{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T16:14:20Z","timestamp":1780503260065,"version":"3.54.1"},"reference-count":19,"publisher":"MDPI AG","issue":"12","license":[{"start":{"date-parts":[[2018,12,2]],"date-time":"2018-12-02T00:00:00Z","timestamp":1543708800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61434004"],"award-info":[{"award-number":["61434004"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61604107"],"award-info":[{"award-number":["61604107"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Tianjin artificial intelligence science and technology project","award":["17ZXRGGX00040"],"award-info":[{"award-number":["17ZXRGGX00040"]}]},{"name":"Tianjin Research Program of Application Foundation and Advanced Technology","award":["17JCYBJC16000"],"award-info":[{"award-number":["17JCYBJC16000"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>In this paper, the non-ideal factors, which include spatial noise and temporal noise, are analyzed and suppressed in the high-speed spike-based image sensor, which combines the high-speed scanning sequential format with the method that uses the interspike time interval to indicate the scene information. In this imager, spatial noise contains device mismatch, which results in photo response non-uniformity (PRNU) and the non-uniformity of dark current. By multiplying the measured coefficient matrix the photo response non-uniformity is suppressed, and the non-uniformity of dark current is suppressed by correcting the interspike time interval based on the time interval of dark current. The temporal noise is composed of the shot noise and thermal noise. This kind of noise can be eliminated when using the spike frequency to restore the image. The experimental results show that, based on the spike frequency method, the standard deviation of the image decreases from 18.4792 to 0.5683 in the uniform bright light by using the calibration algorithm. While in the relatively uniform dark condition, the standard deviation decreases from 1.5812 to 0.4516. Based on interspike time interval method, because of time mismatch and temporal noise, the standard deviation of the image changes from 27.4252 to 27.4977 in the uniform bright light by using the calibration algorithm. While in the uniform dark condition, the standard deviation decreases from 2.361 to 0.3678.<\/jats:p>","DOI":"10.3390\/s18124232","type":"journal-article","created":{"date-parts":[[2018,12,3]],"date-time":"2018-12-03T06:02:09Z","timestamp":1543816929000},"page":"4232","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":19,"title":["The Analysis and Suppressing of Non-Uniformity in a High-Speed Spike-Based Image Sensor"],"prefix":"10.3390","volume":"18","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8619-0620","authenticated-orcid":false,"given":"Jing","family":"Gao","sequence":"first","affiliation":[{"name":"School of Microelectronics, Tianjin University and Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, No. 92 Weijin Road, Nankai District, Tianjin 300072, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yanzhao","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Tianjin University and Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, No. 92 Weijin Road, Nankai District, Tianjin 300072, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kaiming","family":"Nie","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Tianjin University and Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, No. 92 Weijin Road, Nankai District, Tianjin 300072, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhiyuan","family":"Gao","sequence":"additional","affiliation":[{"name":"School of Computers, Guangdong University of Technology, Guangzhou 510006, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jiangtao","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Tianjin University and Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, No. 92 Weijin Road, Nankai District, Tianjin 300072, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2018,12,2]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Noda, A., Hirano, M., Yamakawa, Y., and Ishikawa, M. 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