{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,12]],"date-time":"2025-10-12T03:56:49Z","timestamp":1760241409284,"version":"build-2065373602"},"reference-count":26,"publisher":"MDPI AG","issue":"2","license":[{"start":{"date-parts":[[2018,1,27]],"date-time":"2018-01-27T00:00:00Z","timestamp":1517011200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Available microwave notch-type damage detection sensors are typically based on monitoring frequency shift or magnitude changes. However, frequency shift testing needs sweep-frequency data that make scanning detection becomes difficult and time-consuming. This work presents a microwave near-field nondestructive testing sensor for detecting sub-millimeter notch-type damage detection in metallic surfaces. The sensor is loaded with an interdigital electrode element in an open-ended coaxial. It is simple to fabricate and inexpensive, as it is etched on the RC4003 patch by using printed circuit board technology. The detection is achieved by monitoring changes in reflection amplitude, which is caused by perturbing the electromagnetic field around the interdigital structure. The proposed sensor was tested on a metallic plate with different defects, and the experimental results indicated that the interdigital electrode probe can determine the orientation, localization and dimension of surface notch-type damage.<\/jats:p>","DOI":"10.3390\/s18020371","type":"journal-article","created":{"date-parts":[[2018,1,29]],"date-time":"2018-01-29T07:46:20Z","timestamp":1517211980000},"page":"371","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":7,"title":["An Interdigital Electrode Probe for Detection, Localization and Evaluation of Surface Notch-Type Damage in Metals"],"prefix":"10.3390","volume":"18","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9238-1100","authenticated-orcid":false,"given":"Lanshuo","family":"Li","sequence":"first","affiliation":[{"name":"School of Electronics and Information Engineering, Sichuan University, Chengdu 610065, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaoqing","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Sichuan University, Chengdu 610065, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yang","family":"Yin","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Sichuan University, Chengdu 610065, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jianping","family":"Yuan","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Aerospace Flight Dynamics, Northwestern Polytechnical University, Xi\u2019an 710129, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xu","family":"Li","sequence":"additional","affiliation":[{"name":"School of Electronics and Information, Northwestern Polytechnical University, Xi\u2019an 710129, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lixin","family":"Li","sequence":"additional","affiliation":[{"name":"School of Electronics and Information, Northwestern Polytechnical University, Xi\u2019an 710129, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kama","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Sichuan University, Chengdu 610065, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2018,1,27]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"113","DOI":"10.1109\/19.20010","article-title":"A nondestructive ultrasonic imaging system for detection of flaws in metal blocks","volume":"38","author":"Ludwig","year":"1989","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"ref_2","doi-asserted-by":"crossref","first-page":"135","DOI":"10.1109\/TIM.2003.809071","article-title":"An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy","volume":"52","author":"Bechou","year":"2003","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"ref_3","doi-asserted-by":"crossref","first-page":"1197","DOI":"10.1109\/19.963183","article-title":"Design and Implementation of Distributed measurement systems using fieldbus-based intelligent sensors","volume":"50","author":"Yun","year":"2001","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"ref_4","doi-asserted-by":"crossref","first-page":"1958","DOI":"10.1109\/TIM.2008.919011","article-title":"Crack shape reconstruction in eddy current testing using machine learning systems for regression","volume":"57","author":"Bernieri","year":"2008","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"ref_5","doi-asserted-by":"crossref","first-page":"505","DOI":"10.1109\/TIM.2011.2161923","article-title":"GMR-based ECT instrument for detection and characterization of crack on a planar specimen","volume":"61","author":"Betta","year":"2012","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"ref_6","doi-asserted-by":"crossref","first-page":"168","DOI":"10.1109\/TIM.2007.909497","article-title":"Dual-polarized near-field microwave reflectometer for noninvasive inspection of carbon fiber reinforced polymer-strengthened structures","volume":"57","author":"Kharkovsky","year":"2008","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"ref_7","doi-asserted-by":"crossref","first-page":"695","DOI":"10.1111\/j.1460-2695.2008.01255.x","article-title":"Microwave and millimetre wave sensors for crack detection","volume":"31","author":"Zoughi","year":"2008","journal-title":"Fatigue Fract. Eng. Mater. Struct."},{"key":"ref_8","doi-asserted-by":"crossref","first-page":"1626","DOI":"10.1109\/TIE.2017.2733449","article-title":"A Microwave Ring Resonator Sensor for Early Detection of Breaches in Pipeline Coatings","volume":"65","author":"Zarifi","year":"2018","journal-title":"IEEE Trans. Ind. Electron."},{"key":"ref_9","doi-asserted-by":"crossref","first-page":"19354","DOI":"10.3390\/s141019354","article-title":"Detection of surface and subsurface cracks in metallic and non-metallic materials using a complementary split-ring resonator","volume":"14","author":"Albishi","year":"2014","journal-title":"Sensors"},{"key":"ref_10","doi-asserted-by":"crossref","first-page":"1693","DOI":"10.1109\/TIM.2009.2027780","article-title":"Depth Evaluation of Shallow Surface Cracks in Metals Using Rectangular Waveguides at Millimeter-Wave Frequencies","volume":"59","author":"McClanahan","year":"2010","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"ref_11","doi-asserted-by":"crossref","first-page":"330","DOI":"10.1109\/LMWC.2012.2197384","article-title":"Complementary Split-Ring Resonator for Crack Detection in Metallic Surfaces","volume":"22","author":"Albishi","year":"2012","journal-title":"IEEE Microw. Wirel. Compon. Lett."},{"key":"ref_12","doi-asserted-by":"crossref","first-page":"36","DOI":"10.1016\/j.ndteint.2012.10.004","article-title":"An open-ended substrate integrated waveguide probe for detection and sizing of surface cracks in metals","volume":"53","author":"Mazlumi","year":"2012","journal-title":"NDT E Int."},{"key":"ref_13","doi-asserted-by":"crossref","first-page":"38","DOI":"10.1016\/j.ndteint.2014.12.005","article-title":"An array waveguide probe for detection, location and sizing of surface cracks in metals","volume":"70","author":"Ahanian","year":"2015","journal-title":"NDT E Int."},{"key":"ref_14","doi-asserted-by":"crossref","first-page":"1864","DOI":"10.1109\/TMTT.2017.2673823","article-title":"Microwaves-Based High Sensitivity Sensors for Crack Detection in Metallic Materials","volume":"65","author":"Alibishi","year":"2017","journal-title":"IEEE Trans. Microw. Theory Tech."},{"key":"ref_15","first-page":"406","article-title":"Unsupervised Diagnostic and Monitoring of Defects Using Waveguide Imaging with Adaptive Sparse Representation","volume":"12","author":"Gao","year":"2016","journal-title":"IEEE Trans Ind. Inform."},{"key":"ref_16","doi-asserted-by":"crossref","first-page":"11402","DOI":"10.3390\/s150511402","article-title":"Intelligent detection of cracks in metallic surfaces using a waveguide sensor loaded with metamaterial elements","volume":"15","author":"Ali","year":"2015","journal-title":"Sensors"},{"key":"ref_17","doi-asserted-by":"crossref","first-page":"923","DOI":"10.1109\/TIM.2013.2287126","article-title":"Smooth Nonnegative Matrix Factorization for Defect Detection Using Microwave Nondestructive Testing and Evaluation","volume":"63","author":"Gao","year":"2014","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"ref_18","doi-asserted-by":"crossref","first-page":"91","DOI":"10.1016\/j.ndteint.2012.11.002","article-title":"Detection of surface crack in film-coated metals using an open-ended coaxial line sensor and dual microwave frequencies","volume":"54","author":"Yang","year":"2013","journal-title":"NDT E Int."},{"key":"ref_19","doi-asserted-by":"crossref","first-page":"564","DOI":"10.1049\/iet-map.2016.0587","article-title":"Detection of surface cracks in metals using time-domain microwave non-destructive testing technique","volume":"11","author":"Mirala","year":"2017","journal-title":"IET Microwav. Antennas Propag."},{"key":"ref_20","doi-asserted-by":"crossref","first-page":"1022","DOI":"10.1109\/TUFFC.2004.1324407","article-title":"Novel compact microstrip interdigital bandstop filters","volume":"51","author":"Yang","year":"2004","journal-title":"IEEE Trans. Ultrason. Ferroelectr. Freq. Control"},{"key":"ref_21","doi-asserted-by":"crossref","first-page":"1039","DOI":"10.1109\/TAP.2013.2281662","article-title":"Frequency Reconfigurable and Miniaturized Substrate Integrated Waveguide Interdigital Capacitor (SIW-IDC) Antenna","volume":"62","author":"Sam","year":"2014","journal-title":"IEEE Trans. Antennas Propag."},{"key":"ref_22","doi-asserted-by":"crossref","unstructured":"Bao, X., Ocket, I., Kil, D., Bao, J., Puers, R., and Nauwelaers, B. (2017, January 15\u201317). Liquid measurements at microliter volumes using 1-port coplanar. Proceedings of the 2017 First IEEE MTT-S International Microwave Bio Conference (IMBIOC), Gothenburg, Sweden.","DOI":"10.1109\/IMBIOC.2017.7965774"},{"key":"ref_23","doi-asserted-by":"crossref","unstructured":"Alcantara, G.P., and Andrade, C.G.M. (2015, January 16\u201318). A short review of gas sensors based on interdigital electrode. Proceedings of the 2015 IEEE 12th International Conference on Electronic Measurement & Instruments, Qingdao, China.","DOI":"10.1109\/ICEMI.2015.7494489"},{"key":"ref_24","doi-asserted-by":"crossref","first-page":"161","DOI":"10.1007\/978-3-319-02318-2_9","article-title":"A Novel Method for Monitoring Structural Metallic Materials Using Microwave NDT","volume":"Volume 7","author":"Abdullah","year":"2014","journal-title":"Sensing Technology Current Status and Future Trends I"},{"key":"ref_25","doi-asserted-by":"crossref","first-page":"1339","DOI":"10.1109\/22.508238","article-title":"Miniature Superconducting Filters","volume":"44","author":"Lancaster","year":"1996","journal-title":"IEEE Trans. Microw. Theory Tech."},{"key":"ref_26","doi-asserted-by":"crossref","first-page":"524","DOI":"10.1109\/LMWC.2005.852793","article-title":"Compact, Narrow Bandwidth, Lumped Element Bandstop Resonators","volume":"15","author":"Aboush","year":"2005","journal-title":"IEEE Microw. Wirel. Compon. Lett."}],"container-title":["Sensors"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/1424-8220\/18\/2\/371\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T14:52:48Z","timestamp":1760194368000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/1424-8220\/18\/2\/371"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,1,27]]},"references-count":26,"journal-issue":{"issue":"2","published-online":{"date-parts":[[2018,2]]}},"alternative-id":["s18020371"],"URL":"https:\/\/doi.org\/10.3390\/s18020371","relation":{},"ISSN":["1424-8220"],"issn-type":[{"type":"electronic","value":"1424-8220"}],"subject":[],"published":{"date-parts":[[2018,1,27]]}}}