{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,26]],"date-time":"2026-02-26T13:07:51Z","timestamp":1772111271490,"version":"3.50.1"},"reference-count":20,"publisher":"MDPI AG","issue":"5","license":[{"start":{"date-parts":[[2016,4,28]],"date-time":"2016-04-28T00:00:00Z","timestamp":1461801600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Depleted field effect transistors (DEPFET) are used to achieve very low noise signal charge readout with sub-electron measurement precision. This is accomplished by repeatedly reading an identical charge, thereby suppressing not only the white serial noise but also the usually constant 1\/f noise. The repetitive non-destructive readout (RNDR) DEPFET is an ideal central element for an active pixel sensor (APS) pixel. The theory has been derived thoroughly and results have been verified on RNDR-DEPFET prototypes. A charge measurement precision of 0.18 electrons has been achieved. The device is well-suited for spectroscopic X-ray imaging and for optical photon counting in pixel sensors, even at high photon numbers in the same cell.<\/jats:p>","DOI":"10.3390\/s16050608","type":"journal-article","created":{"date-parts":[[2016,4,28]],"date-time":"2016-04-28T10:25:55Z","timestamp":1461839155000},"page":"608","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":13,"title":["The DEPFET Sensor-Amplifier Structure: A Method to Beat 1\/f Noise and Reach Sub-Electron Noise in Pixel Detectors"],"prefix":"10.3390","volume":"16","author":[{"given":"Gerhard","family":"Lutz","sequence":"first","affiliation":[{"name":"PNSENSOR GmbH, M\u00fcnchen D-81739, Germany"}]},{"given":"Matteo","family":"Porro","sequence":"additional","affiliation":[{"name":"European X-ray Free-Electron Laser Facility GmbH, Hamburg D-22761, Germany"}]},{"given":"Stefan","family":"Aschauer","sequence":"additional","affiliation":[{"name":"PNSENSOR GmbH, M\u00fcnchen D-81739, Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2873-7050","authenticated-orcid":false,"given":"Stefan","family":"W\u00f6lfel","sequence":"additional","affiliation":[{"name":"Gr\u00fcndel\u00e4ckerstr. 28, Dormitz D-91077, Germany"}]},{"given":"Lothar","family":"Str\u00fcder","sequence":"additional","affiliation":[{"name":"PNSENSOR GmbH, M\u00fcnchen D-81739, Germany"},{"name":"Experimental Physics, University of Siegen, Walter-Flex-Str. 3, Siegen D-87068, Germany"}]}],"member":"1968","published-online":{"date-parts":[[2016,4,28]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"216","DOI":"10.1016\/S0168-9002(99)00919-5","article-title":"The quantum efficiency of pn-detectors from the near infrared to the soft X-ray region","volume":"439","author":"Hartmann","year":"2000","journal-title":"Nucl. 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SPIE, 7021.","DOI":"10.1117\/12.787839"},{"key":"ref_5","doi-asserted-by":"crossref","first-page":"608","DOI":"10.1016\/0167-5087(84)90113-3","article-title":"Semiconductor drift chamber\u2014An application of a novel charge transport scheme","volume":"225","author":"Gatti","year":"1984","journal-title":"Nucl. Instrum. Methods Phys. Res. Sect. A"},{"key":"ref_6","doi-asserted-by":"crossref","first-page":"378","DOI":"10.1016\/0168-9002(87)90519-5","article-title":"Low capacitive drift diode","volume":"253","author":"Kemmer","year":"1987","journal-title":"Nucl. Instr. Meth. A"},{"key":"ref_7","unstructured":"Lutz, G. (2013). Halbleiterdetektor Mit Einem Zwischenspeicher f\u00fcr Signalladungstr\u00e4ger und Entsprechendes Betriebsverfahren. (102011115656 A1), DE Patent, (In Germay)."},{"key":"ref_8","doi-asserted-by":"crossref","first-page":"1311","DOI":"10.1109\/TNS.2007.901225","article-title":"A Novel Way of Single Optical Photon Detection: Beating the 1\/f Noise Limit with Ultra High Resolution DEPFET-RNDR Devices","volume":"54","author":"Herrmann","year":"2007","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"ref_9","unstructured":"Porro, M., Herrmann, S., and H\u00f6rnel, N. (November, January 26). Multi correlated double sampling with exponential reset. Nuclear Science Symposium Conference Record, Proceedings of the IEEE NSS\u201907, Honolulu, HI, USA."},{"key":"ref_10","doi-asserted-by":"crossref","first-page":"351","DOI":"10.1016\/j.nima.2009.10.040","article-title":"ASTEROID: A 64 channel ASIC for source follower readout of DEPFET arrays for X-ray astronomy","volume":"617","author":"Porro","year":"2010","journal-title":"Nucl. Instr. Meth. Phys. Res. Sect. A"},{"key":"ref_11","doi-asserted-by":"crossref","first-page":"446","DOI":"10.1109\/TNS.2012.2228410","article-title":"VERITAS: A 128-channel ASIC for the readout of pnCCDs and DEPFET arrays for X-ray imaging, spectroscopy and XFEL applications","volume":"60","author":"Porro","year":"2013","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"ref_12","doi-asserted-by":"crossref","first-page":"536","DOI":"10.1016\/j.nima.2006.06.060","article-title":"Sub-electron noise measurements on repetitive non-destructive readout devices","volume":"566","author":"Herrmann","year":"2006","journal-title":"Nucl. Instr. Meth. Phys. Res. Sect. A"},{"key":"ref_13","doi-asserted-by":"crossref","first-page":"467","DOI":"10.1016\/0168-9002(90)91331-5","article-title":"Suboptimal filtering of 1\/\u0192-noise in detector charge measurements","volume":"297","author":"Gatti","year":"1990","journal-title":"Nucl. Instr. Meth. Phys. Res. Sect. A"},{"key":"ref_14","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1007\/BF02822156","article-title":"Processing the signals from solid-state-detector in elementary particle physics","volume":"9","author":"Gatti","year":"1986","journal-title":"Riv. Nuovo Cimento"},{"key":"ref_15","doi-asserted-by":"crossref","first-page":"513","DOI":"10.1016\/0168-9002(90)91571-R","article-title":"Optimum filters for detector charge measurements in presence of 1f noise","volume":"287","author":"Gatti","year":"1990","journal-title":"Nucl. Instr. Meth. Phys. Res. Sect. A"},{"key":"ref_16","doi-asserted-by":"crossref","first-page":"342","DOI":"10.1016\/S0168-9002(98)00700-1","article-title":"Multiple read-out of signals in presence of arbitrary noises Optimum filters","volume":"417","author":"Gatti","year":"1998","journal-title":"Nucl. Instr. Meth. Phys. Res. Sect. A"},{"key":"ref_17","doi-asserted-by":"crossref","first-page":"401","DOI":"10.1109\/TNS.2006.869850","article-title":"Spectroscopic performance of the DePMOS detector\/amplifier device with respect to different filtering techniques and operating conditions","volume":"53","author":"Porro","year":"2006","journal-title":"IEEE Trans Nucl. Sci."},{"key":"ref_18","doi-asserted-by":"crossref","first-page":"540","DOI":"10.1016\/j.nima.2010.03.173","article-title":"MIXS on BepiColombo and its DEPFET based focal plane instrumentation","volume":"624","author":"Treis","year":"2010","journal-title":"Nucl. Instr. Meth. Phys. Res. Sect. A"},{"key":"ref_19","doi-asserted-by":"crossref","first-page":"3339","DOI":"10.1109\/TNS.2012.2217755","article-title":"Development of the DEPFET Sensor with Signal Compression: A Large Format X-ray Imager with Mega-Frame Readout Capability for the European XFEL","volume":"59","author":"Porro","year":"2012","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"ref_20","doi-asserted-by":"crossref","first-page":"528","DOI":"10.1016\/j.nima.2010.03.002","article-title":"DEPFET sensor with intrinsic signal compression developed for use at the XFEL free electron laser radiation source","volume":"624","author":"Lutz","year":"2010","journal-title":"Nucl. Instr. Meth. Phys. Res. Sect. 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