{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,4]],"date-time":"2026-03-04T07:16:45Z","timestamp":1772608605215,"version":"3.50.1"},"reference-count":12,"publisher":"MDPI AG","issue":"5","license":[{"start":{"date-parts":[[2020,3,4]],"date-time":"2020-03-04T00:00:00Z","timestamp":1583280000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>We present and discuss parameters of a high dynamic range (HDR) image sensor with LED flicker mitigation (LFM) operating in automotive temperature range. The total SNR (SNR including dark fixed pattern noise), of the sensor is degraded by floating diffusion (FD) dark current (DC) and dark signal non-uniformity (DSNU). We present results of FD DC and DSNU reduction, to provide required SNR versus signal level at temperatures up to 120 \u00b0C. Additionally we discuss temperature dependencies of quantum efficiency (QE), sensitivity, color effects, and other pixel parameters for backside illuminated image sensors. Comparing +120 \u00b0C junction vs. room temperature, in visual range we measured a few relative percent increase, while in 940 nm band range we measured 1.46x increase in sensitivity. Measured change of sensitivity for visual bands\u2014such as blue, green, and red colors\u2014reflected some impact to captured image color accuracy that created slight image color tint at high temperature. The tint is, however, hard to detect visually and may be removed by auto white balancing and temperature adjusted color correction matrixes.<\/jats:p>","DOI":"10.3390\/s20051390","type":"journal-article","created":{"date-parts":[[2020,3,4]],"date-time":"2020-03-04T10:46:08Z","timestamp":1583318768000},"page":"1390","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":7,"title":["Automotive 3.0 \u00b5m Pixel High Dynamic Range Sensor with LED Flicker Mitigation"],"prefix":"10.3390","volume":"20","author":[{"given":"Minseok","family":"Oh","sequence":"first","affiliation":[{"name":"ON Semiconductor, Santa Clara, CA 95954, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sergey","family":"Velichko","sequence":"additional","affiliation":[{"name":"ON Semiconductor, Meridian, ID 83462, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Scott","family":"Johnson","sequence":"additional","affiliation":[{"name":"ON Semiconductor, Meridian, ID 83462, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael","family":"Guidash","sequence":"additional","affiliation":[{"name":"ON Semiconductor, Santa Clara, CA 95954, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hung-Chih","family":"Chang","sequence":"additional","affiliation":[{"name":"ON Semiconductor, Santa Clara, CA 95954, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daniel","family":"Tekleab","sequence":"additional","affiliation":[{"name":"ON Semiconductor, Santa Clara, CA 95954, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bob","family":"Gravelle","sequence":"additional","affiliation":[{"name":"ON Semiconductor, Meridian, ID 83462, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Steve","family":"Nicholes","sequence":"additional","affiliation":[{"name":"ON Semiconductor, Meridian, ID 83462, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Maheedhar","family":"Suryadevara","sequence":"additional","affiliation":[{"name":"ON Semiconductor, Bangalore 560025, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dave","family":"Collins","sequence":"additional","affiliation":[{"name":"ON Semiconductor, Santa Clara, CA 95954, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rick","family":"Mauritzson","sequence":"additional","affiliation":[{"name":"ON Semiconductor, Meridian, ID 83462, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lin","family":"Lin","sequence":"additional","affiliation":[{"name":"ON Semiconductor, Santa Clara, CA 95954, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shaheen","family":"Amanullah","sequence":"additional","affiliation":[{"name":"ON Semiconductor, Santa Clara, CA 95954, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Manuel","family":"Innocent","sequence":"additional","affiliation":[{"name":"ON Semiconductor, 2800 Mechelen, Belgium"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2020,3,4]]},"reference":[{"key":"ref_1","unstructured":"Silsby, C., Velichko, S., Johnson, S., Lim, Y.P., Mentzer, R., and Beck, J. (2015, January 8\u201311). A 1.2MP 1\/3 CMOS Image Sensor with Light Flicker Mitigation. Proceedings of the IISW 2015, Vaals, The Netherlands."},{"key":"ref_2","unstructured":"Velichko, S., Johnson, S., Pates, D., Silsby, C., Hoekstra, C., Mentzer, R., and Beck, J. (June, January 30). 140dB Dynamic Range Sub-electron Noise Floor Image Sensor. Proceedings of the IISW 2017, Hiroshima, Japan."},{"key":"ref_3","doi-asserted-by":"crossref","unstructured":"Iida, S., Sakano, Y., Asatsuma, T., Takami, M., Yoshiba, I., Ohba, N., Mizuno, H., Oka, T., Yamaguchi, K., and Suzuki, A. (2018, January 1\u20135). A 0.68e-rms random-noise 121dB dynamic-range sub-pixel architecture CMOS image sensor with LED flicker mitigation. Proceedings of the 2018 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA.","DOI":"10.1109\/IEDM.2018.8614565"},{"key":"ref_4","doi-asserted-by":"crossref","unstructured":"Yu, J., Collins, D.J., Yasan, A., Bae, S., and Ramaswami, S. 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Available online: http:\/\/www.cie.co.at\/."}],"container-title":["Sensors"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/1424-8220\/20\/5\/1390\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T09:03:52Z","timestamp":1760173432000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/1424-8220\/20\/5\/1390"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,3,4]]},"references-count":12,"journal-issue":{"issue":"5","published-online":{"date-parts":[[2020,3]]}},"alternative-id":["s20051390"],"URL":"https:\/\/doi.org\/10.3390\/s20051390","relation":{},"ISSN":["1424-8220"],"issn-type":[{"value":"1424-8220","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,3,4]]}}}