{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,4]],"date-time":"2026-06-04T09:28:50Z","timestamp":1780565330820,"version":"3.54.1"},"reference-count":30,"publisher":"MDPI AG","issue":"7","license":[{"start":{"date-parts":[[2017,7,1]],"date-time":"2017-07-01T00:00:00Z","timestamp":1498867200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>In modern high-intensity ultrafast laser processing, detecting the focal position of the working laser beam, at which the intensity is the highest and the beam diameter is the lowest, and immediately locating the target sample at that point are challenging tasks. A system that allows in-situ real-time focus determination and fabrication using a high-power laser has been in high demand among both engineers and scientists. Conventional techniques require the complicated mathematical theory of wave optics, employing interference as well as diffraction phenomena to detect the focal position; however, these methods are ineffective and expensive for industrial application. Moreover, these techniques could not perform detection and fabrication simultaneously. In this paper, we propose an optical design capable of detecting the focal point and fabricating complex patterns on a planar sample surface simultaneously. In-situ real-time focus detection is performed using a bandpass filter, which only allows for the detection of laser transmission. The technique enables rapid, non-destructive, and precise detection of the focal point. Furthermore, it is sufficiently simple for application in both science and industry for mass production, and it is expected to contribute to the next generation of laser equipment, which can be used to fabricate micro-patterns with high complexity.<\/jats:p>","DOI":"10.3390\/s17071540","type":"journal-article","created":{"date-parts":[[2017,7,3]],"date-time":"2017-07-03T10:27:31Z","timestamp":1499077651000},"page":"1540","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":16,"title":["In-Situ Real-Time Focus Detection during Laser Processing Using Double-Hole Masks and Advanced Image Sensor Software"],"prefix":"10.3390","volume":"17","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1331-0636","authenticated-orcid":false,"given":"Binh","family":"Cao","sequence":"first","affiliation":[{"name":"Department of Laser and Electron Beam Application, Korea Institute of Machinery &amp; Materials (KIMM), Daejeon 34103, Korea"},{"name":"Department of Nano-Mechatronics, Korea University of Science and Technology (UST), Daejeon 34113, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Phuong","family":"Hoang","sequence":"additional","affiliation":[{"name":"Department of Material Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5429-7653","authenticated-orcid":false,"given":"Sanghoon","family":"Ahn","sequence":"additional","affiliation":[{"name":"Department of Laser and Electron Beam Application, Korea Institute of Machinery &amp; Materials (KIMM), Daejeon 34103, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jeng-o","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Laser and Electron Beam Application, Korea Institute of Machinery &amp; Materials (KIMM), Daejeon 34103, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Heeshin","family":"Kang","sequence":"additional","affiliation":[{"name":"Department of Laser and Electron Beam Application, Korea Institute of Machinery &amp; Materials (KIMM), Daejeon 34103, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jiwhan","family":"Noh","sequence":"additional","affiliation":[{"name":"Department of Laser and Electron Beam Application, Korea Institute of Machinery &amp; Materials (KIMM), Daejeon 34103, Korea"},{"name":"Department of Nano-Mechatronics, Korea University of Science and Technology (UST), Daejeon 34113, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2017,7,1]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Luo, J., Liang, Y., and Yang, G. 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