{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,13]],"date-time":"2026-04-13T10:25:06Z","timestamp":1776075906037,"version":"3.50.1"},"reference-count":77,"publisher":"MDPI AG","issue":"3","license":[{"start":{"date-parts":[[2013,3,11]],"date-time":"2013-03-11T00:00:00Z","timestamp":1362960000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>We have developed a real-time terahertz time-domain polarization analyzer by using 80-MHz repetition-rate femtosecond laser pulses. Our technique is based on the spinning electro-optic sensor method, which we recently proposed and demonstrated by using a regenerative amplifier laser system; here we improve the detection scheme in order to be able to use it with a femtosecond laser oscillator with laser pulses of a much higher repetition rate. This improvement brings great advantages for realizing broadband, compact and stable real-time terahertz time-domain polarization measurement systems for scientific and industrial applications.<\/jats:p>","DOI":"10.3390\/s130303299","type":"journal-article","created":{"date-parts":[[2013,3,11]],"date-time":"2013-03-11T12:14:24Z","timestamp":1363004064000},"page":"3299-3312","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":13,"title":["A Real-Time Terahertz Time-Domain Polarization Analyzer with 80-MHz Repetition-Rate Femtosecond Laser Pulses"],"prefix":"10.3390","volume":"13","author":[{"given":"Shinichi","family":"Watanabe","sequence":"first","affiliation":[{"name":"Department of Physics, Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, Kanagawa 223-8522, Japan"}]},{"given":"Naoya","family":"Yasumatsu","sequence":"additional","affiliation":[{"name":"Department of Physics, Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, Kanagawa 223-8522, Japan"}]},{"given":"Kenichi","family":"Oguchi","sequence":"additional","affiliation":[{"name":"Department of Physics, Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, Kanagawa 223-8522, Japan"}]},{"given":"Masatoshi","family":"Takeda","sequence":"additional","affiliation":[{"name":"Department of Physics, Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, Kanagawa 223-8522, Japan"}]},{"given":"Takeshi","family":"Suzuki","sequence":"additional","affiliation":[{"name":"Department of Physics, Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, Kanagawa 223-8522, Japan"}]},{"given":"Takehiro","family":"Tachizaki","sequence":"additional","affiliation":[{"name":"Department of Physics, Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, Kanagawa 223-8522, Japan"}]}],"member":"1968","published-online":{"date-parts":[[2013,3,11]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"220","DOI":"10.1364\/AO.14.000220","article-title":"High precision scanning ellipsometer","volume":"14","author":"Aspnes","year":"1975","journal-title":"Appl. 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