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The simulation procedure guides the designer in choosing the Hall cell optimum shape, dimensions and device polarization conditions that would allow the highest performance.<\/jats:p>","DOI":"10.3390\/s130202093","type":"journal-article","created":{"date-parts":[[2013,2,5]],"date-time":"2013-02-05T11:11:11Z","timestamp":1360062671000},"page":"2093-2112","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":41,"title":["Comparative Study on the Performance of Five Different  Hall Effect Devices"],"prefix":"10.3390","volume":"13","author":[{"given":"Maria-Alexandra","family":"Paun","sequence":"first","affiliation":[{"name":"STI-IEL-Electronics Laboratory, Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jean-Michel","family":"Sallese","sequence":"additional","affiliation":[{"name":"STI-IEL-Electronics Laboratory, Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Maher","family":"Kayal","sequence":"additional","affiliation":[{"name":"STI-IEL-Electronics Laboratory, Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2013,2,5]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Ramsden, E. 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Design"},{"key":"ref_14","unstructured":"Synopsys TCAD tools Available online: http:\/\/www.synopsys.com\/Tools\/TCAD (accessed on 25 January 2013)."},{"key":"ref_15","unstructured":"Jovanovic, E., Pesic, T., and Pantic, D. (2004, January 6\u201319). 3D simulation of cross-shaped hall sensor and its equivalent circuit model. Nis, Serbia and Montenegro."},{"key":"ref_16","doi-asserted-by":"crossref","unstructured":"Paun, M.A., Sallese, J.M., and Kayal, M. (2012, January 28\u201331). Temperature influence investigation on Hall effect sensors performance using a lumped circuit model. 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