{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,24]],"date-time":"2026-04-24T12:18:56Z","timestamp":1777033136282,"version":"3.51.4"},"reference-count":39,"publisher":"MDPI AG","issue":"5","license":[{"start":{"date-parts":[[2020,2,28]],"date-time":"2020-02-28T00:00:00Z","timestamp":1582848000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>The performance of marker-based, six degrees of freedom (6DOF) pose measuring systems is investigated. For instruments in this class, the pose is derived from locations of a few three-dimensional (3D) points. For such configurations to be used, the rigid-body condition\u2014which requires that the distance between any two points must be fixed, regardless of orientation and position of the configuration\u2014must be satisfied. This report introduces metrics that gauge the deviation from the rigid-body condition. The use of these metrics is demonstrated on the problem of reducing robot localization error in assembly applications. Experiments with two different systems used to reduce the localization error of the same industrial robot yielded two conflicting outcomes. The data acquired with one system led to substantial reduction in both position and orientation error of the robot, while the data acquired with a second system led to comparable reduction in the position error only. The difference is attributed to differences between metrics used to characterize the two systems.<\/jats:p>","DOI":"10.3390\/s20051305","type":"journal-article","created":{"date-parts":[[2020,3,3]],"date-time":"2020-03-03T03:13:28Z","timestamp":1583205208000},"page":"1305","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["Comparative Study of Two Pose Measuring Systems Used to Reduce Robot Localization Error"],"prefix":"10.3390","volume":"20","author":[{"given":"Marek","family":"Franaszek","sequence":"first","affiliation":[{"name":"National Institute of Standards and Technology, Gaithersburg, MD 20899, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8335-1743","authenticated-orcid":false,"given":"Geraldine S.","family":"Cheok","sequence":"additional","affiliation":[{"name":"National Institute of Standards and Technology, Gaithersburg, MD 20899, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jeremy A.","family":"Marvel","sequence":"additional","affiliation":[{"name":"National Institute of Standards and Technology, Gaithersburg, MD 20899, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2020,2,28]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Cheng, L., Chen, S., Liu, X., Xu, H., Wu, Y., Li, M., and Chen, Y. 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