{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,30]],"date-time":"2026-04-30T02:37:29Z","timestamp":1777516649281,"version":"3.51.4"},"reference-count":42,"publisher":"MDPI AG","issue":"2","license":[{"start":{"date-parts":[[2021,1,19]],"date-time":"2021-01-19T00:00:00Z","timestamp":1611014400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001691","name":"Japan Society for the Promotion of Science","doi-asserted-by":"publisher","award":["15H05759"],"award-info":[{"award-number":["15H05759"]}],"id":[{"id":"10.13039\/501100001691","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001691","name":"Japan Society for the Promotion of Science","doi-asserted-by":"publisher","award":["20H00211"],"award-info":[{"award-number":["20H00211"]}],"id":[{"id":"10.13039\/501100001691","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>This paper proposes a new optical angle measurement method in the optical frequency domain based on second harmonic generation with a mode-locked femtosecond laser source by making use of the unique characteristic of the high peak power and wide spectral range of the femtosecond laser pulses. To get a wide measurable range of angle measurement, a theoretical calculation for several nonlinear optical crystals is performed. As a result, LiNbO3 crystal is employed in the proposed method. In the experiment, the validity of the use of a parabolic mirror is also demonstrated, where the chromatic aberration of the focusing beam caused the localization of second harmonic generation in our previous research. Moreover, an experimental demonstration is also carried out for the proposed angle measurement method. The measurable range of 10,000 arc-seconds is achieved.<\/jats:p>","DOI":"10.3390\/s21020670","type":"journal-article","created":{"date-parts":[[2021,1,20]],"date-time":"2021-01-20T03:34:25Z","timestamp":1611113665000},"page":"670","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":24,"title":["An Optical Frequency Domain Angle Measurement Method Based on Second Harmonic Generation"],"prefix":"10.3390","volume":"21","author":[{"given":"Wijayanti","family":"Dwi Astuti","sequence":"first","affiliation":[{"name":"Precision Nanometrology Laboratory, Department of Finemechanics, Tohoku University, Sendai 980-8579, Japan"},{"name":"Department of Electrical Engineering and Informatics, Vocational School, Universitas Gadjah Mada, Yogyakarta 55281, Indonesia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hiraku","family":"Matsukuma","sequence":"additional","affiliation":[{"name":"Precision Nanometrology Laboratory, Department of Finemechanics, Tohoku University, Sendai 980-8579, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Masaru","family":"Nakao","sequence":"additional","affiliation":[{"name":"Precision Nanometrology Laboratory, Department of Finemechanics, Tohoku University, Sendai 980-8579, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kuangyi","family":"Li","sequence":"additional","affiliation":[{"name":"Precision Nanometrology Laboratory, Department of Finemechanics, Tohoku University, Sendai 980-8579, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3527-2869","authenticated-orcid":false,"given":"Yuki","family":"Shimizu","sequence":"additional","affiliation":[{"name":"Precision Nanometrology Laboratory, Department of Finemechanics, Tohoku University, Sendai 980-8579, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9336-2729","authenticated-orcid":false,"given":"Wei","family":"Gao","sequence":"additional","affiliation":[{"name":"Precision Nanometrology Laboratory, Department of Finemechanics, Tohoku University, Sendai 980-8579, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2021,1,19]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"773","DOI":"10.1016\/j.cirp.2015.05.009","article-title":"Measurement technologies for precision positioning","volume":"64","author":"Gao","year":"2015","journal-title":"CIRP Ann. 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