{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,12]],"date-time":"2025-10-12T03:48:04Z","timestamp":1760240884173,"version":"build-2065373602"},"reference-count":24,"publisher":"MDPI AG","issue":"20","license":[{"start":{"date-parts":[[2019,10,15]],"date-time":"2019-10-15T00:00:00Z","timestamp":1571097600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>The paper addresses the evaluation of the uncertainty sources of a test bed system for calibrating voltage transformers vs. temperature. In particular, the Monte Carlo method has been applied in order to evaluate the effects of the uncertainty sources in two different conditions: by using the nominal accuracy specifications of the elements which compose the setup, or by exploiting the results of their metrological characterization. In addition, the influence of random effects on the system accuracy has been quantified and evaluated. From the results, it emerges that the choice of the uncertainty evaluation method affects the overall study. As a matter of fact, the use of a metrological characterization or of accuracy specifications provided by the manufacturers provides respectively an accuracy of 0.1 and 0.5 for the overall measurement setup.<\/jats:p>","DOI":"10.3390\/s19204472","type":"journal-article","created":{"date-parts":[[2019,10,16]],"date-time":"2019-10-16T03:32:54Z","timestamp":1571196774000},"page":"4472","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":5,"title":["Uncertainty Analysis of a Test Bed for Calibrating Voltage Transformers Vs. Temperature"],"prefix":"10.3390","volume":"19","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1739-1277","authenticated-orcid":false,"given":"Alessandro","family":"Mingotti","sequence":"first","affiliation":[{"name":"Department of Electrical, Electronic and Information Engineering, Alma Mater Studiorum\u2014University of Bologna, 40126 Bologna BO, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lorenzo","family":"Peretto","sequence":"additional","affiliation":[{"name":"Department of Electrical, Electronic and Information Engineering, Alma Mater Studiorum\u2014University of Bologna, 40126 Bologna BO, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5377-2421","authenticated-orcid":false,"given":"Roberto","family":"Tinarelli","sequence":"additional","affiliation":[{"name":"Department of Electrical, Electronic and Information Engineering, Alma Mater Studiorum\u2014University of Bologna, 40126 Bologna BO, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3129-7367","authenticated-orcid":false,"given":"Abbas","family":"Ghaderi","sequence":"additional","affiliation":[{"name":"Department of Electrical, Electronic and Information Engineering, Alma Mater Studiorum\u2014University of Bologna, 40126 Bologna BO, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2019,10,15]]},"reference":[{"key":"ref_1","unstructured":"IEC 61869-2:2011 (2011). 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