{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,12]],"date-time":"2025-10-12T04:33:24Z","timestamp":1760243604562,"version":"build-2065373602"},"reference-count":31,"publisher":"MDPI AG","issue":"9","license":[{"start":{"date-parts":[[2013,9,2]],"date-time":"2013-09-02T00:00:00Z","timestamp":1378080000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Based on the core hysteresis features, the RTD-fluxgate core, while working, is repeatedly saturated with excitation field. When the fluxgate simulates, the accurate characteristic model of the core may provide a precise simulation result. As the shape of the ideal hysteresis loop model is fixed, it cannot accurately reflect the actual dynamic changing rules of the hysteresis loop. In order to improve the fluxgate simulation accuracy, a dynamic hysteresis loop model containing the parameters which have actual physical meanings is proposed based on the changing rule of the permeability parameter when the fluxgate is working. Compared with the ideal hysteresis loop model, this model has considered the dynamic features of the hysteresis loop, which makes the simulation results closer to the actual output. In addition, other hysteresis loops of different magnetic materials can be explained utilizing the described model for an example of amorphous magnetic material in this manuscript. The model has been validated by the output response comparison between experiment results and fitting results using the model.<\/jats:p>","DOI":"10.3390\/s130911539","type":"journal-article","created":{"date-parts":[[2013,9,2]],"date-time":"2013-09-02T11:38:05Z","timestamp":1378121885000},"page":"11539-11552","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":14,"title":["Research on the Dynamic Hysteresis Loop Model of the Residence Times Difference (RTD)-Fluxgate"],"prefix":"10.3390","volume":"13","author":[{"given":"Yanzhang","family":"Wang","sequence":"first","affiliation":[{"name":"College of Instrumentation & Electrical Engineering, Jilin University, No.938 Ximinzhu Street, Changchun 130026, China"},{"name":"Key Laboratory of Geo-Exploration Instrumentation, Ministry of Education, Jilin University, No.938 Ximinzhu Street, Changchun 130026, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shujun","family":"Wu","sequence":"additional","affiliation":[{"name":"College of Instrumentation & Electrical Engineering, Jilin University, No.938 Ximinzhu Street, Changchun 130026, China"},{"name":"Key Laboratory of Geo-Exploration Instrumentation, Ministry of Education, Jilin University, No.938 Ximinzhu Street, Changchun 130026, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhijian","family":"Zhou","sequence":"additional","affiliation":[{"name":"College of Instrumentation & Electrical Engineering, Jilin University, No.938 Ximinzhu Street, Changchun 130026, China"},{"name":"Key Laboratory of Geo-Exploration Instrumentation, Ministry of Education, Jilin University, No.938 Ximinzhu Street, Changchun 130026, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Defu","family":"Cheng","sequence":"additional","affiliation":[{"name":"College of Instrumentation & Electrical Engineering, Jilin University, No.938 Ximinzhu Street, Changchun 130026, China"},{"name":"Key Laboratory of Geo-Exploration Instrumentation, Ministry of Education, Jilin University, No.938 Ximinzhu Street, Changchun 130026, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Na","family":"Pang","sequence":"additional","affiliation":[{"name":"College of Instrumentation & Electrical Engineering, Jilin University, No.938 Ximinzhu Street, Changchun 130026, China"},{"name":"Key Laboratory of Geo-Exploration Instrumentation, Ministry of Education, Jilin University, No.938 Ximinzhu Street, Changchun 130026, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yunxia","family":"Wan","sequence":"additional","affiliation":[{"name":"College of Instrumentation & Electrical Engineering, Jilin University, No.938 Ximinzhu Street, Changchun 130026, China"},{"name":"Key Laboratory of Geo-Exploration Instrumentation, Ministry of Education, Jilin University, No.938 Ximinzhu Street, Changchun 130026, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2013,9,2]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"4018","DOI":"10.1109\/TMAG.2008.2001587","article-title":"Tube-core orthogonal fluxgate operated in fundamental mode","volume":"44","author":"Paperno","year":"2008","journal-title":"IEEE Trans. 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