{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,8]],"date-time":"2026-07-08T20:26:00Z","timestamp":1783542360761,"version":"3.55.0"},"reference-count":23,"publisher":"MDPI AG","issue":"5","license":[{"start":{"date-parts":[[2016,5,21]],"date-time":"2016-05-21T00:00:00Z","timestamp":1463788800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"governments of Qu\u00e9bec and Bavaria","award":["13.311"],"award-info":[{"award-number":["13.311"]}]}],"content-domain":{"domain":["www.mdpi.com"],"crossmark-restriction":true},"short-container-title":["Sensors"],"abstract":"<jats:p>In this article, optical excitation thermographic techniques, including pulsed thermography and lock-in thermography, were used to detect foreign object defect (FOD) and delamination in CFRP. Then, vibrothermography as an ultrasonic excitation technique was used to detect these defects for the comparative purposes. Different image processing methods, including cold image subtraction (CIS), principal component thermography (PCT), thermographic signal reconstruction (TSR) and Fourier transform (FT), were performed. Finally, a comparison of optical excitation thermography and vibrothermography was conducted, and a thermographic probability of detection was given.<\/jats:p>","DOI":"10.3390\/s16050743","type":"journal-article","created":{"date-parts":[[2016,5,24]],"date-time":"2016-05-24T09:05:05Z","timestamp":1464080705000},"page":"743","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":50,"title":["Experimental Evaluation of Pulsed Thermography, Lock-in Thermography and Vibrothermography on Foreign Object Defect (FOD) in CFRP"],"prefix":"10.3390","volume":"16","author":[{"given":"Bin","family":"Liu","sequence":"first","affiliation":[{"name":"School of Information Science and Engineering, Shenyang University of Technology, 111 Shenliao West Road, Shenyang 110870, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3025-9999","authenticated-orcid":false,"given":"Hai","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Computer Vision and Systems Laboratory, Laval University, 1065 av. de la M\u00e9decine, Quebec City, QC G1V 0A6, Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7078-9620","authenticated-orcid":false,"given":"Henrique","family":"Fernandes","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Computer Vision and Systems Laboratory, Laval University, 1065 av. de la M\u00e9decine, Quebec City, QC G1V 0A6, Canada"},{"name":"Department of Mechanical Engineering, Federal University of Uberlandia, 2121 Av. 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