{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,27]],"date-time":"2026-03-27T02:45:53Z","timestamp":1774579553353,"version":"3.50.1"},"reference-count":26,"publisher":"MDPI AG","issue":"11","license":[{"start":{"date-parts":[[2018,10,27]],"date-time":"2018-10-27T00:00:00Z","timestamp":1540598400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100008736","name":"Fondo de Fomento al Desarrollo Cient\u00edfico y Tecnol\u00f3gico","doi-asserted-by":"publisher","award":["ID14I20364"],"award-info":[{"award-number":["ID14I20364"]}],"id":[{"id":"10.13039\/501100008736","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>In this work, we explore the use of images from different spectral bands to classify defects in melamine faced panels, which could appear through the production process. Through experimental evaluation, we evaluate the use of images from the visible (VS), near-infrared (NIR), and long wavelength infrared (LWIR), to classify the defects using a feature descriptor learning approach together with a support vector machine classifier. Two descriptors were evaluated, Extended Local Binary Patterns (E-LBP) and SURF using a Bag of Words (BoW) representation. The evaluation was carried on with an image set obtained during this work, which contained five different defect categories that currently occurs in the industry. Results show that using images from beyond the visual spectrum helps to improve classification performance in contrast with a single visible spectrum solution.<\/jats:p>","DOI":"10.3390\/s18113644","type":"journal-article","created":{"date-parts":[[2018,10,29]],"date-time":"2018-10-29T11:10:41Z","timestamp":1540811441000},"page":"3644","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":10,"title":["Melamine Faced Panels Defect Classification beyond the Visible Spectrum"],"prefix":"10.3390","volume":"18","author":[{"given":"Cristhian A.","family":"Aguilera","sequence":"first","affiliation":[{"name":"Universidad Tecnol\u00f3gica de Chile INACAP, Av. Vitacura 10.151, Vitacura 7650033, Santiago, Chile"}]},{"given":"Cristhian","family":"Aguilera","sequence":"additional","affiliation":[{"name":"University of B\u00edo-B\u00edo, DIEE, Concepci\u00f3n 4051381, Concepci\u00f3n, Chile"}]},{"given":"Angel D.","family":"Sappa","sequence":"additional","affiliation":[{"name":"Computer Vision Center, Edifici O, Campus UAB, Bellaterra, 08193 Barcelona, Spain"},{"name":"Escuela Superior Polit\u00e9cnica del Litoral, ESPOL, Facultad de Ingenier\u00eda en Electricidad y Computaci\u00f3n, CIDIS, Campus Gustavo Galindo, Km 30.5 v\u00eda Perimetral, Guayaquil 09-01-5863, Ecuador"}]}],"member":"1968","published-online":{"date-parts":[[2018,10,27]]},"reference":[{"key":"ref_1","unstructured":"(2018). 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