{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T14:57:16Z","timestamp":1780325836473,"version":"3.54.1"},"reference-count":13,"publisher":"MDPI AG","issue":"3","license":[{"start":{"date-parts":[[2019,1,30]],"date-time":"2019-01-30T00:00:00Z","timestamp":1548806400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100008530","name":"European Regional Development Fund","doi-asserted-by":"publisher","award":["STEP"],"award-info":[{"award-number":["STEP"]}],"id":[{"id":"10.13039\/501100008530","id-type":"DOI","asserted-by":"publisher"}]},{"name":"State of Rhineland-Palatinate (MBWWK and MWKEL)","award":["STEP"],"award-info":[{"award-number":["STEP"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>The estimation of the reliability of magnetic field sensors against failure is a critical point concerning their application for industrial purposes. Due to the physical stochastic nature of the failure events, this can only be done by means of a statistical approach which is extremely time consuming and prevents a continuous observation of the production. Here, we present a novel microstructure design for a parallel measurement of the lifetime characteristics of a sensor population. By making use of two alternative designs and the Weibull statistical distribution function, we are able to measure the lifetime characteristics of a CoFeB\/MgO\/CoFeB tunneling junction population. The main parameters governing the time evolution of the failure rate are estimated and discussed and the suitability of the microstructure for highly reliable sensor application is proven.<\/jats:p>","DOI":"10.3390\/s19030583","type":"journal-article","created":{"date-parts":[[2019,1,30]],"date-time":"2019-01-30T10:58:27Z","timestamp":1548845907000},"page":"583","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["Microstructure Design for Fast Lifetime Measurements of Magnetic Tunneling Junctions"],"prefix":"10.3390","volume":"19","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4206-1288","authenticated-orcid":false,"given":"Andr\u00e9s","family":"Conca Parra","sequence":"first","affiliation":[{"name":"Fachbereich Physik and Forschungszentrum OPTIMAS, Technische Universit\u00e4t Kaiserslautern, 67663 Kaiserslautern, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8103-0054","authenticated-orcid":false,"given":"Frederick","family":"Casper","sequence":"additional","affiliation":[{"name":"Sensitec GmbH, 55130 Mainz, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0051-7715","authenticated-orcid":false,"given":"Johannes","family":"Paul","sequence":"additional","affiliation":[{"name":"Sensitec GmbH, 55130 Mainz, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ronald","family":"Lehndorff","sequence":"additional","affiliation":[{"name":"Sensitec GmbH, 55130 Mainz, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Christian","family":"Haupt","sequence":"additional","affiliation":[{"name":"Sensitec GmbH, 55130 Mainz, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9466-0840","authenticated-orcid":false,"given":"Gerhard","family":"Jakob","sequence":"additional","affiliation":[{"name":"Institute of Physics, Johannes Gutenberg University, 55122 Mainz, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mathias","family":"Kl\u00e4ui","sequence":"additional","affiliation":[{"name":"Institute of Physics, Johannes Gutenberg University, 55122 Mainz, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Burkard","family":"Hillebrands","sequence":"additional","affiliation":[{"name":"Fachbereich Physik and Forschungszentrum OPTIMAS, Technische Universit\u00e4t Kaiserslautern, 67663 Kaiserslautern, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2019,1,30]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Yamazaki, H., Hirabayashi, H., Oyama, N., and Sakai, M. 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Available online: www.sensitec.com."}],"container-title":["Sensors"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/1424-8220\/19\/3\/583\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T12:29:44Z","timestamp":1760185784000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/1424-8220\/19\/3\/583"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,1,30]]},"references-count":13,"journal-issue":{"issue":"3","published-online":{"date-parts":[[2019,2]]}},"alternative-id":["s19030583"],"URL":"https:\/\/doi.org\/10.3390\/s19030583","relation":{},"ISSN":["1424-8220"],"issn-type":[{"value":"1424-8220","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,1,30]]}}}