{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T09:51:27Z","timestamp":1780480287114,"version":"3.54.1"},"reference-count":15,"publisher":"MDPI AG","issue":"2","license":[{"start":{"date-parts":[[2018,2,8]],"date-time":"2018-02-08T00:00:00Z","timestamp":1518048000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>In this work, we irradiated a high-definition (HD) industrial camera based on a commercial-off-the-shelf (COTS) CMOS image sensor (CIS) with Cobalt-60 gamma-rays. All components of the camera under test were fabricated without radiation hardening, except for the lens. The irradiation experiments of the HD camera under biased conditions were carried out at 1.0, 10.0, 20.0, 50.0 and 100.0 Gy\/h. During the experiment, we found that the tested camera showed a remarkable degradation after irradiation and differed in the dose rates. With the increase of dose rate, the same target images become brighter. Under the same dose rate, the radiation effect in bright area is lower than that in dark area. Under different dose rates, the higher the dose rate is, the worse the radiation effect will be in both bright and dark areas. And the standard deviations of bright and dark areas become greater. Furthermore, through the progressive degradation analysis of the captured image, experimental results demonstrate that the attenuation of signal to noise ratio (SNR) versus radiation time is not obvious at the same dose rate, and the degradation is more and more serious with increasing dose rate. Additionally, the decrease rate of SNR at 20.0, 50.0 and 100.0 Gy\/h is far greater than that at 1.0 and 10.0 Gy\/h. Even so, we confirm that the HD industrial camera is still working at 10.0 Gy\/h during the 8 h of measurements, with a moderate decrease of the SNR (5 dB). The work is valuable and can provide suggestion for camera users in the radiation field.<\/jats:p>","DOI":"10.3390\/s18020514","type":"journal-article","created":{"date-parts":[[2018,2,9]],"date-time":"2018-02-09T12:46:27Z","timestamp":1518180387000},"page":"514","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":22,"title":["Nuclear Radiation Degradation Study on HD Camera Based on CMOS Image Sensor at Different Dose Rates"],"prefix":"10.3390","volume":"18","author":[{"given":"Congzheng","family":"Wang","sequence":"first","affiliation":[{"name":"Institute of Optics and Electronics, Chinese Academy of Sciences, No. 1 Guangdian Avenue Xihang Port, Shuangliu, Chengdu 610209, China"},{"name":"School of Optoelectronic Information, University of Electronic Science and Technology of China, No. 4, Block 2, North Jianshe Road, Chengdu 610054, China"},{"name":"University of Chinese Academy of Sciences, No. 19, Yuquan Road, Shijingshan District, Beijing 100049, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Song","family":"Hu","sequence":"additional","affiliation":[{"name":"Institute of Optics and Electronics, Chinese Academy of Sciences, No. 1 Guangdian Avenue Xihang Port, Shuangliu, Chengdu 610209, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Chunming","family":"Gao","sequence":"additional","affiliation":[{"name":"School of Optoelectronic Information, University of Electronic Science and Technology of China, No. 4, Block 2, North Jianshe Road, Chengdu 610054, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Chang","family":"Feng","sequence":"additional","affiliation":[{"name":"Institute of Optics and Electronics, Chinese Academy of Sciences, No. 1 Guangdian Avenue Xihang Port, Shuangliu, Chengdu 610209, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2018,2,8]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"47","DOI":"10.1016\/j.mejo.2016.11.010","article-title":"A fast correlated multiple sampling technique based on 12-bit SAR ADC with digital calibration for low-noise CMOS image sensor","volume":"59","author":"Nie","year":"2017","journal-title":"Microelectron. 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