{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,21]],"date-time":"2025-10-21T15:31:55Z","timestamp":1761060715930,"version":"build-2065373602"},"reference-count":23,"publisher":"MDPI AG","issue":"1","license":[{"start":{"date-parts":[[2018,12,22]],"date-time":"2018-12-22T00:00:00Z","timestamp":1545436800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Open Foundation of Key Laboratory of Photoelectric Testing and Instrument Technology of Shaanxi Province","award":["No.2015SZSJ603"],"award-info":[{"award-number":["No.2015SZSJ603"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>To solve the cavity interrogation problem of short cavity fiber Fabry\u2013Perot sensors in white light spectral interrogation with amplified spontaneous emissions (ASEs) as the white light sources, a data processing method, using an improved elliptical fitting equation with only two undetermined coefficients, is proposed. Based on the method, the cavity length of a fiber Fabry\u2013Perot sensor without a complete reflection spectrum period in the frequency domain can be interrogated with relatively high resolution. Extrinsic fiber Fabry\u2013Perot air-gap sensors with cavity lengths less than 30 \u03bcm are used to experimentally verify the method, and are successfully interrogated with an accuracy better than 0.55%.<\/jats:p>","DOI":"10.3390\/s19010036","type":"journal-article","created":{"date-parts":[[2018,12,24]],"date-time":"2018-12-24T10:37:49Z","timestamp":1545647869000},"page":"36","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":9,"title":["Two-Parameter Elliptical Fitting Method for Short-Cavity Fiber Fabry\u2013Perot Sensor Interrogation"],"prefix":"10.3390","volume":"19","author":[{"given":"Xiongxing","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Optoelectronic Engineering, Xi\u2019an Technological University, Xi\u2019an 710021, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8501-8036","authenticated-orcid":false,"given":"Wei","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Optoelectronic Engineering, Xi\u2019an Technological University, Xi\u2019an 710021, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haibin","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Optoelectronic Engineering, Xi\u2019an Technological University, Xi\u2019an 710021, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ying","family":"Tang","sequence":"additional","affiliation":[{"name":"School of Optoelectronic Engineering, Xi\u2019an Technological University, Xi\u2019an 710021, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhibo","family":"Ma","sequence":"additional","affiliation":[{"name":"Key Lab of Micro\/Nano Systems for Aerospace, Ministry of Education, Xi\u2019an 710072, China"},{"name":"Shaanxi Key Lab of MEMS\/NEMS, Northwestern Polytechnical University, Xi\u2019an 710072, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kening","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Optoelectronic Engineering, Xi\u2019an Technological University, Xi\u2019an 710021, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2018,12,22]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"2403","DOI":"10.1109\/LPT.2005.857236","article-title":"Intrinsic Fabry-Pe\/spl acute\/rot fiber sensor for temperature and strain measurements","volume":"17","author":"Huang","year":"2005","journal-title":"IEEE Photonics Technol. Lett."},{"key":"ref_2","doi-asserted-by":"crossref","first-page":"615","DOI":"10.1364\/OL.21.000615","article-title":"High-sensitivity intrinsic fiber-optic Fabry-Perot pressure sensor","volume":"21","author":"Kao","year":"1996","journal-title":"Opt. Lett."},{"key":"ref_3","doi-asserted-by":"crossref","first-page":"41","DOI":"10.1016\/S0924-4247(00)00494-5","article-title":"A simple strain sensor using a thin film as a low-finesse fiber-optic Fabry\u2013Perot interferometer","volume":"88","author":"Jiang","year":"2001","journal-title":"Sens. Actuators A Phys."},{"key":"ref_4","doi-asserted-by":"crossref","first-page":"138","DOI":"10.1109\/19.728806","article-title":"Extrinsic Fabry-Perot interferometer fiber-optic microphone","volume":"47","author":"Furstenau","year":"1997","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"ref_5","doi-asserted-by":"crossref","first-page":"797","DOI":"10.1109\/68.584994","article-title":"Optical fiber Fabry-Perot interferometric sensor for magnetic field measurement","volume":"9","author":"Oh","year":"1997","journal-title":"IEEE Photonics Technol. Lett."},{"key":"ref_6","doi-asserted-by":"crossref","first-page":"2159","DOI":"10.1109\/TED.2003.816106","article-title":"SiC thin-film Fabry-Perot interferometer for fiber-optic temperature sensor","volume":"50","author":"Cheng","year":"2003","journal-title":"IEEE Trans. Electron Devices"},{"key":"ref_7","doi-asserted-by":"crossref","first-page":"2276","DOI":"10.1109\/JLT.2003.816882","article-title":"Single-crystal sapphire fiber-based strain sensor for high-temperature applications","volume":"21","author":"Xiao","year":"2003","journal-title":"J. Light. Technol."},{"key":"ref_8","doi-asserted-by":"crossref","first-page":"219","DOI":"10.1109\/JSEN.2009.2031425","article-title":"Silicon Carbide-Based Extreme Environment Hybrid Design Temperature Sensor Using Optical Pyrometry and Laser Interferometry","volume":"10","author":"Riza","year":"2009","journal-title":"IEEE Sens. J."},{"key":"ref_9","first-page":"9","article-title":"Demonstration of an All-Sapphire Fabry\u2013P\u00e9rot Cavity for Pressure Sensing","volume":"23","author":"Yi","year":"2010","journal-title":"IEEE Photonics Technol. Lett."},{"key":"ref_10","doi-asserted-by":"crossref","first-page":"376","DOI":"10.1016\/j.sna.2008.09.009","article-title":"Stabilization of optical Fabry\u2013Perot sensor by active feedback control of diode laser","volume":"148","author":"Chen","year":"2008","journal-title":"Sens. Actuators A Phys."},{"key":"ref_11","doi-asserted-by":"crossref","first-page":"273","DOI":"10.1364\/OL.16.000273","article-title":"Quadrature phase-shifted, extrinsic Fabry-Perot optical fiber sensors","volume":"16","author":"Murphy","year":"1991","journal-title":"Opt. Lett."},{"key":"ref_12","doi-asserted-by":"crossref","first-page":"129","DOI":"10.1109\/50.64932","article-title":"Fiber-optic Fabry-Perot temperature sensor using a low-coherence light source","volume":"9","author":"Lee","year":"1991","journal-title":"J. Light. Technol."},{"key":"ref_13","doi-asserted-by":"crossref","first-page":"679","DOI":"10.1364\/OL.17.000679","article-title":"Electronically scanned white-light interferometry: A novel noise-resistant signal processing","volume":"17","author":"Zimmermann","year":"1992","journal-title":"Opt. Lett."},{"key":"ref_14","doi-asserted-by":"crossref","first-page":"78","DOI":"10.1364\/OL.18.000078","article-title":"White-light interferometric multimode fiber-optic strain sensor","volume":"18","author":"Belleville","year":"1993","journal-title":"Opt. Lett."},{"key":"ref_15","doi-asserted-by":"crossref","first-page":"397","DOI":"10.1109\/50.485599","article-title":"A novel electronically scanned white-light interferometer using a Mach-Zehnder approach","volume":"14","author":"Marshall","year":"1996","journal-title":"J. Light. Technol."},{"key":"ref_16","doi-asserted-by":"crossref","first-page":"727","DOI":"10.1364\/OL.42.000727","article-title":"Simple interrogator for optical fiber-based white light Fabry\u2013Perot interferometers","volume":"42","author":"Yu","year":"2017","journal-title":"Opt. Lett."},{"key":"ref_17","doi-asserted-by":"crossref","first-page":"1011","DOI":"10.1002\/mop.25920","article-title":"Quadrature phase-shifted white-light interferometry for the measurement of short-cavity extrinsic fabry\u2013perot interferometric sensors","volume":"53","author":"Wang","year":"2011","journal-title":"Microw. Opt. Technol. Lett."},{"key":"ref_18","doi-asserted-by":"crossref","first-page":"1168","DOI":"10.1364\/AO.57.001168","article-title":"Five-step phase-shifting white-light interferometry for the measurement of fiber optic extrinsic Fabry-Perot interferometers","volume":"57","author":"Gao","year":"2018","journal-title":"Appl. Opt."},{"key":"ref_19","doi-asserted-by":"crossref","first-page":"75","DOI":"10.1109\/LPT.2007.912567","article-title":"Fourier Transform White-Light Interferometry for the Measurement of Fiber-Optic Extrinsic Fabry\u2013Perot Interferometric Sensors","volume":"20","author":"Jiang","year":"2007","journal-title":"IEEE Photonics Technol. Lett."},{"key":"ref_20","doi-asserted-by":"crossref","first-page":"1602","DOI":"10.1109\/JSEN.2010.2103307","article-title":"Wide-Range Displacement Sensor Based on Fiber-Optic Fabry\u2013Perot Interferometer for Subnanometer Measurement","volume":"11","author":"Zhou","year":"2011","journal-title":"IEEE Sens. J."},{"key":"ref_21","doi-asserted-by":"crossref","first-page":"1736","DOI":"10.1364\/OL.29.001736","article-title":"Signal-processing algorithm for white-light optical fiber extrinsic Fabry-Perot interferometric sensors","volume":"29","author":"Han","year":"2004","journal-title":"Opt. Lett."},{"key":"ref_22","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1016\/j.yofte.2014.11.010","article-title":"High resolution signal-processing method for extrinsic Fabry\u2013Perot interferometric sensors","volume":"22","author":"Xie","year":"2015","journal-title":"Opt. Fiber Technol."},{"key":"ref_23","doi-asserted-by":"crossref","first-page":"476","DOI":"10.1109\/34.765658","article-title":"Direct least square fitting of ellipses","volume":"21","author":"Fitzgibbon","year":"1999","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."}],"container-title":["Sensors"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/1424-8220\/19\/1\/36\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T15:35:38Z","timestamp":1760196938000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/1424-8220\/19\/1\/36"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,12,22]]},"references-count":23,"journal-issue":{"issue":"1","published-online":{"date-parts":[[2019,1]]}},"alternative-id":["s19010036"],"URL":"https:\/\/doi.org\/10.3390\/s19010036","relation":{},"ISSN":["1424-8220"],"issn-type":[{"type":"electronic","value":"1424-8220"}],"subject":[],"published":{"date-parts":[[2018,12,22]]}}}