{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,12]],"date-time":"2025-10-12T03:19:43Z","timestamp":1760239183389,"version":"build-2065373602"},"reference-count":19,"publisher":"MDPI AG","issue":"19","license":[{"start":{"date-parts":[[2020,9,27]],"date-time":"2020-09-27T00:00:00Z","timestamp":1601164800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100003819","name":"Natural Science Foundation of Hubei Province","doi-asserted-by":"publisher","award":["F2019202294"],"award-info":[{"award-number":["F2019202294"]}],"id":[{"id":"10.13039\/501100003819","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003787","name":"Natural Science Foundation of Hebei Province","doi-asserted-by":"publisher","award":["A2020202013"],"award-info":[{"award-number":["A2020202013"]}],"id":[{"id":"10.13039\/501100003787","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100006606","name":"Natural Science Foundation of Tianjin City","doi-asserted-by":"publisher","award":["15JCYBJC17000"],"award-info":[{"award-number":["15JCYBJC17000"]}],"id":[{"id":"10.13039\/501100006606","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>We analyze the source of the position deviation and propose a demodulation recursive compensation algorithm to ensure a sub-millimeter resolution in improved optical frequency domain reflectometry. The position deviation between the geometric path and optical path changes with the temperature or strain, due to the elastic-optic and thermal-optic effects. It accumulates along the fiber and becomes large enough to affect the spectral correlation between the measured and reference spectra at the fiber end. The proposed algorithm compensates for the position deviation of each measuring point and aligns the measured spectra with its reference. The numerical and experimental results both reveal that the signal-to-noise ratio of the correlation is improved doubly and a sub-millimeter spatial resolution becomes available at a 30 m fiber end. The recursive compensation algorithm helps to restrain the correlation degeneration at the fiber end and promises an effective approach to a sub-millimeter resolution in optical frequency domain reflectometry.<\/jats:p>","DOI":"10.3390\/s20195540","type":"journal-article","created":{"date-parts":[[2020,9,28]],"date-time":"2020-09-28T08:02:58Z","timestamp":1601280178000},"page":"5540","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":17,"title":["Numerical Analysis and Recursive Compensation of Position Deviation for a Sub-Millimeter Resolution OFDR"],"prefix":"10.3390","volume":"20","author":[{"given":"Yueying","family":"Cheng","sequence":"first","affiliation":[{"name":"School of Electronic and Information Engineering, Hebei University of Technology, Tianjin 300401, China"},{"name":"Tianjin Key Laboratory of Electronic Materials and Devices, Tianjin 300401, China"},{"name":"Hebei Key Laboratory of Advanced Laser Technology and Equipment, Tianjin 300401, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mingming","family":"Luo","sequence":"additional","affiliation":[{"name":"School of Electronic and Information Engineering, Hebei University of Technology, Tianjin 300401, China"},{"name":"Tianjin Key Laboratory of Electronic Materials and Devices, Tianjin 300401, China"},{"name":"Hebei Key Laboratory of Advanced Laser Technology and Equipment, Tianjin 300401, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jianfei","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Electronic and Information Engineering, Hebei University of Technology, Tianjin 300401, China"},{"name":"Tianjin Key Laboratory of Electronic Materials and Devices, Tianjin 300401, China"},{"name":"Hebei Key Laboratory of Advanced Laser Technology and Equipment, Tianjin 300401, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3305-2707","authenticated-orcid":false,"given":"Nannan","family":"Luan","sequence":"additional","affiliation":[{"name":"School of Electronic and Information Engineering, Hebei University of Technology, Tianjin 300401, China"},{"name":"Tianjin Key Laboratory of Electronic Materials and Devices, Tianjin 300401, China"},{"name":"Hebei Key Laboratory of Advanced Laser Technology and Equipment, Tianjin 300401, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2020,9,27]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"693","DOI":"10.1063\/1.92872","article-title":"Optical frequency domain reflectometry in single-mode fiber","volume":"39","author":"Eickhoff","year":"1981","journal-title":"Appl. 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