{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,6]],"date-time":"2026-05-06T15:45:10Z","timestamp":1778082310357,"version":"3.51.4"},"reference-count":44,"publisher":"MDPI AG","issue":"10","license":[{"start":{"date-parts":[[2019,5,24]],"date-time":"2019-05-24T00:00:00Z","timestamp":1558656000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100006595","name":"Unitatea Executiva pentru Finantarea Invatamantului Superior, a Cercetarii, Dezvoltarii si Inovarii","doi-asserted-by":"publisher","award":["71PCCDI \u2044 2018"],"award-info":[{"award-number":["71PCCDI \u2044 2018"]}],"id":[{"id":"10.13039\/501100006595","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>This paper presents a high-temperature probe suitable for operating in harsh industrial applications as a reliable alternative to low-lifespan conventional solutions, such as thermocouples. The temperature sensing element is a Schottky diode fabricated on 4H-SiC wafers, with Ni as the Schottky metal, which allows operation at temperatures up to 400 \u00b0C, with sensitivities over 2 mV\/\u00b0C and excellent linearity (R2 &gt; 99.99%). The temperature probe also includes dedicated circuitry for signal acquisition and conversion to the 4 mA\u201320 mA industrial standard output signal. This read-out circuit can be calibrated for linear response over a tunable temperature detection range. The entire system is designed for full electrical and mechanical compatibility with existing conventional probe casings, allowing for seamless implementation in a factory\u2019s sensor network. Such sensors are tested alongside standard thermocouples, with matching temperature monitoring results, over several months, in real working conditions (a cement factory), up to 400 \u00b0C.<\/jats:p>","DOI":"10.3390\/s19102384","type":"journal-article","created":{"date-parts":[[2019,5,24]],"date-time":"2019-05-24T11:20:46Z","timestamp":1558696846000},"page":"2384","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":26,"title":["400 \u00b0C Sensor Based on Ni\/4H-SiC Schottky Diode for Reliable Temperature Monitoring in Industrial Environments"],"prefix":"10.3390","volume":"19","author":[{"given":"Florin","family":"Draghici","sequence":"first","affiliation":[{"name":"Electronic Devices, Circuits and Architectures Department, University Politehnica of Bucharest, Bucharest 060042, Romania"}]},{"given":"Gheorghe","family":"Brezeanu","sequence":"additional","affiliation":[{"name":"Electronic Devices, Circuits and Architectures Department, University Politehnica of Bucharest, Bucharest 060042, Romania"}]},{"given":"Gheorghe","family":"Pristavu","sequence":"additional","affiliation":[{"name":"Electronic Devices, Circuits and Architectures Department, University Politehnica of Bucharest, Bucharest 060042, Romania"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3170-9752","authenticated-orcid":false,"given":"Razvan","family":"Pascu","sequence":"additional","affiliation":[{"name":"National Institute for Research and Development in Microtechnologies, Bucharest 077190, Romania"}]},{"given":"Marian","family":"Badila","sequence":"additional","affiliation":[{"name":"Electronic Devices, Circuits and Architectures Department, University Politehnica of Bucharest, Bucharest 060042, Romania"}]},{"given":"Adriana","family":"Pribeanu","sequence":"additional","affiliation":[{"name":"CEPROCIM S.A., Bucharest 062203, Romania"}]},{"given":"Emilian","family":"Ceuca","sequence":"additional","affiliation":[{"name":"Exact and Engineering Sciences Department, University 1 Decembrie 1918 of Alba Iulia, Alba Iulia 510009, Romania"}]}],"member":"1968","published-online":{"date-parts":[[2019,5,24]]},"reference":[{"key":"ref_1","unstructured":"Yadav, B.C., Srivastava, R., Singh, S., Kumar, A., and Yadav, A.K. 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