{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,2]],"date-time":"2025-12-02T22:32:14Z","timestamp":1764714734275,"version":"build-2065373602"},"reference-count":23,"publisher":"MDPI AG","issue":"11","license":[{"start":{"date-parts":[[2015,11,6]],"date-time":"2015-11-06T00:00:00Z","timestamp":1446768000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61234003","61274021"],"award-info":[{"award-number":["61234003","61274021"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>This paper presents a dynamic range (DR) enhanced readout technique with a  two-step time-to-digital converter (TDC) for high speed linear CMOS image sensors. A  multi-capacitor and self-regulated capacitive trans-impedance amplifier (CTIA) structure is employed to extend the dynamic range. The gain of the CTIA is auto adjusted by switching different capacitors to the integration node asynchronously according to the output voltage. A column-parallel ADC based on a two-step TDC is utilized to improve the conversion rate. The conversion is divided into coarse phase and fine phase. An error calibration scheme  is also proposed to correct quantization errors caused by propagation delay skew within \u2212Tclk~+Tclk. A linear CMOS image sensor pixel array is designed in the 0.13 \u03bcm CMOS process to verify this DR-enhanced high speed readout technique. The post simulation  results indicate that the dynamic range of readout circuit is 99.02 dB and the ADC achieves 60.22 dB SNDR and 9.71 bit ENOB at a conversion rate of 2 MS\/s after calibration,  with 14.04 dB and 2.4 bit improvement, compared with SNDR and ENOB of that  without calibration.<\/jats:p>","DOI":"10.3390\/s151128224","type":"journal-article","created":{"date-parts":[[2015,11,6]],"date-time":"2015-11-06T11:12:15Z","timestamp":1446808335000},"page":"28224-28243","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":9,"title":["A Dynamic Range Enhanced Readout Technique with a  Two-Step TDC for High Speed Linear CMOS Image Sensors"],"prefix":"10.3390","volume":"15","author":[{"given":"Zhiyuan","family":"Gao","sequence":"first","affiliation":[{"name":"School of Electronic Information Engineering, Tianjin University, 92 Weijin Road, Nankai District, Tianjin 300072, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Congjie","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Electronic Information Engineering, Tianjin University, 92 Weijin Road, Nankai District, Tianjin 300072, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiangtao","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Electronic Information Engineering, Tianjin University, 92 Weijin Road, Nankai District, Tianjin 300072, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kaiming","family":"Nie","sequence":"additional","affiliation":[{"name":"School of Electronic Information Engineering, Tianjin University, 92 Weijin Road, Nankai District, Tianjin 300072, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2015,11,6]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"650","DOI":"10.1016\/j.image.2012.02.001","article-title":"Ghost detection and removal for high dynamic range images: Recent advances","volume":"27","author":"Srikantha","year":"2012","journal-title":"Signal Process. 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