{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,9]],"date-time":"2026-06-09T20:15:53Z","timestamp":1781036153049,"version":"3.54.1"},"reference-count":23,"publisher":"MDPI AG","issue":"24","license":[{"start":{"date-parts":[[2020,12,21]],"date-time":"2020-12-21T00:00:00Z","timestamp":1608508800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100003052","name":"Ministry of Trade, Industry and Energy","doi-asserted-by":"publisher","award":["20004196"],"award-info":[{"award-number":["20004196"]}],"id":[{"id":"10.13039\/501100003052","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003052","name":"Ministry of Trade, Industry and Energy","doi-asserted-by":"publisher","award":["N0002310"],"award-info":[{"award-number":["N0002310"]}],"id":[{"id":"10.13039\/501100003052","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Chromatic confocal microscopy (CCM) has been intensively developed because it can exhibit effective focal position scanning based on the axial chromatic aberration of broadband light reflected from a target. To improve the imaging speed of three-dimensional (3D) surface profiling, we have proposed the novel concept of swept-source-based CCM (SS-CCM) and investigated the usefulness of the corresponding imaging system. Compared to conventional CCM based on a broadband light source and a spectrometer, a swept-source in the proposed SS-CCM generates light with a narrower linewidth for higher intensity, and a single photodetector employed in the system exhibits a fast and sensitive response by immediately obtaining spectrally encoded depth from a chromatic dispersive lens array. Results of the experiments conducted to test the proposed SS-CCM system indicate that the system exhibits an axial chromatic focal distance range of approximately 360 \u03bcm for the 770\u2013820 nm swept wavelength range. Moreover, high-speed surface profiling images of a cover glass and coin were successfully obtained with a short measurement time of 5 ms at a single position.<\/jats:p>","DOI":"10.3390\/s20247347","type":"journal-article","created":{"date-parts":[[2020,12,21]],"date-time":"2020-12-21T09:41:41Z","timestamp":1608543701000},"page":"7347","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":11,"title":["Swept-Source-Based Chromatic Confocal Microscopy"],"prefix":"10.3390","volume":"20","author":[{"given":"Dawoon","family":"Jeong","sequence":"first","affiliation":[{"name":"Department of Cogno-Mechatronics Engineering, Pusan National University, Busan 46241, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Se Jin","family":"Park","sequence":"additional","affiliation":[{"name":"Department of Cogno-Mechatronics Engineering, Pusan National University, Busan 46241, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hansol","family":"Jang","sequence":"additional","affiliation":[{"name":"Department of Cogno-Mechatronics Engineering, Pusan National University, Busan 46241, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hyunjoo","family":"Kim","sequence":"additional","affiliation":[{"name":"Taihan Fiber Optics Co., Ltd., Ansan-si 15601, Gyeonggi-do, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jaesun","family":"Kim","sequence":"additional","affiliation":[{"name":"Taihan Fiber Optics Co., Ltd., Ansan-si 15601, Gyeonggi-do, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2811-8137","authenticated-orcid":false,"given":"Chang-Seok","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Cogno-Mechatronics Engineering, Pusan National University, Busan 46241, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2020,12,21]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"2605","DOI":"10.1364\/AO.39.002605","article-title":"Nontranslational three-dimensional profilometry by chromatic confocal microscopy with dynamically configurable micromirror scanning","volume":"39","author":"Cha","year":"2000","journal-title":"Appl. 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