{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,7]],"date-time":"2026-04-07T04:32:02Z","timestamp":1775536322962,"version":"3.50.1"},"reference-count":25,"publisher":"MDPI AG","issue":"2","license":[{"start":{"date-parts":[[2016,2,19]],"date-time":"2016-02-19T00:00:00Z","timestamp":1455840000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>In this paper, a microelectromechanical system (MEMS) cantilever sensor was designed, modeled and fabricated to measure the terahertz (THz) radiation induced photoacoustic (PA) response of gases under low vacuum conditions. This work vastly improves cantilever sensitivity over previous efforts, by reducing internal beam stresses, minimizing out of plane beam curvature and optimizing beam damping. In addition, fabrication yield was improved by approximately 50% by filleting the cantilever\u2019s anchor and free end to help reduce high stress areas that occurred during device fabrication and processing. All of the cantilever sensors were fabricated using silicon-on-insulator (SOI) wafers and tested in a custom built, low-volume, vacuum chamber. The resulting cantilever sensors exhibited improved signal to noise ratios, sensitivities and normalized noise equivalent absorption (NNEA) coefficients of approximately 4.28 \u00d7 10\u221210 cm\u22121\u00b7WHz\u22121\/2. This reported NNEA represents approximately a 70% improvement over previously fabricated and tested SOI cantilever sensors for THz PA spectroscopy.<\/jats:p>","DOI":"10.3390\/s16020251","type":"journal-article","created":{"date-parts":[[2016,2,19]],"date-time":"2016-02-19T11:29:39Z","timestamp":1455881379000},"page":"251","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":19,"title":["Improved Sensitivity MEMS Cantilever Sensor for Terahertz Photoacoustic Spectroscopy"],"prefix":"10.3390","volume":"16","author":[{"given":"Ronald","family":"Coutu","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, Air Force Institute of Technology, 2950 Hobson Way, Wright-Patterson AFB, Dayton, OH 45433, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1671-1264","authenticated-orcid":false,"given":"Ivan","family":"Medvedev","sequence":"additional","affiliation":[{"name":"Department of Physics, Wright State University, 3640 Colonel Glenn Highway, Dayton, OH 45435, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Douglas","family":"Petkie","sequence":"additional","affiliation":[{"name":"Department of Physics, Wright State University, 3640 Colonel Glenn Highway, Dayton, OH 45435, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2016,2,19]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"797","DOI":"10.1063\/1.1137483","article-title":"Photoacoustic spectroscopy","volume":"54","author":"West","year":"1983","journal-title":"Rev. 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