{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,29]],"date-time":"2026-04-29T07:53:03Z","timestamp":1777449183319,"version":"3.51.4"},"reference-count":31,"publisher":"MDPI AG","issue":"1","license":[{"start":{"date-parts":[[2018,1,8]],"date-time":"2018-01-08T00:00:00Z","timestamp":1515369600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Many fault detection methods have been proposed for monitoring the health of various industrial systems. Characterizing the monitored signals is a prerequisite for selecting an appropriate detection method. However, fault detection methods tend to be decided with user\u2019s subjective knowledge or their familiarity with the method, rather than following a predefined selection rule. This study investigates the performance sensitivity of two detection methods, with respect to status signal characteristics of given systems: abrupt variance, characteristic indicator, discernable frequency, and discernable index. Relation between key characteristics indicators from four different real-world systems and the performance of two fault detection methods using pattern recognition are evaluated.<\/jats:p>","DOI":"10.3390\/s18010154","type":"journal-article","created":{"date-parts":[[2018,1,8]],"date-time":"2018-01-08T12:26:02Z","timestamp":1515414362000},"page":"154","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":7,"title":["Characterization of System Status Signals for Multivariate Time Series Discretization Based on Frequency and Amplitude Variation"],"prefix":"10.3390","volume":"18","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0353-2291","authenticated-orcid":false,"given":"Woonsang","family":"Baek","sequence":"first","affiliation":[{"name":"Department of System Design and Control Engineering, Ulsan National Institute of Science and Technology, UNIST-gil 50, Ulsan 44919, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9387-6217","authenticated-orcid":false,"given":"Sujeong","family":"Baek","sequence":"additional","affiliation":[{"name":"Department of System Design and Control Engineering, Ulsan National Institute of Science and Technology, UNIST-gil 50, Ulsan 44919, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0072-4693","authenticated-orcid":false,"given":"Duck","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of System Design and Control Engineering, Ulsan National Institute of Science and Technology, UNIST-gil 50, Ulsan 44919, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2018,1,8]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"327","DOI":"10.1016\/S0098-1354(02)00162-X","article-title":"A review of process fault detection and diagnosis: Part iii: Process history based methods","volume":"27","author":"Venkatasubramanian","year":"2003","journal-title":"Comput. 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