{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,6]],"date-time":"2026-02-06T00:16:55Z","timestamp":1770337015252,"version":"3.49.0"},"reference-count":20,"publisher":"MDPI AG","issue":"9","license":[{"start":{"date-parts":[[2019,5,7]],"date-time":"2019-05-07T00:00:00Z","timestamp":1557187200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>In this paper, complementary metamaterial sensor is designed for nondestructive evaluation of dielectric substrates. The design concept is based on electromagnetic stored energy in the complementary circular spiral resonator (CCSR), which is concentrated in small volume near the host substrate at resonance. This energy can be employed to detect various electromagnetic properties of materials under test (MUT). Effective electric permittivity and magnetic permeability of the proposed sensor is extracted from scattering parameters. Sensitivity analysis is performed by varying the permittivity of MUT. After sensitivity analysis, a sensor is fabricated using standard PCB fabrication technique, and resonance frequency of the sensor due to interaction with different MUT is measured using vector network analyzer (AV3672series). The transcendental equation is derived for the fabricated sensor to calculate relative permittivity for unknown MUTs. This method is very simple and requires calculating only the resonant frequency, which reduces the cost and computation time.<\/jats:p>","DOI":"10.3390\/s19092100","type":"journal-article","created":{"date-parts":[[2019,5,9]],"date-time":"2019-05-09T11:22:35Z","timestamp":1557400955000},"page":"2100","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":62,"title":["Complementary Metamaterial Sensor for Nondestructive Evaluation of Dielectric Substrates"],"prefix":"10.3390","volume":"19","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8327-583X","authenticated-orcid":false,"given":"Tanveer ul","family":"Haq","sequence":"first","affiliation":[{"name":"School of Electronic and Information Engineering, Beihang University, Beijing 100191, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5248-9333","authenticated-orcid":false,"given":"Cunjun","family":"Ruan","sequence":"additional","affiliation":[{"name":"School of Electronic and Information Engineering, Beihang University, Beijing 100191, China"},{"name":"Beijing Key Laboratory for Microwave Sensing and Security Applications, Beihang University, Beijing 100191, China"}]},{"given":"Xingyun","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electronic and Information Engineering, Beihang University, Beijing 100191, China"}]},{"given":"Shahid","family":"Ullah","sequence":"additional","affiliation":[{"name":"School of Electronic and Information Engineering, Beihang University, Beijing 100191, China"}]}],"member":"1968","published-online":{"date-parts":[[2019,5,7]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"164","DOI":"10.1109\/LMWC.2018.2886062","article-title":"Novel Improved sensitivity planar microwave probe for adulteration detection in edible oils","volume":"29","author":"Tiwari","year":"2019","journal-title":"IEEE Microw. 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