{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,18]],"date-time":"2026-03-18T18:30:54Z","timestamp":1773858654561,"version":"3.50.1"},"reference-count":16,"publisher":"MDPI AG","issue":"5","license":[{"start":{"date-parts":[[2011,4,27]],"date-time":"2011-04-27T00:00:00Z","timestamp":1303862400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Generally, AT-cut quartz crystals have a limited scope of use when it comes to high-precision measurement of very small impedance changes due to their nonlinear frequency-temperature characteristics in the range between 0 \u00b0C and 50 \u00b0C. The new method improving quartz oscillator frequency-temperature characteristic compensation is switching between two impedance loads. By modifying the oscillator circuit with two logic switches and two impedance loads, the oscillator can switch oscillation between two resonance frequencies. The difference in resonance frequencies compensates the frequency-temperature characteristics influence as well as the influence of offset and quartz crystal ageing. The experimental results show that the new approach using the switching method highly improves second-to-second frequency stability from \u00b10.125 Hz to \u00b10.00001 Hz and minute-to-minute frequency stability from 0.1 Hz to 0.0001 Hz, which makes the high-precision measurement of aF and fH changes possible.<\/jats:p>","DOI":"10.3390\/s110504474","type":"journal-article","created":{"date-parts":[[2011,4,27]],"date-time":"2011-04-27T11:24:04Z","timestamp":1303903444000},"page":"4474-4482","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":72,"title":["Next Generation AT-Cut Quartz Crystal Sensing Devices"],"prefix":"10.3390","volume":"11","author":[{"given":"Vojko","family":"Matko","sequence":"first","affiliation":[{"name":"Faculty of Electrical Engineering and Computer Science, University of Maribor, Smetanova 17, 2000 Maribor, Slovenia"}]}],"member":"1968","published-online":{"date-parts":[[2011,4,27]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"3954","DOI":"10.3390\/s100403954","article-title":"Greatly Improved Small Inductance Measurement Using Quartz Crystal Parasitic Capacitance Compensation","volume":"10","author":"Matko","year":"2010","journal-title":"Sensors"},{"key":"ref_2","doi-asserted-by":"crossref","first-page":"8263","DOI":"10.3390\/s91008263","article-title":"Major Improvements of Quartz Crystal Pulling Sensitivity and Linearity Using Series Reactance","volume":"9","author":"Matko","year":"2009","journal-title":"Sensors"},{"key":"ref_3","doi-asserted-by":"crossref","first-page":"746","DOI":"10.3390\/s6070746","article-title":"Comparison of Frequency Pullability in Oscillators Using a Single AT-Cut Quartz Crystal and Those Using Two Single AT Cut Crystals Connected in Parallel with a Series Load Capacitance or Series Load Inductance","volume":"6","author":"Matko","year":"2006","journal-title":"Sensors"},{"key":"ref_4","doi-asserted-by":"crossref","unstructured":"Webster, JG (1999). The Measurement, Instrumentation, and Sensors, Capacitance Measurement, Inductance Measurement, CRC Press.","DOI":"10.1201\/9781003040019"},{"key":"ref_5","unstructured":"Available online: http:\/\/www.thinksrs.com\/downloads\/PDFs\/ApplicationNotes\/QCMTheoryapp.pdf (accessed on 28 September 2009)."},{"key":"ref_6","unstructured":"(2008). Specification of HM8122, Hameg Instruments."},{"key":"ref_7","first-page":"952","article-title":"Characterization of Frequency Stability in Precision Frequency Sources","volume":"79","author":"Rutman","year":"1991","journal-title":"IEEE Trans. Instrum. Meas"},{"key":"ref_8","unstructured":"Available online: http:\/\/www.atmel.com\/dyn\/resources\/prod_documents\/doc4363.pdf (accessed on 28 September 2009)."},{"key":"ref_9","unstructured":"(2001). Oscillator Start-Up Time, Application Note AN97090; Philips Electronics."},{"key":"ref_10","unstructured":"Schr\u00fcfer, E (1992). 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