{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,26]],"date-time":"2026-01-26T10:11:44Z","timestamp":1769422304054,"version":"3.49.0"},"reference-count":25,"publisher":"MDPI AG","issue":"5","license":[{"start":{"date-parts":[[2018,5,10]],"date-time":"2018-05-10T00:00:00Z","timestamp":1525910400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>The temperature fluctuation in a single-phase microchannel heat sink (MCHS) is investigated using the integrated temperature sensors with deionized water as the coolant. Results show that the temperature fluctuation in single phase is not negligible. The causes of the temperature fluctuation are revealed based on both simulation and experiment. It is found that the inlet temperature fluctuation and the gas bubbles separated out from coolant are the main causes. The effect of the inlet temperature fluctuation is global, where the temperatures at different locations change simultaneously. Meanwhile, the gas bubble effect is localized where the temperature changes at different locations are not synchronized. In addition, the relation between temperature fluctuation and temperature gradient is established. The temperature fluctuation increases with the temperature gradient accordingly.<\/jats:p>","DOI":"10.3390\/s18051498","type":"journal-article","created":{"date-parts":[[2018,5,10]],"date-time":"2018-05-10T03:48:27Z","timestamp":1525924107000},"page":"1498","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":10,"title":["Investigation of the Temperature Fluctuation of Single-Phase Fluid Based Microchannel Heat Sink"],"prefix":"10.3390","volume":"18","author":[{"given":"Tao","family":"Wang","sequence":"first","affiliation":[{"name":"School of Electronic Science and Engineering, University of Electronic Science and Technology of China, 2006 Xiyuan Avenue, Chengdu 611731, China"},{"name":"State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, 2006 Xiyuan Avenue, Chengdu 611731, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiejun","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electronic Science and Engineering, University of Electronic Science and Technology of China, 2006 Xiyuan Avenue, Chengdu 611731, China"},{"name":"State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, 2006 Xiyuan Avenue, Chengdu 611731, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jian","family":"He","sequence":"additional","affiliation":[{"name":"School of Electronic Science and Engineering, University of Electronic Science and Technology of China, 2006 Xiyuan Avenue, Chengdu 611731, China"},{"name":"State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, 2006 Xiyuan Avenue, Chengdu 611731, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chuangui","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Electronic Science and Engineering, University of Electronic Science and Technology of China, 2006 Xiyuan Avenue, Chengdu 611731, China"},{"name":"State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, 2006 Xiyuan Avenue, Chengdu 611731, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wenbo","family":"Luo","sequence":"additional","affiliation":[{"name":"School of Electronic Science and Engineering, University of Electronic Science and Technology of China, 2006 Xiyuan Avenue, Chengdu 611731, China"},{"name":"State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, 2006 Xiyuan Avenue, Chengdu 611731, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yao","family":"Shuai","sequence":"additional","affiliation":[{"name":"School of Electronic Science and Engineering, University of Electronic Science and Technology of China, 2006 Xiyuan Avenue, Chengdu 611731, China"},{"name":"State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, 2006 Xiyuan Avenue, Chengdu 611731, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wanli","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electronic Science and Engineering, University of Electronic Science and Technology of China, 2006 Xiyuan Avenue, Chengdu 611731, China"},{"name":"State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, 2006 Xiyuan Avenue, Chengdu 611731, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8886-3649","authenticated-orcid":false,"given":"Chengkuo","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117583, Singapore"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2018,5,10]]},"reference":[{"key":"ref_1","unstructured":"Garimella, S. 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