{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,13]],"date-time":"2026-01-13T16:51:53Z","timestamp":1768323113765,"version":"3.49.0"},"reference-count":9,"publisher":"MDPI AG","issue":"13","license":[{"start":{"date-parts":[[2019,6,28]],"date-time":"2019-06-28T00:00:00Z","timestamp":1561680000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100003706","name":"Korea Research Institute of Standards and Science","doi-asserted-by":"publisher","award":["KRISS- GP2019-0005-04"],"award-info":[{"award-number":["KRISS- GP2019-0005-04"]}],"id":[{"id":"10.13039\/501100003706","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100004358","name":"Samsung","doi-asserted-by":"publisher","award":["IO170703-04542-01"],"award-info":[{"award-number":["IO170703-04542-01"]}],"id":[{"id":"10.13039\/100004358","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>We present the practical resolution limit of a fine electrical structure based on a fiber-coupled electro-optic probing system. The spatial resolution limit was experimentally evaluated on the sub-millimeter to micrometer scale of planar electrical transmission lines. The electrical lines were fabricated to have various potential differences depending on the dimensions and geometry. The electric field between the lines was measured through an electro-optic probe, which was miniaturized up to the optical bare fiber scale so as to investigate the spatial limit of electrical signals with minimal invasiveness. The experimental results show that the technical resolution limitation of a fiber-coupled probe can reasonably approach a fraction of the mode field diameter (~10 \u03bcm) of the fiber in use.<\/jats:p>","DOI":"10.3390\/s19132874","type":"journal-article","created":{"date-parts":[[2019,6,28]],"date-time":"2019-06-28T11:20:26Z","timestamp":1561720826000},"page":"2874","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Micrometer Scale Resolution Limit of a Fiber-Coupled Electro-Optic Probe"],"prefix":"10.3390","volume":"19","author":[{"given":"Young-Pyo","family":"Hong","sequence":"first","affiliation":[{"name":"Division of Physical Metrology, Korea Research Institute of Standards and Science, Yuseong-gu, Daejeon 34113, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kyung-Min","family":"Lee","sequence":"additional","affiliation":[{"name":"Manufacturing Technology Center, Samsung Electronics Co., Ltd., Hwaseong-si 18448, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sung-Yeol","family":"Kim","sequence":"additional","affiliation":[{"name":"Manufacturing Technology Center, Samsung Electronics Co., Ltd., Hwaseong-si 18448, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Meehyun","family":"Lim","sequence":"additional","affiliation":[{"name":"Manufacturing Technology Center, Samsung Electronics Co., Ltd., Hwaseong-si 18448, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Taekjin","family":"Kim","sequence":"additional","affiliation":[{"name":"Manufacturing Technology Center, Samsung Electronics Co., Ltd., Hwaseong-si 18448, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hyung-Jung","family":"Yong","sequence":"additional","affiliation":[{"name":"Manufacturing Technology Center, Samsung Electronics Co., Ltd., Hwaseong-si 18448, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dong-Joon","family":"Lee","sequence":"additional","affiliation":[{"name":"Division of Physical Metrology, Korea Research Institute of Standards and Science, Yuseong-gu, Daejeon 34113, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2019,6,28]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"908","DOI":"10.1109\/LMWC.2014.2361433","article-title":"A High-Sensitivity Electric Probe Based on Board-Level Edge Plating and LC Resonance","volume":"24","author":"Song","year":"2014","journal-title":"IEEE Microw. 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Express"},{"key":"ref_6","doi-asserted-by":"crossref","first-page":"21587","DOI":"10.1364\/OE.16.021587","article-title":"An optical-fiber-scale electro-optic probe for minimally invasive high-frequency field sensing","volume":"16","author":"Lee","year":"2008","journal-title":"Opt. Express"},{"key":"ref_7","doi-asserted-by":"crossref","first-page":"10547","DOI":"10.1364\/OE.24.010547","article-title":"Two-tier calibrated electro-optic sensing system for intense field characterization of high-power W-band gyrotron","volume":"24","author":"Kim","year":"2016","journal-title":"Opt. Express"},{"key":"ref_8","doi-asserted-by":"crossref","first-page":"2897","DOI":"10.1364\/OE.22.002897","article-title":"Field analysis of electro-optic probes for minimally invasive microwave sampling","volume":"22","author":"Lee","year":"2014","journal-title":"Opt. 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Phys."}],"container-title":["Sensors"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/1424-8220\/19\/13\/2874\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T13:02:04Z","timestamp":1760187724000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/1424-8220\/19\/13\/2874"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6,28]]},"references-count":9,"journal-issue":{"issue":"13","published-online":{"date-parts":[[2019,7]]}},"alternative-id":["s19132874"],"URL":"https:\/\/doi.org\/10.3390\/s19132874","relation":{},"ISSN":["1424-8220"],"issn-type":[{"value":"1424-8220","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,6,28]]}}}