{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,12]],"date-time":"2025-10-12T02:52:52Z","timestamp":1760237572087,"version":"build-2065373602"},"reference-count":34,"publisher":"MDPI AG","issue":"11","license":[{"start":{"date-parts":[[2020,5,31]],"date-time":"2020-05-31T00:00:00Z","timestamp":1590883200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61801455"],"award-info":[{"award-number":["61801455"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Key Science and Technology Project of Jilin Science and Technology Department","award":["20170204029GX"],"award-info":[{"award-number":["20170204029GX"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>How to perform imaging beyond the diffraction limit has always been an essential subject for the research of optical systems. One effective way to achieve this purpose is Fourier ptychography, which has been widely used in microscopic imaging. However, microscopic imaging measurement technology cannot be directly extended to imaging macro objects at long distances. In this paper, a reconstruction algorithm is proposed to solve the need for oversampling low-resolution images, and it is successfully applied to macroscopic imaging. Compared with the traditional FP technology, the proposed sub-sampling method can significantly reduce the number of iterations in reconstruction. Experiments prove that the proposed method can reconstruct low-resolution images captured by the camera and achieve high-resolution imaging of long-range macroscopic objects.<\/jats:p>","DOI":"10.3390\/s20113116","type":"journal-article","created":{"date-parts":[[2020,6,2]],"date-time":"2020-06-02T09:19:27Z","timestamp":1591089567000},"page":"3116","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["Long-Distance Sub-Diffraction High-Resolution Imaging Using Sparse Sampling"],"prefix":"10.3390","volume":"20","author":[{"given":"Duo","family":"Wang","sequence":"first","affiliation":[{"name":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China"},{"name":"College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 100049, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tianjiao","family":"Fu","sequence":"additional","affiliation":[{"name":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Guoling","family":"Bi","sequence":"additional","affiliation":[{"name":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Longxu","family":"Jin","sequence":"additional","affiliation":[{"name":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xingxiang","family":"Zhang","sequence":"additional","affiliation":[{"name":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2020,5,31]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Li, Z., Wen, D., Song, Z., Liu, G., Zhang, W., and Wei, X. 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