{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,27]],"date-time":"2026-03-27T17:13:22Z","timestamp":1774631602594,"version":"3.50.1"},"reference-count":24,"publisher":"MDPI AG","issue":"8","license":[{"start":{"date-parts":[[2016,8,12]],"date-time":"2016-08-12T00:00:00Z","timestamp":1470960000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>The feasibility of using the bio-photonic imaging technique to assess symptoms of circular leaf spot (CLS) disease in Diospyros kaki (persimmon) leaf samples was investigated. Leaf samples were selected from persimmon plantations and were categorized into three groups: healthy leaf samples, infected leaf samples, and healthy-looking leaf samples from infected trees. Visually non-identifiable reduction of the palisade parenchyma cell layer thickness is the main initial symptom, which occurs at the initial stage of the disease. Therefore, we established a non-destructive bio-photonic inspection method using a 1310 nm swept source optical coherence tomography (SS-OCT) system. These results confirm that this method is able to identify morphological differences between healthy leaves from infected trees and leaves from healthy and infected trees. In addition, this method has the potential to generate significant cost savings and good control of CLS disease in persimmon fields.<\/jats:p>","DOI":"10.3390\/s16081282","type":"journal-article","created":{"date-parts":[[2016,8,12]],"date-time":"2016-08-12T10:05:06Z","timestamp":1470996306000},"page":"1282","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":28,"title":["Optical Inspection and Morphological Analysis of Diospyros kaki Plant Leaves for the Detection of Circular Leaf Spot Disease"],"prefix":"10.3390","volume":"16","author":[{"given":"Ruchire","family":"Wijesinghe","sequence":"first","affiliation":[{"name":"School of Electronics Engineering, College of IT Engineering, Kyungpook National University, 80, Daehak-ro, Buk-gu, Daegu 41566, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Seung-Yeol","family":"Lee","sequence":"additional","affiliation":[{"name":"School of Applied Biosciences, Kyungpook National University, 80, Daehak-ro, Buk-gu, Daegu 41566, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pilun","family":"Kim","sequence":"additional","affiliation":[{"name":"OZ Tec, No. 901, IT Convergence Industrial building, 47, Gyeongdae-ro, 17-gil, Buk-gu, Daegu 41566, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hee-Young","family":"Jung","sequence":"additional","affiliation":[{"name":"School of Applied Biosciences, Kyungpook National University, 80, Daehak-ro, Buk-gu, Daegu 41566, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mansik","family":"Jeon","sequence":"additional","affiliation":[{"name":"School of Electronics Engineering, College of IT Engineering, Kyungpook National University, 80, Daehak-ro, Buk-gu, Daegu 41566, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jeehyun","family":"Kim","sequence":"additional","affiliation":[{"name":"School of Electronics Engineering, College of IT Engineering, Kyungpook National University, 80, Daehak-ro, Buk-gu, Daegu 41566, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2016,8,12]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Berbegal, M., P\u00e9rez-Sierra, A., Armengol, J., Park, C., and Garc\u00eda-Jim\u00e9nez, J. 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