optic effect in an unbalanced AlGaAs\/GaAs microresonator","volume":"86","author":"Mitrofanov","year":"2005","journal-title":"Appl. Phys. Lett"},{"key":"ref_26","first-page":"091118:1","article-title":"Terahertz near-field electro-optic probe based on a microresonator","volume":"88","author":"Mitrofanov","year":"2006","journal-title":"Appl. Phys. Lett"},{"key":"ref_27","first-page":"355","article-title":"An electrooptic sensor with sub-millivolt sensitivity using a nonlinear optical disk resonator","volume":"12","author":"Sasagawa","year":"2005","journal-title":"Microwave Phot"},{"key":"ref_28","doi-asserted-by":"crossref","first-page":"053107:1","DOI":"10.1063\/1.3429950","article-title":"A Fabry\u2014P\u00e9rot electro-optic sensing system using a drive-current-tuned wavelength laser diode","volume":"81","author":"Kuo","year":"2010","journal-title":"Rev. Sci. Instrum"},{"key":"ref_29","doi-asserted-by":"crossref","first-page":"1308","DOI":"10.1002\/mop.24301","article-title":"Analysis of optical and terahertz multilayer systems using microwave and feedback theory","volume":"51","author":"Lee","year":"2009","journal-title":"Microwave Opt. Tech. Lett"},{"key":"ref_30","doi-asserted-by":"crossref","first-page":"2527","DOI":"10.1364\/AO.42.002526","article-title":"Laser excess noise reduction in optical phase-shift measurements","volume":"42","author":"Mitrofanov","year":"2003","journal-title":"Appl. Opt"},{"key":"ref_31","unstructured":"Mitani, S., Yamazaki, E., Kishi, M., and Tsuchiya, M. (2003, January 10\u201312). EDFA-enhanced sensitivity of RF magneto-optical probe. Budapest, Hungary."},{"key":"ref_32","doi-asserted-by":"crossref","first-page":"3292","DOI":"10.1109\/JLT.2003.819794","article-title":"Performance evaluation of fiber-edge magnetooptic probe","volume":"21","author":"Wakana","year":"2003","journal-title":"J. Lightwave Technol"},{"key":"ref_33","unstructured":"Sasagawa, K., Tsuchiya, M., and Izutsu, M. (2005, January 22\u201327). Sensitivity enhancement of electrooptic probing based on photonic downconversion by sideband management. Baltimore, MD, USA."},{"key":"ref_34","doi-asserted-by":"crossref","first-page":"1357","DOI":"10.1049\/el:20062557","article-title":"Modulation depth enhancement for highly sensitive electro-optic RF near-field measurement","volume":"42","author":"Sasagawa","year":"2006","journal-title":"Electron. Lett"},{"key":"ref_35","doi-asserted-by":"crossref","first-page":"1583","DOI":"10.1364\/AO.48.001583","article-title":"Optimization of sideband modulation in optical-heterodyne-down-mixed electro-optic sensing","volume":"48","author":"Lee","year":"2009","journal-title":"Appl. Opt"},{"key":"ref_36","doi-asserted-by":"crossref","first-page":"399","DOI":"10.1088\/0031-9155\/46\/2\/309","article-title":"Calibrated electro-optic E-field sensors for hyperthermia applications","volume":"46","author":"Berger","year":"2001","journal-title":"Phys. Med. Biol"},{"key":"ref_37","doi-asserted-by":"crossref","first-page":"1109","DOI":"10.1109\/TIM.2008.2008592","article-title":"Characterization method of electric field probe by using transfer standard in GTEM cell","volume":"58","author":"Kang","year":"2009","journal-title":"IEEE Trans. Instrum. Meas"},{"key":"ref_38","doi-asserted-by":"crossref","first-page":"189","DOI":"10.1109\/TEMC.1974.303364","article-title":"Generation of standard electromagnetic fields using TEM transmission cells","volume":"16","author":"Crawford","year":"1974","journal-title":"IEEE Trans. Electromag. Compat"},{"key":"ref_39","doi-asserted-by":"crossref","first-page":"2644","DOI":"10.1109\/22.809019","article-title":"Terahertz imaging via electrooptic effect","volume":"47","author":"Jiang","year":"1999","journal-title":"IEEE Trans. Microwave Theory"},{"key":"ref_40","doi-asserted-by":"crossref","first-page":"221113:1","DOI":"10.1063\/1.3152792","article-title":"Optimal electro-optic sensor configuration for phase noise limited, remote field sensing applications","volume":"94","author":"Garzarella","year":"2009","journal-title":"Appl. Phys. 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