{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,8]],"date-time":"2025-11-08T17:41:24Z","timestamp":1762623684845,"version":"build-2065373602"},"reference-count":8,"publisher":"MDPI AG","issue":"11","license":[{"start":{"date-parts":[[2015,11,13]],"date-time":"2015-11-13T00:00:00Z","timestamp":1447372800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>With its unique structure, the Akiyama probe is a type of tuning fork atomic force microscope probe. The long, soft cantilever makes it possible to measure soft samples in tapping mode. In this article, some characteristics of the probe at its second eigenmode are revealed by use of finite element analysis (FEA) and experiments in a standard atmosphere. Although the signal-to-noise ratio in this environment is not good enough, the 2 nm resolution and 0.09 Hz\/nm sensitivity prove that the Akiyama probe can be used at its second eigenmode under FM non-contact mode or low amplitude FM tapping mode, which means that it is easy to change the measuring method from normal tapping to small amplitude tapping or non-contact mode with the same probe and equipment.<\/jats:p>","DOI":"10.3390\/s151128764","type":"journal-article","created":{"date-parts":[[2015,11,13]],"date-time":"2015-11-13T03:52:35Z","timestamp":1447386755000},"page":"28764-28771","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":10,"title":["A Unique Self-Sensing, Self-Actuating AFM Probe at Higher Eigenmodes"],"prefix":"10.3390","volume":"15","author":[{"given":"Zhichao","family":"Wu","sequence":"first","affiliation":[{"name":"State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tong","family":"Guo","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ran","family":"Tao","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Leihua","family":"Liu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jinping","family":"Chen","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xing","family":"Fu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaotang","family":"Hu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2015,11,13]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"1434","DOI":"10.1126\/science.1238187","article-title":"Direct Imaging of Covalent Bond Structure in Single-Molecule Chemical Reactions","volume":"340","author":"Gorman","year":"2013","journal-title":"Science"},{"key":"ref_2","unstructured":"Zhao, J. (2011). Study on Development of Self-Sensing AFM Head and Hybrid Measurement System. [Ph.D. Thesis, Tianjin University]."},{"key":"ref_3","doi-asserted-by":"crossref","first-page":"267","DOI":"10.1016\/j.sna.2011.01.029","article-title":"Metrological atomic force microscope with self-sensing measuring head","volume":"167","author":"Zhao","year":"2011","journal-title":"Sens. Actuators A"},{"key":"ref_4","doi-asserted-by":"crossref","first-page":"175","DOI":"10.3390\/s120100175","article-title":"Development of a Hybrid Atomic Force Microscopic Measurement System Combined with White Light Scanning Interferometry","volume":"12","author":"Guo","year":"2012","journal-title":"Sensors"},{"key":"ref_5","doi-asserted-by":"crossref","first-page":"1018","DOI":"10.1016\/j.mee.2008.01.100","article-title":"Dynamic behavior of the tuning fork AFM probe","volume":"85","author":"Bayat","year":"2008","journal-title":"Microelectron. Eng."},{"key":"ref_6","doi-asserted-by":"crossref","unstructured":"Akiyama, T., de Rooij, N.F., Staufer, U., Detterbeck, M., Braendlin, D., Waldmeier, S., and Scheidiger, M. (2010). Implementation and characterization of a quartz tuning fork based probe consisted of discrete resonators for dynamic mode atomic force microscopy. Rev. Sci. Instrum., 81.","DOI":"10.1063\/1.3455219"},{"key":"ref_7","doi-asserted-by":"crossref","unstructured":"Lozano, J.R., Kiracofe, D., Melcher, J., Garcia, R., and Raman, A. (2010). Calibration of higher eigenmode spring constants of atomic force microscope cantilevers. Nanotechnology, 21.","DOI":"10.1088\/0957-4484\/21\/46\/465502"},{"key":"ref_8","doi-asserted-by":"crossref","unstructured":"Frentrup, H., and Allen, M.S. (2011). Error in dynamic spring constant calibration of atomic force microscope probes due to nonuniform cantilevers. Nanotechnology, 22.","DOI":"10.1088\/0957-4484\/22\/29\/295703"}],"container-title":["Sensors"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/1424-8220\/15\/11\/28764\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T20:52:02Z","timestamp":1760215922000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/1424-8220\/15\/11\/28764"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,11,13]]},"references-count":8,"journal-issue":{"issue":"11","published-online":{"date-parts":[[2015,11]]}},"alternative-id":["s151128764"],"URL":"https:\/\/doi.org\/10.3390\/s151128764","relation":{},"ISSN":["1424-8220"],"issn-type":[{"type":"electronic","value":"1424-8220"}],"subject":[],"published":{"date-parts":[[2015,11,13]]}}}