{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,12]],"date-time":"2026-03-12T21:45:35Z","timestamp":1773351935768,"version":"3.50.1"},"reference-count":19,"publisher":"MDPI AG","issue":"8","license":[{"start":{"date-parts":[[2018,8,16]],"date-time":"2018-08-16T00:00:00Z","timestamp":1534377600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Increasing the imaging rate of atomic force microscopy (AFM) without impairing of the imaging quality is a challenging task, since the increase in the scanning speed leads to a number of artifacts related to the limited mechanical bandwidth of the AFM components. One of these artifacts is the loss of contact between the probe tip and the sample. We propose to apply an additional nonlinear force on the upper surface of a cantilever, which will help to keep the tip and surface in contact. In practice, this force can be produced by the precisely regulated airflow. Such an improvement affects the AFM system dynamics, which were evaluated using a mathematical model that is presented in this paper. The model defines the relationships between the additional nonlinear force, the pressure of the applied air stream, and the initial air gap between the upper surface of the cantilever and the end of the air duct. It was found that the nonlinear force created by the stream of compressed air (aerodynamic force) prevents the contact loss caused by the high scanning speed or the higher surface roughness, thus maintaining stable contact between the probe and the surface. This improvement allows us to effectively increase the scanning speed by at least 10 times using a soft (spring constant of 0.2 N\/m) cantilever by applying the air pressure of 40 Pa. If a stiff cantilever (spring constant of 40 N\/m) is used, the potential of vertical deviation improvement is twice is large. This method is suitable for use with different types of AFM sensors and it can be implemented practically without essential changes in AFM sensor design.<\/jats:p>","DOI":"10.3390\/s18082694","type":"journal-article","created":{"date-parts":[[2018,8,16]],"date-time":"2018-08-16T11:39:08Z","timestamp":1534419548000},"page":"2694","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":13,"title":["Modification of the AFM Sensor by a Precisely Regulated Air Stream to Increase Imaging Speed and Accuracy in the Contact Mode"],"prefix":"10.3390","volume":"18","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0665-8829","authenticated-orcid":false,"given":"Andrius","family":"Dzedzickis","sequence":"first","affiliation":[{"name":"Department of Mechatronics, Robotics, and Digital Manufacturing, Vilnius Gediminas Technical University, LT-03224 Vilnius, Lithuania"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2458-7243","authenticated-orcid":false,"given":"Vytautas","family":"Bucinskas","sequence":"additional","affiliation":[{"name":"Department of Mechatronics, Robotics, and Digital Manufacturing, Vilnius Gediminas Technical University, LT-03224 Vilnius, Lithuania"}]},{"given":"Darius","family":"Vir\u017eonis","sequence":"additional","affiliation":[{"name":"Department of Mechatronics, Robotics, and Digital Manufacturing, Vilnius Gediminas Technical University, LT-03224 Vilnius, Lithuania"},{"name":"Panev\u0117\u017eys Competence Center of Technology and Business, Kaunas University of Technology, LT-37164 Panev\u0117\u017eys, Lithuania"}]},{"given":"Nikolaj","family":"Sesok","sequence":"additional","affiliation":[{"name":"Department of Mechatronics, Robotics, and Digital Manufacturing, Vilnius Gediminas Technical University, LT-03224 Vilnius, Lithuania"}]},{"given":"Arturas","family":"Ulcinas","sequence":"additional","affiliation":[{"name":"Department of Nanoengineering, Center for Physical Sciences and Technology, LT-02300 Vilnius, Lithuania"}]},{"given":"Igor","family":"Iljin","sequence":"additional","affiliation":[{"name":"Department of Mechatronics, Robotics, and Digital Manufacturing, Vilnius Gediminas Technical University, LT-03224 Vilnius, Lithuania"}]},{"given":"Ernestas","family":"Sutinys","sequence":"additional","affiliation":[{"name":"Department of Mechatronics, Robotics, and Digital Manufacturing, Vilnius Gediminas Technical University, LT-03224 Vilnius, Lithuania"}]},{"given":"Sigitas","family":"Petkevicius","sequence":"additional","affiliation":[{"name":"Department of Mechatronics, Robotics, and Digital Manufacturing, Vilnius Gediminas Technical University, LT-03224 Vilnius, Lithuania"}]},{"given":"Justinas","family":"Gargasas","sequence":"additional","affiliation":[{"name":"Department of Mechatronics, Robotics, and Digital Manufacturing, Vilnius Gediminas Technical University, LT-03224 Vilnius, Lithuania"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5936-9900","authenticated-orcid":false,"given":"Inga","family":"Morkvenaite-Vilkonciene","sequence":"additional","affiliation":[{"name":"Department of Mechatronics, Robotics, and Digital Manufacturing, Vilnius Gediminas Technical University, LT-03224 Vilnius, Lithuania"},{"name":"Department of Electrochemical Material Science, Center for Physical Sciences and Technology, LT-02300 Vilnius, Lithuania"}]}],"member":"1968","published-online":{"date-parts":[[2018,8,16]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"604","DOI":"10.1166\/jnn.2018.13927","article-title":"Morphology of CdSe-based coatings formed on polyamide substrate","volume":"18","author":"Janickis","year":"2018","journal-title":"J. Nanosci. Nanotechnol."},{"key":"ref_2","first-page":"155","article-title":"Atomic force microscopy as a tool for the investigation of living cells","volume":"49","author":"Ramanavicius","year":"2013","journal-title":"Medicina"},{"key":"ref_3","doi-asserted-by":"crossref","first-page":"093702","DOI":"10.1063\/1.4895460","article-title":"High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers","volume":"85","author":"Adams","year":"2014","journal-title":"Rev. Sci. Instrum."},{"key":"ref_4","doi-asserted-by":"crossref","first-page":"921","DOI":"10.1109\/TCST.2005.854334","article-title":"Iterative control of dynamics-coupling-caused errors in piezoscanners during high-speed AFM operation","volume":"13","author":"Tien","year":"2005","journal-title":"IEEE Trans. Control Syst. Technol."},{"key":"ref_5","doi-asserted-by":"crossref","unstructured":"Richter, C., Burri, M., Sulzbach, T., Penzkofer, C., and Irmer, B. (2011). Ultrashort cantilever probes for high-speed atomic force microscopy. SPIE Newsroom.","DOI":"10.1117\/2.1201104.003587"},{"key":"ref_6","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1016\/j.surfrep.2005.08.003","article-title":"Force measurements with the atomic force microscope: Technique, interpretation and applications","volume":"59","author":"Butt","year":"2005","journal-title":"Surf. Sci. Rep."},{"key":"ref_7","doi-asserted-by":"crossref","first-page":"044030","DOI":"10.1088\/0957-4484\/18\/4\/044030","article-title":"Breaking the speed limit with atomic force microscopy","volume":"18","author":"Picco","year":"2007","journal-title":"Nanotechnology"},{"key":"ref_8","doi-asserted-by":"crossref","first-page":"10LT02","DOI":"10.1088\/1361-6528\/aa5af7","article-title":"Rotational scanning atomic force microscopy","volume":"28","author":"Vaitekonis","year":"2017","journal-title":"Nanotechnology"},{"key":"ref_9","doi-asserted-by":"crossref","first-page":"126106","DOI":"10.1063\/1.4904029","article-title":"Note: High-speed z tip scanner with screw cantilever holding mechanism for atomic-resolution atomic force microscopy in liquid","volume":"85","author":"Akrami","year":"2014","journal-title":"Rev. Sci. Instrum."},{"key":"ref_10","doi-asserted-by":"crossref","first-page":"1399","DOI":"10.1016\/j.micron.2012.05.007","article-title":"Increased imaging speed and force sensitivity for bio-applications with small cantilevers using a conventional AFM setup","volume":"43","author":"Leitner","year":"2012","journal-title":"Micron"},{"key":"ref_11","doi-asserted-by":"crossref","first-page":"109","DOI":"10.1016\/S0167-9317(99)00027-1","article-title":"6.6 Mhz silicon AFM cantilever for high-speed readout in AFM-based recording","volume":"46","author":"Hosaka","year":"1999","journal-title":"Microelectron. Eng."},{"key":"ref_12","doi-asserted-by":"crossref","first-page":"265","DOI":"10.1016\/j.mee.2012.03.029","article-title":"Micromachined self-actuated piezoresistive cantilever for high speed SPM","volume":"97","author":"Michels","year":"2012","journal-title":"Microelectron. Eng."},{"key":"ref_13","doi-asserted-by":"crossref","first-page":"45","DOI":"10.1016\/j.ultramic.2014.11.016","article-title":"High-speed dynamic atomic force microscopy by using a q-controlled cantilever eigenmode as an actuator","volume":"149","author":"Balantekin","year":"2015","journal-title":"Ultramicroscopy"},{"key":"ref_14","doi-asserted-by":"crossref","first-page":"083704","DOI":"10.1063\/1.2336113","article-title":"Dynamic proportional-integral-differential controller for high-speed atomic force microscopy","volume":"77","author":"Kodera","year":"2006","journal-title":"Rev. Sci. Instrum."},{"key":"ref_15","doi-asserted-by":"crossref","unstructured":"Bu\u010dinskas, V., Dzedzickis, A., \u0160e\u0161ok, N., \u0160utinys, E., and Iljin, I. (2015, January 7\u201310). Research of modified mechanical sensor of atomic force microscope. Proceedings of the Dynamical Systems: Theoretical and Experimental Analysis, \u0141\u00f3d\u017a, Poland.","DOI":"10.1007\/978-3-319-42408-8_4"},{"key":"ref_16","doi-asserted-by":"crossref","first-page":"77","DOI":"10.4028\/www.scientific.net\/SSP.251.77","article-title":"Modelling of mechanical structure of atomic force microscope","volume":"251","author":"Dzedzickis","year":"2016","journal-title":"Solid State Phenomena"},{"key":"ref_17","doi-asserted-by":"crossref","unstructured":"Bu\u010dinskas, V., Dzedzickis, A., \u0160utinys, E., and Lenkutis, T. (2017). Implementation of different gas influence for operation of modified atomic force microscope sensor. Solid State Phenomena, 260.","DOI":"10.4028\/www.scientific.net\/SSP.260.99"},{"key":"ref_18","doi-asserted-by":"crossref","first-page":"255","DOI":"10.5755\/j01.mech.17.3.500","article-title":"Computer-aided generation of equations and structural diagrams for simulation of linear stationary mechanical dynamic systems","volume":"17","author":"Augustaitis","year":"2011","journal-title":"Mechanics"},{"key":"ref_19","doi-asserted-by":"crossref","first-page":"1021","DOI":"10.1016\/j.chaos.2006.03.125","article-title":"Nonlinear dynamics of atomic force microscopy with intermittent contact","volume":"34","author":"Zhang","year":"2007","journal-title":"Chaos Solitons Fractals"}],"container-title":["Sensors"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/1424-8220\/18\/8\/2694\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T15:19:07Z","timestamp":1760195947000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/1424-8220\/18\/8\/2694"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,8,16]]},"references-count":19,"journal-issue":{"issue":"8","published-online":{"date-parts":[[2018,8]]}},"alternative-id":["s18082694"],"URL":"https:\/\/doi.org\/10.3390\/s18082694","relation":{},"ISSN":["1424-8220"],"issn-type":[{"value":"1424-8220","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,8,16]]}}}