{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,12]],"date-time":"2025-10-12T04:26:40Z","timestamp":1760243200958,"version":"build-2065373602"},"reference-count":21,"publisher":"MDPI AG","issue":"1","license":[{"start":{"date-parts":[[2015,12,26]],"date-time":"2015-12-26T00:00:00Z","timestamp":1451088000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>This paper presents a fast multiple sampling method for low-noise CMOS image sensor (CIS) applications with column-parallel successive approximation register analog-to-digital converters (SAR ADCs). The 12-bit SAR ADC using the proposed multiple sampling method decreases the A\/D conversion time by repeatedly converting a pixel output to 4-bit after the first 12-bit A\/D conversion, reducing noise of the CIS by one over the square root of the number of samplings. The area of the 12-bit SAR ADC is reduced by using a 10-bit capacitor digital-to-analog converter (DAC) with four scaled reference voltages. In addition, a simple up\/down counter-based digital processing logic is proposed to perform complex calculations for multiple sampling and digital correlated double sampling. To verify the proposed multiple sampling method, a 256 \u00d7 128 pixel array CIS with 12-bit SAR ADCs was fabricated using 0.18 \u03bcm CMOS process. The measurement results shows that the proposed multiple sampling method reduces each A\/D conversion time from 1.2 \u03bcs to 0.45 \u03bcs and random noise from 848.3 \u03bcV to 270.4 \u03bcV, achieving a dynamic range of 68.1 dB and an SNR of 39.2 dB.<\/jats:p>","DOI":"10.3390\/s16010027","type":"journal-article","created":{"date-parts":[[2015,12,28]],"date-time":"2015-12-28T04:23:49Z","timestamp":1451276629000},"page":"27","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":8,"title":["A Fast Multiple Sampling Method for Low-Noise CMOS Image Sensors With Column-Parallel 12-bit SAR ADCs"],"prefix":"10.3390","volume":"16","author":[{"given":"Min-Kyu","family":"Kim","sequence":"first","affiliation":[{"name":"Department of Electronics and Computer Engineering, Hanyang University, Seoul 133-791, Korea"}]},{"given":"Seong-Kwan","family":"Hong","sequence":"additional","affiliation":[{"name":"Department of Electronics and Computer Engineering, Hanyang University, Seoul 133-791, Korea"}]},{"given":"Oh-Kyong","family":"Kwon","sequence":"additional","affiliation":[{"name":"Department of Electronics and Computer Engineering, Hanyang University, Seoul 133-791, Korea"}]}],"member":"1968","published-online":{"date-parts":[[2015,12,26]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"185","DOI":"10.1109\/TED.2003.822224","article-title":"Noise analysis of high-gain, low-noise column readout circuits for CMOS image sensors","volume":"51","author":"Kawai","year":"2004","journal-title":"IEEE Trans. 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