{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,12]],"date-time":"2025-10-12T04:05:12Z","timestamp":1760241912615,"version":"build-2065373602"},"reference-count":41,"publisher":"MDPI AG","issue":"10","license":[{"start":{"date-parts":[[2018,10,11]],"date-time":"2018-10-11T00:00:00Z","timestamp":1539216000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001809","name":"the National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["91438203"],"award-info":[{"award-number":["91438203"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"the Open Fund of Twenty-First Century Aerospace Technology","award":["21AT-2016-09","21AT-2016-02"],"award-info":[{"award-number":["21AT-2016-09","21AT-2016-02"]}]},{"name":"the Nation Key Research and Development Program of China","award":["2016YFB0501402"],"award-info":[{"award-number":["2016YFB0501402"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Optical focal plane assemblies are increasingly being used in high-resolution optical satellite systems to enhance the width of the image using linear push-broom imaging. With this system, vignetting occurs in the area of overlap, affecting image quality. In this paper, using the characteristics of the side-slither data, we propose side-slither data-based vignetting correction of a high-resolution spaceborne camera with an optical focal plane assembly. First, the raw side-slither data standardization is used to ensure that each row has the same features. Then, with the spatial correlation of a gray-level co-occurrence matrix, the gray-level co-occurrence matrix is proposed to identify the uniform regions, to extract the sample points. Finally, due to the characteristics of compatible linear response and non-linear response, the power-law model was used to fit, and the Levenberg\u2013Marquardt algorithm was used to fit the model. In the experiment, polynomial fitting, laboratory coefficients and on-orbit coefficients were used for comparison with the proposed method. The side-slither data can be treated as a uniform scene due to their characteristics, and the side-slither image that was corrected using the proposed method showed less than 1% change in mean value, a root-mean-square deviation value better than 0.1%, and the average streaking metrics were superior to 0.02. The results showed that the proposed method performs significantly better in the vignetting area.<\/jats:p>","DOI":"10.3390\/s18103402","type":"journal-article","created":{"date-parts":[[2018,10,12]],"date-time":"2018-10-12T02:58:04Z","timestamp":1539313084000},"page":"3402","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":10,"title":["Side-Slither Data-Based Vignetting Correction of High-Resolution Spaceborne Camera with Optical Focal Plane Assembly"],"prefix":"10.3390","volume":"18","author":[{"given":"Chaochao","family":"Chen","sequence":"first","affiliation":[{"name":"State Key Laboratory of Information Engineering in Surveying, Mapping and Remote Sensing, Wuhan University, Wuhan 430079, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6756-0692","authenticated-orcid":false,"given":"Jun","family":"Pan","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Information Engineering in Surveying, Mapping and Remote Sensing, Wuhan University, Wuhan 430079, China"}]},{"given":"Mi","family":"Wang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Information Engineering in Surveying, Mapping and Remote Sensing, Wuhan University, Wuhan 430079, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5708-3252","authenticated-orcid":false,"given":"Ying","family":"Zhu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Information Engineering in Surveying, Mapping and Remote Sensing, Wuhan University, Wuhan 430079, China"}]}],"member":"1968","published-online":{"date-parts":[[2018,10,11]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Amico, P., and Beletic, W.J. 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